摘要:
A semiconductor memory device comprises a DRAM memory cell array comprising a plurality of dynamic type memory cells arranged in a plurality of rows and columns, and an SRAM memory cell array comprising static type memory cells arranged in a plurality of rows and columns. The DRAM memory cell array is divided into a plurality of blocks each comprising a plurality of columns. The SRAM memory cell array is divided into a plurality of blocks each comprising a plurality of columns, corresponding to the plurality of blocks in the DRAM memory cell array. The SRAM memory cell array is used as a cache memory. At the time of cache hit, data is accessed to the SRAM memory cell array. At the time of cache miss, data is accessed to the DRAM memory cell array. On this occasion, data corresponding to one row in each of the blocks in the DRAM memory cell array is transferred to one row in the corresponding block in the SRAM memory cell array.
摘要:
A dynamic semiconductor memory device includes a memory cell array comprising a plurality of word lines (WL.sub.0 -WL.sub.n), a plurality of bit lines (BL.sub.n -BL.sub.n+11) and a plurality of memory cells (MC) connected to intersections between the word lines and the bit lines. The plurality of bit lines include bit line pairs of two bit lines, one being a bit line for reading information of a memory cell, and the other being a bit line for providing a reference potential, and sense amplifiers (SA1-SA5) for detecting a potential difference between each bit line pair to amplify the same. The plurality of bit line pairs include bit line pairs crossing with each other such that a capacitance is balanced between adjacent bit lines, and bit line pairs having no crossing portion between which the bit line pairs crossing with each other are arranged such that a capacitance is balanced between said adjacent bit lines. Accordingly, the bit lines having the crossing portions receive the same noise from the other adjacent bit lines, and the bit lines having no crossing portion receive no noise between the paired bit lines, so that a reading potential difference can be reduced.