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111.发明申请公开(公告)号：US20180149457A1
公开(公告)日：2018-05-31
申请号：US15879395
申请日：2018-01-24
Applicant: Tokyo Seimitsu Co., Ltd.
Inventor： Hikaru MASUTA
Abstract: There are provided a surface shape measuring method and a surface shape measuring device which can measure the diameter of a workpiece to be measured with high precision and high reproducibility and have excellent versatility. These method include: acquiring first shape data indicating a surface shape of the workpiece with a detector being disposed on one side across a workpiece while rotating the workpiece relatively to the detector around a rotational center; acquiring second shape data indicating the surface shape of the workpiece with the detector being disposed on the other side across the workpiece while rotating the workpiece relatively to the detector around the rotational center; and calculating a shape parameter defining the surface shape of the workpiece by collating the first shape data and second shape data. In calculating the shape parameter, a deviation of the detector from the reference line is calculated based on the collation result.
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公开(公告)号：US20180058836A1
公开(公告)日：2018-03-01
申请号：US15664273
申请日：2017-07-31
Applicant: MITUTOYO CORPORATION
Inventor： Tatsuki NAKAYAMA , Kazushige ISHIBASHI
IPC: G01B5/20
CPC classification number: G01B5/201
Abstract: A roundness measuring device including: an angle detector detecting a current rotation angle of a table relative to an X axis direction; a joystick (external operator) issuing an instruction for an operation amount of a rotation axis line of the table; a centering controller calculating a CX axis displacement amount and a CY axis displacement amount from the operation amount and the rotation angle, and displacing a CX axis displacement mechanism and CY axis displacement mechanism based on the calculated CX axis displacement amount and CY axis displacement amount; and a centering controller calculating an LX axis tilt amount and an LY axis tilt amount from the operation amount and the rotation angle, and displacing an LX axis tilt mechanism and LY axis tilt mechanism based on the calculated LX axis tilt amount and LY axis tilt amount.
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公开(公告)号：US09879969B2
公开(公告)日：2018-01-30
申请号：US14983204
申请日：2015-12-29
Applicant: JENOPTIK Industrial Metrology Germany GmbH
Inventor： Raimund Volk
Abstract: A roundness and/or dimension measuring device for in-process measurement of crank pins during a machining operation on a grinding machine having a base body, and a measuring head, which is connected to the base body via a rod assembly and which is movable between a neutral position and a measuring position. The measuring head has a measuring probe for contacting the crank pin, and the rod assembly is designed and configured in such a way that the measuring head in the measuring position follows orbital rotations of the crank pin. At least one oscillation damping element is operatively associated with the measuring head for holding it in engagement with the crank pin during the orbital rotation.
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公开(公告)号：US20170082417A1
公开(公告)日：2017-03-23
申请号：US14983204
申请日：2015-12-29
Applicant: JENOPTIK Industrial Metrology Germany GmbH
Inventor： Raimund Volk
IPC: G01B5/20
Abstract: A roundness and/or dimension measuring device for in-process measurement of crank pins during a machining operation on a grinding machine having a base body, and a measuring head, which is connected to the base body via a rod assembly and which is movable between a neutral position and a measuring position. The measuring head has a measuring probe for contacting the crank pin, and the rod assembly is designed and configured in such a way that the measuring head in the measuring position follows orbital rotations of the crank pin. At least one oscillation damping element is operatively associated with the measuring head for holding it in engagement with the crank pin during the orbital rotation.
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公开(公告)号：US20160377406A1
公开(公告)日：2016-12-29
申请号：US14859346
申请日：2015-09-20
Applicant: 3DFAMILY TECHNOLOGY CO., LTD.
Inventor： Kuang-Chao FAN , Chih-Chin HSU
IPC: G01B5/20
CPC classification number: G01B5/201
Abstract: The invention discloses a method for roundness measurement, which includes the steps of, mounting and rotating an object on a rotary table; driving two measuring surfaces of two measurement units to respectively abut against two opposite sides of the object, wherein the two measurement units are disposed on two opposite sides of the rotary table and the two measuring surfaces are parallel to each other and perpendicular to a to surface of the rotary table; during rotation of the rotary table, measuring intermittently a shortest straight line distance between the two measuring surfaces and generating a variation data and after the rotary table completes a full-circle rotation, a processing unit receiving the variation data and generating measured data. The present invention also discloses a device for roundness measurement.
Abstract translation: 本发明公开了一种圆度测量方法，包括以下步骤：将物体安装在旋转台上并旋转; 驱动两个测量单元的两个测量表面以分别邻接物体的两个相对侧，其中两个测量单元设置在旋转台的两个相对侧上，并且两个测量表面彼此平行并垂直于表面 的旋转台; 在旋转台的旋转期间，间歇地测量两个测量表面之间的最短直线距离并产生变化数据，并且在旋转台完成全圆旋转之后，处理单元接收变化数据并产生测量数据。 本发明还公开了一种圆度测量装置。
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Patent Agency Ranking
公开(公告)号：US20160084631A1
公开(公告)日：2016-03-24
申请号：US14847181
申请日：2015-09-08
Applicant: MITUTOYO CORPORATION
Inventor： Tatsuki NAKAYAMA
IPC: G01B5/20
CPC classification number: G01B5/201
Abstract: A roundness measurement device provides a rotation table on a base and measures roundness of a measured object placed on the rotation table while rotating the rotation table, and includes a detecting main body, a detecting device driving mechanism, a stylus, a contact member, and a control device. The detecting device driving mechanism displaces the detecting device main body with respect to the base. The stylus has a base end rotatably supported on the detecting device main body and can change an angle position with respect to the detecting device main body using an external force. The contact member is provided at a position where the stylus comes in contact due to displacement of the detecting device main body by the detecting device driving mechanism. The control device controls driving of the detecting device driving mechanism.
Abstract translation: 圆度测量装置在基座上提供旋转台并且在旋转旋转台的同时测量放置在旋转台上的测量对象的圆度，并且包括检测主体，检测装置驱动机构，触针，接触构件和 控制装置。 检测装置驱动机构使检测装置主体相对于基座移位。 触针具有可旋转地支撑在检测装置主体上的基端，并且可以使用外力改变相对于检测装置主体的角度位置。 接触构件设置在由于检测装置驱动机构而由于检测装置主体的位移而触针接触的位置。 控制装置控制检测装置驱动机构的驱动。
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117.发明授权公开(公告)号：US09151588B2
公开(公告)日：2015-10-06
申请号：US13527990
申请日：2012-06-20
Applicant: Junji Sakurada , Tsukasa Kojima
Inventor： Junji Sakurada , Tsukasa Kojima
Abstract: A circular shape characteristic measuring device includes a shape measuring device that obtains measured data by measuring a profile shape of a circular cross-section of an object to be measured having the circular cross-section, and a computation device that calculates a circular shape characteristic of the circular cross-section. The computation device includes: an input device configured to input one of three parameters including a cutoff value of the filtering process, a minimum number of samples, and a ratio of a radius of the circular cross-section to a radius of a gauge head; a parameter table that stores a relationship between the three parameters, and based on the input parameter, determines the other two parameters; and a sampler configured to perform sampling of the measured data based on the minimum number of samples.
Abstract translation: 圆形形状特征测量装置包括：形状测量装置，其通过测量具有圆形横截面的被测量物体的圆形横截面的轮廓形状来获得测量数据;以及计算装置，其计算圆形截面的圆形截面的圆形形状特性 圆形截面。 计算装置包括：输入装置，被配置为输入三个参数中的一个，包括滤波处理的截止值，最小采样数，以及圆形横截面的半径与量规头的半径的比率; 存储三个参数之间的关系的参数表，并且基于输入参数，确定另外两个参数; 以及采样器，被配置为基于所述最小样本数来对所测量的数据进行采样。
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118.发明授权公开(公告)号：US08949071B2
公开(公告)日：2015-02-03
申请号：US13349016
申请日：2012-01-12
Applicant: Ryo Takanashi
Inventor： Ryo Takanashi
Abstract: According to the present invention, a center deviation amount, which is an amount of deviation (distance) between the center line of a reference measurement target and the detection point is calculated using the reference measurement target having a known diameter, and a measurement value of a diameter of an arbitrary measurement target is corrected using the center deviation amount. Therefore, an accurate diameter value can be calculated even in the case of a measurement target having a diameter value different from the diameter value of the reference measurement target.
Abstract translation: 根据本发明，使用具有已知直径的基准测量对象来计算作为基准测量对象的中心线与检测点之间的偏差量（距离）的中心偏差量，测定值 使用中心偏差量来校正任意测量对象的直径。 因此，即使在具有与基准测定对象的直径值不同的直径值的测定对象的情况下，也可以算出准确的直径值。
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公开(公告)号：US08725446B2
公开(公告)日：2014-05-13
申请号：US12805053
申请日：2010-07-08
Applicant: Heinz Wegmann
Inventor： Heinz Wegmann
IPC: G01L25/00
Abstract: Method for measuring the shape of a workpiece includes a measuring sensor used to find measured values that represent the shape of a workpiece. The shape of the workpiece is determined by an iterative method using the measured values. The shape of the workpiece is determined during machining. The determining of the shape during machining is particularly suited for determining the shape during grinding. The shape determined may be the shape of a pin, especially a crankpin for a crankshaft.
Abstract translation: 用于测量工件形状的方法包括用于找到表示工件形状的测量值的测量传感器。 通过使用测量值的迭代方法确定工件的形状。 在加工过程中确定工件的形状。 加工时的形状的确定特别适用于确定研磨过程中的形状。 所确定的形状可以是销的形状，特别是用于曲轴的曲柄销。
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120.发明申请公开(公告)号：US20130006579A1
公开(公告)日：2013-01-03
申请号：US13527990
申请日：2012-06-20
Applicant: Junji SAKURADA , Tsukasa KOJIMA
Inventor： Junji SAKURADA , Tsukasa KOJIMA
Abstract: A circular shape characteristic measuring device includes a shape measuring device that obtains measured data by measuring a profile shape of a circular cross-section of an object to be measured having the circular cross-section, and a computation device that calculates a circular shape characteristic of the circular cross-section. The computation device includes: an input device configured to input one of three parameters including a cutoff value of the filtering process, a minimum number of samples, and a ratio of a radius of the circular cross-section to a radius of a gauge head; a parameter table that stores a relationship between the three parameters, and based on the input parameter, determines the other two parameters; and a sampler configured to perform sampling of the measured data based on the minimum number of samples.
Abstract translation: 圆形形状特征测量装置包括：形状测量装置，其通过测量具有圆形横截面的被测量物体的圆形横截面的轮廓形状来获得测量数据;以及计算装置，其计算圆形截面的圆形截面的圆形形状特性 圆形截面。 计算装置包括：输入装置，被配置为输入三个参数中的一个，包括滤波处理的截止值，最小采样数，以及圆形横截面的半径与量规头的半径的比率; 存储三个参数之间的关系的参数表，并且基于输入参数，确定另外两个参数; 以及采样器，被配置为基于所述最小样本数来对所测量的数据进行采样。
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