Data read circuit for use in a semiconductor memory and a method thereof
    121.
    发明申请
    Data read circuit for use in a semiconductor memory and a method thereof 有权
    用于半导体存储器的数据读取电路及其方法

    公开(公告)号:US20050030814A1

    公开(公告)日:2005-02-10

    申请号:US10943300

    申请日:2004-09-17

    摘要: A data read circuit and method for use in a semiconductor memory device that has a memory cell array are provided. The circuit includes a selector for selecting a unit cell within the memory cell array in response to an address signal; a clamping unit for supplying a clamp voltage having a level for a read operation to a bit line of the selected unit cell in response to a clamp control signal; a precharge unit for precharging a sensing node to a voltage having a power source level in response to a control signal of a first state in a precharge mode, and compensating through the sensing node for a reduced quantity of current at the bit line in response to a control signal of a second state in a data sensing mode; and a sense amplifier unit for comparing a level of the sensing node with a reference level, and for sensing data stored in the selected unit cell.

    摘要翻译: 提供了一种用于具有存储单元阵列的半导体存储器件中的数据读取电路和方法。 该电路包括:选择器,用于响应于地址信号选择存储单元阵列内的单位单元; 夹紧单元,用于响应于钳位控制信号,将具有用于读取操作的电平的钳位电压提供给所选择的单位单元的位线; 预充电单元,用于响应于在预充电模式中的第一状态的控制信号,将感测节点预充电到具有电源电平的电压,并且响应于位线在位线处减少的电流量补偿 在数据感测模式中的第二状态的控制信号; 以及感测放大器单元,用于将感测节点的电平与参考电平进行比较,并且用于感测存储在所选择的单位单元中的数据。