Abstract:
A refrigerator having one or more heat conduction sheets is provided. The refrigerator may include main body having a cooling chamber formed therein, and a door that opens and closes the cooling chamber. One or more heat conduction sheets may be disposed on the main body, the door, or a combination of various portions thereof so as to substantially eliminate an occurrence of a temperature variation on a corresponding planar surface and reduce an insulation thickness.
Abstract:
Provided is a method of operating a semiconductor device, in which timing for switching each of a drain voltage pulse signal and a gate voltage pulse signal from a first state to a second state is controlled in an erase mode and a write mode.
Abstract:
An ice making apparatus for a refrigerator, in which an ice bank stores ice and has an opening that discharges ice on its one side. An ejector opens and closes the opening and is rotatably provided at the opening to also eject ice from the ice bank. After completion of an ice discharging operation, a sensor senses a relative position of the ejector against the ice bank and the ejector is controlled to close the opening to the extent necessary.
Abstract:
A method of operating a semiconductor device including a memory cell of a 1-T DRAM is provided in which a gate voltage level in a hold mode is adjusted to adjust a data sensing margin of the semiconductor device.
Abstract:
A non-volatile memory device includes memory transistors disposed on a semiconductor substrate in a NAND string. A string select transistor is disposed at a first end of the NAND string, and a ground select transistor is disposed at a second end of the NAN string. Bit lines are electrically connected to the semiconductor substrate outside of the string select transistor and a gate electrode of the ground select transistor.
Abstract:
A dish washing machine and a control method of the same are disclosed. The dish washing machine may include a first heater for heating wash water to wash items in a dishwasher. The dishwasher may also include a second heater for generating steam to be supplied to the dishes. A controller is configured to control the first and second heaters to operate alternately.
Abstract:
A non-volatile memory device includes memory transistors disposed on a semiconductor substrate in a NAND string. A string select transistor is disposed at a first end of the NAND string, and a ground select transistor is disposed at a second end of the NAN string. Bit lines are electrically connected to the semiconductor substrate outside of the string select transistor and a gate electrode of the ground select transistor.
Abstract:
A method for controlling a home appliance is disclosed. The method includes selecting one of a plurality of steam washing modes for washing dishes. Each steam washing mode has a corresponding steam washing pattern. Selecting the number of steam washing pattern cycles for the selected steam washing mode, or selecting the operation time associated with the steam washing pattern that corresponds to the selected steam washing mode.
Abstract:
Disclosed herein is a washing machine with drying function. A heater is mounted in a tub for heating wash water or air in the tub. A circulating channel is connected to the tub for guiding air heated by the heater to the outside of the tub and then supplying the air into a drum such that the laundry in the drum is dried. Consequently, the structure of the washing machine with drying function is simplified, the manufacturing costs of the washing machine with drying function are reduced, and noise generated from the washing machine with drying function is minimized.
Abstract:
By decreasing the amount of card substrate required in a memory card to support the actual memory unit, the test interface of the card, which is usually removed before final assembly of the card, can be brought within the allowable length of the finished card and can, therefore, remain on the card permanently. Consequently, in the event of a field failure, the test interface remains available for testing the card and diagnosing the location and cause of the failure.