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公开(公告)号：US11518260B2
公开(公告)日：2022-12-06
申请号：US17126930
申请日：2020-12-18
Applicant: The Boeing Company
Inventor： Morteza Safai
IPC: B60L53/50 , B60L53/51 , B60L50/60 , B60L53/55 , B60L53/10 , B60L53/52 , B60L53/18 , B64D27/24 , B64F1/36 , H02J7/00 , H02J7/35
Abstract: Renewable energy charging stations, systems, and methods are disclosed for capturing storing and delivering large amounts of renewable electrical energy from a renewable energy source to vehicles including passenger aircraft using charging circuits in communication with a demultiplexer and high-temperature superconducting cables to deliver required large electrical charges at fast charging rates safely and at low temperatures.
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公开(公告)号：US11515466B2
公开(公告)日：2022-11-29
申请号：US16373156
申请日：2019-04-02
Applicant: THE BOEING COMPANY
Inventor： Morteza Safai
IPC: H01L41/08 , H01L41/113 , H02N2/18 , H03K17/975
Abstract: Systems and methods of providing power to high-voltage sensors in power-limited environments through environmental energy harvesting are disclosed. The systems and methods are configured to intermittently power high-voltage sensors by repeatedly releasing stored energy in bursts. An environmental energy harvesting device generates a low-voltage power supply and is coupled to one or more capacitors to charge the capacitors to a high-voltage threshold. After such high-voltage threshold has been reached, the capacitors are discharged to provide a high-voltage power burst to a high-voltage sensor configured to inspect a component and generate an inspection result signal. The inspection result signal is received by an output module, which may further store or transmit to an external receiver a data signal indicating the inspection results.
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公开(公告)号：US11493429B1
公开(公告)日：2022-11-08
申请号：US17371984
申请日：2021-07-09
Applicant: The Boeing Company
Inventor： Morteza Safai , Ryan M. Clancy
Abstract: Systems and methods for bondline inspection using mechanical wave measurement and gas excitation. A cost-effective optical interferometry technique is used to measure mechanical waves generated by gas excitation, which measurements may be used to verify the strength of a bondline of a composite bonded structure. A gas gun which produces a high-pressure short-pulsewidth gas pulse at the front free surface of the composite material. A velocity interferometer system for any reflector (VISAR) is synchronized with the controlled gas pulsation and used to measure the surface velocities. The respective shock wave-induced displacements of the back and front free surfaces are then calculated. The measured free surface displacements are compared with calibrated thresholds to determine whether a weak bond has been detected or not. Optionally, a ring magnet is aligned exactly under the gas gun nozzle to enable VISAR beam centering.
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公开(公告)号：US11293884B2
公开(公告)日：2022-04-05
申请号：US16736602
申请日：2020-01-07
Applicant: The Boeing Company
Inventor： Morteza Safai
IPC: G01N23/203 , G01N23/20008
Abstract: An x-ray source for a backscatter imager can include a first electron beam (e-beam) emitter for emitting a first e-beam and at least a second e-beam emitter for emitting at least a second e-beam. The first and second e-beam emitters can be powered by a at least one power supply, and can be configured to direct the first e-beam and the second e-beam toward an anode. An interaction of the anode with the first and second e-beams produces x-rays. The x-ray source is configured to output an amount of x-rays equivalent to a conventional x-ray source that includes a single e-beam emitter. However, because the x-ray source uses at least two e-beam emitters and a single anode, the power source required to power the e-beam emitters can operate at a lower wattage than a conventional power source powering the single e-beam emitter. The x-ray source is thus lighter in weight and outputs less radiation than conventional systems with a comparable x-ray output.
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公开(公告)号：US20220072793A1
公开(公告)日：2022-03-10
申请号：US17527054
申请日：2021-11-15
Applicant: The Boeing Company
Inventor： Morteza Safai , Gary E. Georgeson
IPC: B29C64/386
Abstract: Various techniques are provided to utilize nanostructures for process monitoring and feedback control. In one example, a method includes forming a layer of material including nanostructures distributed therein. Each nanostructure includes a quantum dot and a shell encompassing the quantum dot. The shells and quantum dots are configured to emit a first and second wavelength, respectively, in response to an excitation signal. The method further includes applying the excitation signal to at least a portion of the layer of material. The method further includes detecting an emitted signal from the portion of the layer of material, where the emitted signal is provided by at least a subset of the nanostructures in response to the excitation signal. The method further includes determining whether a manufacturing characteristic has been satisfied based at least on a wavelength of the emitted signal. Related systems and products are also provided.
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Patent Agency Ranking
146.发明授权公开(公告)号：US11189982B2
公开(公告)日：2021-11-30
申请号：US16102551
申请日：2018-08-13
Applicant: The Boeing Company
Inventor： Morteza Safai
Abstract: An example laser system includes a laser, a plurality of pulse stretchers coupled together in series, a feedback module, and a lens assembly. The plurality of pulse stretchers is configured to stretch pulse widths of laser pulses provided by the laser and to output stretched laser pulses. The feedback module includes a pulse delay comparator that is configured to compare a first laser pulse of the laser pulses to a corresponding first stretched laser pulse of the stretched laser pulses. The feedback module also includes a computing device that is configured to determine, based on a result of the comparing by the pulse delay comparator, an adjustment to a pulse stretcher of the plurality of pulse stretchers, and apply the adjustment to the pulse stretcher so as to modify a shape of a second stretched laser pulse of the stretched laser pulses.
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公开(公告)号：US11187679B1
公开(公告)日：2021-11-30
申请号：US16879450
申请日：2020-05-20
Applicant: The Boeing Company
Inventor： Morteza Safai
Abstract: Disclosed herein is a laser ultrasonic testing (UT) apparatus for inspecting a surface of an object. The laser UT apparatus comprises an excitation laser, which is selectively operable to generate an excitation laser beam. The laser UT apparatus also comprises a first acousto-optic deflector (AOD) and a second AOD. The laser UT apparatus additionally comprises a detection laser, which is selectively operable to generate a detection laser beam. The laser UT apparatus further comprises a third AOD and a fourth AOD.
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公开(公告)号：US20210364476A1
公开(公告)日：2021-11-25
申请号：US16879450
申请日：2020-05-20
Applicant: The Boeing Company
Inventor： Morteza Safai
Abstract: Disclosed herein is a laser ultrasonic testing (UT) apparatus for inspecting a surface of an object. The laser UT apparatus comprises an excitation laser, which is selectively operable to generate an excitation laser beam. The laser UT apparatus also comprises a first acousto-optic deflector (AOD) and a second AOD. The laser UT apparatus additionally comprises a detection laser, which is selectively operable to generate a detection laser beam. The laser UT apparatus further comprises a third AOD and a fourth AOD.
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公开(公告)号：US11181518B2
公开(公告)日：2021-11-23
申请号：US16670857
申请日：2019-10-31
Applicant: The Boeing Company
Inventor： Morteza Safai
IPC: G01N29/04 , H05H1/24 , G01N33/207
Abstract: A system for evaluating a bond includes first and second electrodes. A dielectric material layer is positioned at least partially between the first and second electrodes. A power source is connected to the first and second electrodes. The power source is configured to cause the first and second electrodes to generate an electrical arc. The electrical arc is configured to at least partially ablate a sacrificial material layer to generate a plasma.
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公开(公告)号：US20210310967A1
公开(公告)日：2021-10-07
申请号：US16838329
申请日：2020-04-02
Applicant: The Boeing Company
Inventor： Morteza Safai
IPC: G01N23/20008 , H01J35/14 , G01N23/203
Abstract: Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The apparatus comprises an emission shaping mechanism that is configured to receive an electron emission from a cathode and to adjust a shape of the electron emission from a circular cross-sectional shape into a first elliptical cross-sectional shape. The x-ray source further comprises an anode that is configured to convert the electron emission into an unfiltered x-ray emission having a second elliptical cross-sectional shape. The apparatus also comprises an x-ray filter that comprises an emission aperture having a cross-sectional area smaller than an area of the second elliptical cross-sectional shape of the unfiltered x-ray emission. The x-ray filter is located relative to the unfiltered x-ray emission to allow only a portion of the unfiltered x-ray emission to pass through the emission aperture and form a filtered x-ray emission.
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