CROSSTALK SUPPRESSION IN WIRELESS TESTING OF SEMICONDUCTOR DEVICES
    152.
    发明申请
    CROSSTALK SUPPRESSION IN WIRELESS TESTING OF SEMICONDUCTOR DEVICES 有权
    半导体器件无线测试中的CROSSTALK抑制

    公开(公告)号:US20140191779A1

    公开(公告)日:2014-07-10

    申请号:US14171211

    申请日:2014-02-03

    Inventor: Alberto Pagani

    Abstract: An integrated circuit integrated on a semiconductor material die and adapted to be at least partly tested wirelessly, wherein circuitry for setting a selected radio communication frequencies to be used for the wireless test of the integrated circuit are integrated on the semiconductor material die.

    Abstract translation: 一种集成在半导体材料裸片上并适于至少部分地被无线测试的集成电路,其中用于设置用于集成电路的无线测试的所选无线电通信频率的电路集成在半导体材料裸片上。

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