Flash memory cell and associated high voltage row decoder

    公开(公告)号:US11011240B2

    公开(公告)日:2021-05-18

    申请号:US16879663

    申请日:2020-05-20

    Abstract: The present invention relates to a flash memory cell with only four terminals and a high voltage row decoder for operating an array of such flash memory cells. The invention allows for fewer terminals for each flash memory cell compared to the prior art, which results in a simplification of the decoder circuitry and overall die space required per flash memory cells. The invention also provides for the use of high voltages on one or more of the four terminals to allow for read, erase, and programming operations despite the lower number of terminals compared to prior art flash memory cells.

    Address Fault Detection In A Flash Memory System

    公开(公告)号:US20190378548A1

    公开(公告)日:2019-12-12

    申请号:US16551593

    申请日:2019-08-26

    Abstract: A system and method are disclosed for performing address fault detection in a flash memory system. In one embodiment, a flash memory system comprises a memory array comprising flash memory cells arranged in rows and columns, a row decoder for receiving a row address as an input, the row decoder coupled to a plurality of word lines, wherein each word line is coupled to a row of flash memory cells in the memory array, an address fault detection array comprising a column of memory cells, wherein each of the plurality of word lines is coupled to a memory cell in the column, and an analog comparator for comparing a current drawn by the column with a reference current and for indicating a fault if the current drawn by the column exceeds the reference current.

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