Glitch absorption apparatus and method

    公开(公告)号:US11513883B2

    公开(公告)日:2022-11-29

    申请号:US17161832

    申请日:2021-01-29

    Abstract: An apparatus includes a primary processor and a secondary processor configured to receive a first signal, a second signal and a plurality of input signals, and perform same operations as each other based on the first signal, the second signal and the plurality of input signals, a comparison circuit configured to receive output signals of the primary processor and the secondary processor, and detect a lockstep mismatch between the primary processor and the secondary processor based on the output signals, a fault capturing circuit configured to receive the first signal and the second signal, and capture a fault signal generated by the comparison circuit, and a first glitch absorption device configured to receive the first signal and the second signal, and absorb glitches fed into the first glitch absorption device.

    Reset and safe state logic generation in dual power flow devices

    公开(公告)号:US11513544B1

    公开(公告)日:2022-11-29

    申请号:US17537010

    申请日:2021-11-29

    Abstract: An electric device includes: a first power domain; a second power domain; a third power domain, where during power-up, the third, the second, and the first power domains are configured to be powered up sequentially, where during standby-exit, the first, the second, and the third power domains are configured to be powered up sequentially; isolation paths that provide controlled signal transmission among the first, the second, and the third power domains, where each isolation path includes an isolation circuit between an input power domain and an output power domain of the isolation path; and a control circuit in the first power domain, where for each isolation path, the control circuit is configured to generate an isolation control signal for the isolation circuit, where the isolation circuit is configured enable or disable signal transmission along the isolation path.

    Voltage gain amplifier for automotive radar

    公开(公告)号:US11502659B2

    公开(公告)日:2022-11-15

    申请号:US16903552

    申请日:2020-06-17

    Inventor: Riju Biswas

    Abstract: Disclosed herein is a voltage gain amplifier for use in an automotive radar receiver chain. The voltage gain amplifier utilizes pole-zero cancelation to yield a desired transfer function without gain peaking at a bandwidth in which attenuation is desired, and utilizes a low pass filter effectively formed by a feedback loop including a high pass filter and a differential amplifier to ensure the desired level of attenuation at the desired bandwidth. In some instances, a chopper may be utilized in the feedback loop prior to the high pass filter, and after the differential amplifier, so as to reduce the bandwidth of the differential amplifier in the feedback loop.

    POSITIVE AND NEGATIVE CHARGE PUMP CONTROL

    公开(公告)号:US20220352817A1

    公开(公告)日:2022-11-03

    申请号:US17866372

    申请日:2022-07-15

    Abstract: A voltage supply circuit and a method for controlling a voltage supply circuit are provided. The voltage supply circuit includes a positive charge pump stage that generates a positive voltage and a negative charge pump stage that generates a negative voltage. The voltage supply circuit also includes a control stage that compares a voltage representative of the negative voltage with a reference voltage and causes a slope of the positive voltage to decrease when the voltage representative of the negative voltage exceeds the reference voltage.

    ON CHIP TEST ARCHITECTURE FOR CONTINUOUS TIME DELTA SIGMA ANALOG-TO-DIGITAL CONVERTER

    公开(公告)号:US20220345149A1

    公开(公告)日:2022-10-27

    申请号:US17723225

    申请日:2022-04-18

    Abstract: An integrated circuit includes a continuous time delta sigma analog-to-digital converter (CTDS ADC) and a test circuit for testing the CTDS ADC. The test circuit converts multi-bit digital reference data to a single-bit digital stream. The test circuit then passes the single-bit digital stream to a finite impulse response digital-to-analog converter (FIR DAC). The FIR DAC converts the single-bit digital stream to an analog test signal. The analog test signal is then passed to the CTDS ADC. The CTDS ADC converts the analog test signal to digital test data. The test circuit analyzes the digital test data to determine the accuracy of the CTDS ADC.

    PROCESSING SYSTEM, RELATED INTEGRATED CIRCUIT, DEVICE AND METHOD

    公开(公告)号:US20220334865A1

    公开(公告)日:2022-10-20

    申请号:US17657856

    申请日:2022-04-04

    Abstract: A processing system includes safety monitoring circuits configured to generate error signals by monitoring a microprocessor operations, a memory controller, and/or a resource. The system further includes fault collection sub-circuits, each including one or more error combination circuits, each including a first programmable register and being configured to receive a subset of the error signals, determine whether an error signal is asserted, and store to the first register error status data that identifies the asserted error signal. Each error combination circuit is configured to read enable data from the first register and generate a combined error signal based on the error status and enable data. The error management circuit includes a second programmable register and is configured to receive the combined error signals, read routing data from the second register, and generate for each microprocessor an error signal based on the combined error signals and routing data.

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