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公开(公告)号：US20210295490A1
公开(公告)日：2021-09-23
申请号：US17226838
申请日：2021-04-09
发明人： Seung Bum HAN , Filip Lukasz PIEKNIEWSKI , Dae Sung KOO , Woo Young LIM , Jin Man KANG , Ki Won PARK
IPC分类号： G06T7/00
摘要： An apparatus for inspecting components may include a processor for: determining exterior information of a first component mounted on a first printed circuit board; inspecting a mounting state of the first component by using inspection information of a second component having a first similarity value, when the first similarity value is higher than or equal to a preset reference similarity value, and updating the inspection information of the plurality of components by using the inspection information of the first component matched with the inspection information of the second component, when it is determined that the mounting state of the first component is good.
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公开(公告)号：US11116600B2
公开(公告)日：2021-09-14
申请号：US16313276
申请日：2018-08-31
申请人： KOH YOUNG TECHNOLOGY INC. , INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
发明人： Byung Ju Yi , Jae Hong Woo
摘要： A medical arm assembly according to an embodiment disclosed includes: a remote joint where a remote point is located; a positioning arm section configured to support the remote joint, move the remote joint that a position of the remote point relative to the reference point is changed only in the direction of a virtual reference straight-line through the reference point and the remote point, and fix the relative position of the remote point; an operating arm section connected to the remote joint and configured to fix a medical tool, rotate the tool about a remote rotation axis perpendicular to the reference straight-line and through the remote point, and move the tool in a direction perpendicular to the remote rotation axis and through the remote point; and an arm supporting section where the positioning arm section and the operating arm section are supported by connecting and the reference point is located.
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公开(公告)号：US20210254966A1
公开(公告)日：2021-08-19
申请号：US16764706
申请日：2018-11-15
发明人： Jung HUR , Woo Jae CHOI
摘要： An inspection apparatus for inspecting the appearance of an inspection target object is provided. The inspection apparatus according to one embodiment of the present disclosure includes a support part configured to hold an inspection target object such that a side surface of the inspection target object faces a predetermined direction, a light source configured to irradiate light toward the inspection target object, a diffusion reflector configured to diffusely reflect at least a part of the irradiated light to irradiate the reflected light to the side surface of the inspection target object, and at least one inspection part configured to inspect the inspection target object by receiving the light reflected from the inspection target object and the diffusion reflector.
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公开(公告)号：US20210220083A1
公开(公告)日：2021-07-22
申请号：US16313290
申请日：2018-08-31
申请人： KOH YOUNG TECHNOLOGY INC. , INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
发明人： Byung Ju YI , Jae Hong WOO
摘要： A medical arm assembly according to embodiments disclosed includes: a remote joint where a remote point spaced forward from a reference point is located; a positioning arm section configured to support the remote joint, move the remote joint that a relative position of the remote point with respect to the reference point is changed in forward-and-rearward direction and upward-and-downward direction, and fix the relative position of the remote point with respect to the reference point; an operating arm section connected to the remote joint and configured to fix a surgery tool, rotate the surgery tool about a remote-rotation axis through the remote point in left-and-right direction, and move the surgery tool in a direction perpendicular to the remote rotation axis and through the remote point; and an arm supporting section where the positioning arm section and the operating arm section are supported by connecting and the reference point is located.
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公开(公告)号：US20210102903A1
公开(公告)日：2021-04-08
申请号：US17123901
申请日：2020-12-16
发明人： Chan Kwon LEE , Moon Young JEON , Jung HUR , Deok Hwa HONG , Eun Ha JO
摘要： The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US20210038323A1
公开(公告)日：2021-02-11
申请号：US17077722
申请日：2020-10-22
申请人： KOH YOUNG TECHNOLOGY INC. , KYUNGPOOK NATIONAL UNIVERSITY INDUSTRY ACADEMIC COOPERATION FOUNDATION
发明人： Jong-Kyu HONG , Hyun-Ki LEE , Min-Young KIM , You-Seong CHAE
摘要： An optical tracking system and a method using the same capable of detecting an exact spatial position and a direction of a target regardless of the distance from the target to be calculated is disclosed. The optical tracking system and a method using the same according to an embodiment of the present invention has an effect of expanding an available area by detecting an exact spatial position and a direction of a target regardless of the distance from the target to be calculated, as well as, a system downsizing is also achieved by significantly reducing size of the marker unit compared with conventional system.
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公开(公告)号：US10890538B2
公开(公告)日：2021-01-12
申请号：US16653291
申请日：2019-10-15
发明人： Chan Kwon Lee , Moon Young Jeon , Jung Hur , Deok Hwa Hong , Eun Ha Jo
摘要： The present disclosure proposes an inspection apparatus. The inspection apparatus may include: a structured-light source configured to sequentially radiate a plurality of structured lights having one phase range; a lens configured to adjust, for each of the plurality of structured lights, optical paths of light beams corresponding to phases of the phase range such that a light beam corresponding to one phase of the phase range arrives at each point of a partial region on an object; an image sensor configured to capture a plurality of reflected lights generated by the structured lights being reflected from the partial region; and a processor configured to acquire a light quantity value of the reflected lights; and derive an angle of the surface by deriving phase values of the reflected lights based on the light quantity value for the reflected lights.
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公开(公告)号：US10796428B2
公开(公告)日：2020-10-06
申请号：US16535824
申请日：2019-08-08
发明人： Seung Ae Seo , Won Mi Ahn , Hye In Lee , Jong Hui Lee
IPC分类号： G06T7/00 , G01B11/02 , G01B11/06 , G01B11/25 , G01N21/956 , H05K1/02 , H05K3/34 , G06T7/62 , G01N21/88 , G05B19/418
摘要： Disclosed are an inspection system and an inspection method of performing image processing on an outline of an inspection object according to whether the inspection object is good or defective, and overlapping and displaying the image-processed outline with reference information for determining whether the inspection object is good or defective. The inspection system includes: a data acquisition unit configured acquire an image of an inspection object by irradiate light on the inspection object; a processing unit configured to detect an outline of the inspection object based on the image data of the inspection object; and an output unit configured to overlap and display the outline with reference information, wherein the processing unit is configured to determine whether the outline is good or defective based on the reference information to perform image processing on the outline according to whether the outline is good or defective.
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公开(公告)号：US20200264420A1
公开(公告)日：2020-08-20
申请号：US16635842
申请日：2018-04-09
发明人： Chan Kwon LEE , Young Chul PARK , Yu Ri KOH
摘要： The present disclosure relates to a medical microscope field. A stereo microscope connected to an optical coherence tomography (OCT) unit for forming a tomographic image of a target object includes an objective lens unit including a plurality of lenses each having an aperture of a predetermined size, a pair of first magnification lens units each including a plurality of lenses having a pair of magnification lens apertures positioned within the aperture of the objective lens unit, a second magnification lens unit including a plurality of lenses having an OCT aperture disposed separately from the pair of magnification lens aperture within the aperture of the objective lens unit, and a light delivery unit configured to receive light from the OCT unit and deliver the light to the second magnification lens unit and configured to deliver light received from the second magnification lens unit to the OCT unit.
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20.发明申请公开(公告)号：US20200035350A1
公开(公告)日：2020-01-30
申请号：US16487636
申请日：2018-02-21
摘要： A method for processing one or more histological images captured by a medical imaging device is disclosed. In this method, the histological image is received, and target regions each of which corresponds to a candidate type of tissue are identified based on a predictive model as sociating one more sample histological images with one or more sample target histological images. One or more display characteristics associated with the identified at least one target histological image is applied to the histological image.
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