Method for fabricating semiconductor device
    11.
    发明授权
    Method for fabricating semiconductor device 有权
    制造半导体器件的方法

    公开(公告)号:US07897504B2

    公开(公告)日:2011-03-01

    申请号:US11747444

    申请日:2007-05-11

    IPC分类号: H01L21/4763

    摘要: A method for fabricating a semiconductor device, in which a lifting phenomenon can be prevented from occurring in forming an amorphous carbon film on an etched layer having tensile stress. According to the invention, since a compression stress on the etched layer or the amorphous carbon film can be reduced or a compression stress film is formed between the etched layer or the amorphous carbon film to prevent a lifting phenomenon from occurring and thus another pattern can be formed to fabricate a highly integrated semiconductor device.

    摘要翻译: 一种制造半导体器件的方法,其中可以防止在具有拉伸应力的蚀刻层上形成非晶碳膜而发生提升现象。 根据本发明,由于可以减小蚀刻层或非晶碳膜上的压缩应力,或者在蚀刻层或非晶碳膜之间形成压缩应力膜,以防止发生升降现象,因此可以是其他图案 形成以制造高度集成的半导体器件。

    Method of manufacturing flash memory device
    12.
    发明授权
    Method of manufacturing flash memory device 失效
    制造闪存设备的方法

    公开(公告)号:US07560340B2

    公开(公告)日:2009-07-14

    申请号:US11567218

    申请日:2006-12-06

    IPC分类号: H01L21/336

    CPC分类号: H01L27/11521

    摘要: A method of manufacturing flash memory devices increases a coupling ratio by increasing the height of a floating gate externally projecting from an isolation layer. A portion of the isolation layer between the floating gates is etched so that a control gate to be formed subsequently is located between the floating gates. Accordingly, an interference phenomenon can be reduced.

    摘要翻译: 制造闪速存储器件的方法通过增加从隔离层外部突出的浮动栅极的高度来增加耦合比。 蚀刻浮置栅极之间的隔离层的一部分,使得随后形成的控制栅极位于浮置栅极之间。 因此,可以降低干扰现象。

    Method of forming metal line of semiconductor device, and semiconductor device
    13.
    发明授权
    Method of forming metal line of semiconductor device, and semiconductor device 失效
    半导体器件金属线形成方法及半导体器件

    公开(公告)号:US07482264B2

    公开(公告)日:2009-01-27

    申请号:US11604484

    申请日:2006-11-27

    IPC分类号: H01L21/283

    摘要: A semiconductor device includes a first barrier metal layer and a second barrier metal layer, a third barrier metal layer, and a metal line. The first barrier metal layer and the second barrier metal layer are formed and on a top surface of an insulating layer over a semiconductor substrate on the bottom surface of trenches formed in the insulating layer. The third barrier metal layer is formed on sidewalls of trenches. The metal line gap-fills the trenches. In a method of forming a metal line of a semiconductor device, trenches are formed within an insulating layer over a semiconductor substrate. A first barrier metal layer and a second barrier metal layer are formed on a bottom surface of the trenches and on a top surface of the insulating layer. A third barrier metal layer is formed on sidewalls of trenches. A metal line gap-fills the trenches.

    摘要翻译: 半导体器件包括第一阻挡金属层和第二阻挡金属层,第三阻挡金属层和金属线。 第一阻挡金属层和第二阻挡金属层形成在半导体衬底上的形成在绝缘层的沟槽的底表面上的绝缘层的顶表面上。 第三阻挡金属层形成在沟槽的侧壁上。 金属线间隙填充沟槽。 在形成半导体器件的金属线的方法中,在半导体衬底上的绝缘层内形成沟槽。 第一阻挡金属层和第二阻挡金属层形成在沟槽的底表面和绝缘层的顶表面上。 第三阻挡金属层形成在沟槽的侧壁上。 金属线间隙填充沟槽。

    METHOD OF FABRICATING A FLASH MEMORY DEVICE
    14.
    发明申请
    METHOD OF FABRICATING A FLASH MEMORY DEVICE 审中-公开
    制造闪速存储器件的方法

    公开(公告)号:US20080268608A1

    公开(公告)日:2008-10-30

    申请号:US11951926

    申请日:2007-12-06

    IPC分类号: H01L21/76

    CPC分类号: H01L27/11521

    摘要: In a method of fabricating a flash memory device, after an isolation trench is formed, a bottom surface and sidewalls of the trench are gap-filled with a HARP film having a favorable step coverage. A wet etch process is performed such that the HARP film remains on the sidewalls of a tunnel dielectric layer, thereby forming a wing spacer. Accordingly, the tunnel dielectric layer can be protected and an interference phenomenon can be reduced because a control gate to be formed subsequently is located between floating gates.

    摘要翻译: 在制造闪速存储器件的方法中,在形成隔离沟槽之后,沟槽的底表面和侧壁间隙填充有具有良好阶梯覆盖率的HARP膜。 执行湿蚀刻工艺,使得HARP膜保留在隧道介电层的侧壁上,从而形成翼间隔物。 因此,由于随后要形成的控制栅极位于浮置栅极之间,所以可以保护隧道介质层并且可以减小干扰现象。

    METHOD OF MANUFACTURING FLASH MEMORY DEVICE
    15.
    发明申请
    METHOD OF MANUFACTURING FLASH MEMORY DEVICE 审中-公开
    制造闪存存储器件的方法

    公开(公告)号:US20080220605A1

    公开(公告)日:2008-09-11

    申请号:US11955836

    申请日:2007-12-13

    IPC分类号: H01L21/283

    CPC分类号: H01L27/11521 H01L27/115

    摘要: The present invention discloses a method of manufacturing a flash memory device comprising the steps of forming a first insulating layer and a first conductive layer on a semiconductor substrate; etching the first conductive layer, the first insulating layer and the semiconductor substrate to form a trench; forming an isolation layer on a region on which the trench is formed; forming a second conductive layer to make the second conductive layer contact with the first conductive layer; and removing the second conductive layer formed on the isolation layer.

    摘要翻译: 本发明公开了一种制造闪速存储器件的方法,包括以下步骤:在半导体衬底上形成第一绝缘层和第一导电层; 蚀刻第一导电层,第一绝缘层和半导体衬底以形成沟槽; 在形成有沟槽的区域上形成隔离层; 形成第二导电层以使第二导电层与第一导电层接触; 以及去除形成在隔离层上的第二导电层。

    Method of manufacturing flash memory device
    16.
    发明申请
    Method of manufacturing flash memory device 有权
    制造闪存设备的方法

    公开(公告)号:US20080003724A1

    公开(公告)日:2008-01-03

    申请号:US11647628

    申请日:2006-12-29

    IPC分类号: H01L21/8232

    摘要: A method of manufacturing a flash memory device includes the steps of forming gate patterns for cells and gate patterns for select transistors over a semiconductor substrate, forming a buffer insulating layer on the resulting surface including the gate patterns, forming an insulating layer to form void in spaces between the gate patterns for cells, forming a nitride layer on the insulating layer, and forming a spacer on one side of each of the gate patterns for select transistors by a spacer etch process.

    摘要翻译: 一种制造闪速存储器件的方法包括以下步骤:在半导体衬底上形成用于单元的栅极图案和用于选择晶体管的栅极图案,在包含栅极图案的所得表面上形成缓冲绝缘层,形成绝缘层以形成空隙 用于单元的栅极图案之间的间隔,在绝缘层上形成氮化物层,并且通过间隔物蚀刻工艺在用于选择晶体管的每个栅极图案的一侧上形成间隔物。

    Laundry dryer
    17.
    发明申请
    Laundry dryer 审中-公开
    洗衣机

    公开(公告)号:US20060272173A1

    公开(公告)日:2006-12-07

    申请号:US11437689

    申请日:2006-05-22

    申请人: Hwan Myung

    发明人: Hwan Myung

    IPC分类号: F26B3/00 F26B21/06 D06F58/00

    CPC分类号: D06F58/24 D06F58/20

    摘要: A laundry dryer is provided. The laundry dryer includes a drying drum to put laundry in, a base, and a condensed water storage. The base forms a passage to exhaust water vapor passing through the drying drum to the outside. The condensed water storage stores moisture contained in the water vapor.

    摘要翻译: 提供洗衣机。 衣物干燥机包括将衣物放入,底座和冷凝水储存器的干燥滚筒。 底座形成通过将通过干燥鼓的水蒸汽排到外部的通道。 冷凝水储存器储存含在水蒸气中的水分。

    Air flow structure of dryer
    18.
    发明申请
    Air flow structure of dryer 有权
    干燥机空气流动结构

    公开(公告)号:US20050132600A1

    公开(公告)日:2005-06-23

    申请号:US11012204

    申请日:2004-12-16

    申请人: Hwan Myung

    发明人: Hwan Myung

    CPC分类号: D06F58/04

    摘要: Provided is an air flow structure for a dryer, which includes a drying fan, and an air guide having a bent and inclined shape so as to guide flow of a circulation air discharged by the drying fan. This air flow structure improves air circulation flow in the dryer, reduces noise generated in the drying procedure, and increases air volume introduced into a drying duct.

    摘要翻译: 本发明提供一种空气流结构的干燥机,其包括干燥风扇,和具有弯曲和倾斜的形状,以便引导通过干燥风扇排出的循环空气的流动的空气引导。 该空气流结构提高了在干燥机的空气循环流,降低了干燥过程中产生的噪声,并且增加引入到干燥管的空气量。

    Method for imaging zinc activation within a mitochondrion using a two-photon fluorescent probe, and method for manufacturing the two-photon fluorescent probe
    19.
    发明授权
    Method for imaging zinc activation within a mitochondrion using a two-photon fluorescent probe, and method for manufacturing the two-photon fluorescent probe 有权
    使用双光子荧光探针在线粒体内锌激活成像的方法和用于制造双光子荧光探针的方法

    公开(公告)号:US09006452B2

    公开(公告)日:2015-04-14

    申请号:US13980946

    申请日:2011-10-18

    申请人: Hwan Myung Kim

    发明人: Hwan Myung Kim

    摘要: Provided is a two-photon fluorescent probe, and more particularly, a two-photon fluorescent probe which is one or more selected from compounds represented by Formulae 1 and 2, a method for manufacturing the same, and an imaging method of zinc ions within the mitochondrion using the same. Since two probes are introduced into one molecule, the two-photon fluorescent probe of the present invention can selectively dye the mitochondria, simultaneously with reacting with zinc ions, thereby generating intense fluorescence. Thus, the two-photon fluorescent probe of the present invention can be used for the imaging of zinc ion distribution and activation within the mitochondrion in living cells or intact biological tissues.

    摘要翻译: 本发明提供双光子荧光探针,更具体地说,涉及一种或多种选自式1和式2表示的化合物的双光子荧光探针,其制造方法和锌离子的成像方法 线粒体使用相同。 由于将两个探针引入一个分子中,本发明的双光子荧光探针可以与锌离子反应同时选择性地染色线粒体,从而产生强烈的荧光。 因此,本发明的双光子荧光探针可用于在活细胞或完整的生物组织中的线粒体内的锌离子分布和活化成像。