公开(公告)号：USD596926S1

公开(公告)日：2009-07-28

申请号：US29318511

申请日：2008-05-21

Applicant: Gangaikondan Ramasubiramanian Venkateraman ,  Perry A Palumbo

Designer： Gangaikondan Ramasubiramanian Venkateraman ,  Perry A Palumbo

公开(公告)号：US20070222987A1

公开(公告)日：2007-09-27

申请号：US11610038

申请日：2006-12-13

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/00

CPC classification number: G01N15/0227

Abstract: The optical design of a measurement system is disclosed. The measurement system comprising a light source configured to provide light along a first axis. The measurement system has a reflecting lens aligned along a second axis where the reflecting lens has a first focus on the second axis and a second focus on the second axis where the second focus is between the first focus and the reflecting lens and where the second focus is positioned near the first axis. The measurement system has a field lens located on the second axis and positioned such that the second focus of the reflecting lens occurs inside the field lens. The measurement system has a relay lens system aligned to the second axis where the relay lens system forms a first focus at the second focus of the reflecting lens. The measurement system has a sensor located on the second axis at a second focus of the relay lens system and is configured to detect scattered light near the second focus of the reflecting lens.

Abstract translation: 公开了一种测量系统的光学设计。 该测量系统包括被配置为沿着第一轴提供光的光源。 测量系统具有沿着第二轴对准的反射透镜，其中反射透镜在第二轴上具有第一焦点，并且第二焦点在第二轴上，其中第二焦点在第一焦点和反射透镜之间，并且第二焦点 位于第一轴附近。 测量系统具有位于第二轴上的场透镜，并且被定位成使得反射透镜的第二焦点在场透镜内部发生。 测量系统具有与第二轴对准的中继透镜系统，其中中继透镜系统在反射透镜的第二焦点处形成第一焦点。 测量系统具有位于中继透镜系统的第二焦点处的第二轴上的传感器，并且被配置为检测反射透镜的第二焦点附近的散射光。

公开(公告)号：US20070222980A1

公开(公告)日：2007-09-27

申请号：US11609110

申请日：2006-12-11

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/00 ,  G01J1/10

CPC classification number: G01N15/0227 ,  G01N21/276 ,  G01N21/532 ,  G01N2015/0294

Abstract: A measurement system that can self calibrate is disclosed. The measurement system comprising a first light source directed along a first axis and configured to illuminate a sample volume. The measurement system has a sensor aligned along a second axis and is configured to detect scattered light in the sample volume. The measurement system has a second light source aligned along the second axis that is configured to illuminate the sensor during a calibration procedure.

Abstract translation: 公开了可以进行自校准的测量系统。 测量系统包括沿着第一轴指向并被配置为照亮样本体积的第一光源。 测量系统具有沿着第二轴对准的传感器，并且被配置为检测样品体积中的散射光。 测量系统具有沿着第二轴对准的第二光源，该第二光源配置成在校准过程期间照亮传感器。

公开(公告)号：US08508734B2

公开(公告)日：2013-08-13

申请号：US13814669

申请日：2011-08-01

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/00

Abstract: An annular optical device (100) includes an annular meso-optic (1) including an annulus (11) centered about an axis of revolution (A) and a secondary optical structure (2) substantially coaxial within the annulus (11). The secondary optical structure (2) and the annular meso-optic (1) are separated by a media (12) including a media refractive index that is lower than the refractive index of the secondary optical structure. The secondary optical structure (2) holds a specimen to be radiated by impinging electromagnetic radiation. Scattered radiation from the secondary optical structure (2) and within the annulus (11) of the annular meso-optic (1) is allowed into the annular meso-optic (1) if an angle of incidence of the scattered radiation exceeds a predetermined incidence threshold. The annular meso-optic (1) re-directs the scattered radiation to comprise re-directed radiation that is substantially parallel to the axis of revolution (A).

公开(公告)号：US20120170137A1

公开(公告)日：2012-07-05

申请号：US13395153

申请日：2010-09-08

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G02B13/18

CPC classification number: G02B5/001 ,  G02B13/06 ,  G02B19/0028 ,  G02B19/008

Abstract: A meso-optic device (1) includes a substantially annular meso-optic body (100) including an axis of revolution (2), a divergent conic optical surface (112) substantially coaxial with the axis of revolution (2), with the divergent conic optical surface (112) configured to receive electromagnetic radiation propagating along an optical axis (3) from an impingent direction, wherein the optical axis (3) is coincident with or intersects the axis of revolution (2), and with the divergent conic optical surface (112) configured to divergently re-direct the electromagnetic radiation away from the axis of revolution (2), and a convergent conic optical surface (114) substantially coaxial with the axis of revolution (2), with the convergent conic optical surface (114) configured to receive the electromagnetic radiation divergently re-directed by the divergent conic optical surface (112) and with the convergent conic optical surface (114) configured to convergently re-direct the electromagnetic radiation toward the axis of revolution (2).

Abstract translation: 中视光学装置（1）包括基本上环形的中等光学主体（100），其包括旋转轴线（2），与旋转轴线（2）基本同轴的发散锥形光学表面（112），发散的 锥形光学表面（112），被配置为接收沿着光轴（3）从碰撞方向传播的电磁辐射，其中所述光轴（3）与所述旋转轴线（2）重合或相交，并且与所述发散锥形光学 配置成将电磁辐射远离旋转轴线（2）发散的表面（112）和与旋转轴线（2）基本上同轴的会聚锥形光学表面（114）与会聚锥形光学表面 114），其被配置为接收由发散锥形光学表面（112）发散地重新引导的电磁辐射，并且会聚的锥形光学表面（114）被配置成会聚地重新引导电磁辐射 朝向革命轴线（2）。

公开(公告)号：US07538874B2

公开(公告)日：2009-05-26

申请号：US11610023

申请日：2006-12-13

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N15/02

CPC classification number: G01N15/0227 ,  G01N21/532 ,  G01N33/18 ,  G01N2015/0693

Abstract: A measurement system that can measure scattered light across a predetermined scatter angle is disclosed. The measurement system has a light source configured to provide light along a first axis. The measurement system has a lens system aligned along a second axis that has a first focus near the first axis and where the second axis is different than the first axis. The measurement system has a sensor located on the second axis at a second focus of the lens system and is configured to detect scattered light near the first focus. The measurement system has a mask located on the second axis and is configured to limit the light that reaches the sensor to a predetermined angle of scatter. The disclosed invention eliminates the need for multiple nephelometric measuring devices and also system verification devices in order to perform assay of the presents or absence or number of suspended particles in a media as well as verification of the systems ability to measure in compliance to required performance attributes.

Abstract translation: 公开了一种能够测量跨越预定散射角的散射光的测量系统。 测量系统具有被配置为沿着第一轴提供光的光源。 测量系统具有沿着第二轴线对准的透镜系统，该第二轴线具有靠近第一轴线的第一焦点，而第二轴线不同于第一轴线。 测量系统具有位于透镜系统的第二焦点处的第二轴上的传感器，并且被配置为检测第一焦点附近的散射光。 测量系统具有位于第二轴上的掩模，并且被配置为将到达传感器的光限制到预定的散射角。 所公开的发明消除了对多个比浊法测量装置和系统验证装置的需要，以便对介质中悬浮颗粒的存在或不存在或数量进行测定，以及验证系统按照所需性能属性进行测量的能力 。

公开(公告)号：US07528951B2

公开(公告)日：2009-05-05

申请号：US11609168

申请日：2006-12-11

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/00

CPC classification number: G01N15/0227 ,  G01N21/05 ,  G01N21/532 ,  G01N2201/065

Abstract: A measurement system that has multiple sensors or multiple light sources is disclosed. The measurement system comprising a light source directed along a first axis and configured to illuminate a sample volume. The measurement system has a first sensor aligned along a second axis and is configured to detect scattered light in the sample volume. The measurement system has a second sensor aligned along a third axis and is also configured to detect scattered light in the sample volume.

Abstract translation: 公开了具有多个传感器或多个光源的测量系统。 所述测量系统包括沿着第一轴线指向并被配置为照亮样本体积的光源。 测量系统具有沿着第二轴对准的第一传感器，并且被配置为检测样品体积中的散射光。 测量系统具有沿着第三轴对准的第二传感器，并且还被配置为检测样品体积中的散射光。

公开(公告)号：US07495763B2

公开(公告)日：2009-02-24

申请号：US11609211

申请日：2006-12-11

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/00 ,  G01J1/04

CPC classification number: G01N15/0227 ,  G01N21/276 ,  G01N21/532 ,  G01N33/18

Abstract: A measurement system having dual measurements capabilities is disclosed. The measurement system has a light source configured to provide light along a first axis that illuminates a sample media. The measurement system has a first sensor configured to measure scattered light in a sample media. The measurement system has a second sensor configured to measure light passing through the sample media.

Abstract translation: 公开了一种具有双重测量能力的测量系统。 测量系统具有被配置为沿着照亮样品介质的第一轴提供光的光源。 测量系统具有配置成测量样品介质中的散射光的第一传感器。 测量系统具有被配置成测量通过样品介质的光的第二传感器。

公开(公告)号：US5055269A

公开(公告)日：1991-10-08

申请号：US319745

申请日：1989-03-06

Applicant: Perry A. Palumbo ,  Oscar Singleton ,  Louis G. Gaetano

Inventor： Perry A. Palumbo ,  Oscar Singleton ,  Louis G. Gaetano

IPC: G01N27/12 ,  G01N27/16

CPC classification number: G01N27/16 ,  G01N27/122

Abstract: A temperature limited catalytic gas detector includes a catalytic gas sensor in one branch of a Wheatstone bridge network. A power supply is connected through a voltage controlled regulator to the bridge network. An instrumentation amplifier measures electrical imbalances across the bridge network. A display is connected to the output of the instrumentation amplifier. The detector also includes a comparator which compares the output of the instrumentation amplifier with a predetermined limit signal and produces an output when the output of the instrumentation amplifier exceeds the limit voyage. The regulator is responsive to the output of the comparator to thereby reduce the power supply to the bridge network. The limit signal is equivalent to the output of the instrumentation amplifier when the gas sensor is at a particular high temperature. The arrangement prevents the gas sensor from operating at excessive operation temperatures.

Abstract translation: 温度有限的催化气体检测器包括在惠斯通电桥网络的一个分支中的催化气体传感器。 电源通过电压调节器连接到桥接网络。 仪表放大器测量跨桥网络的电气不平衡。 显示器连接到仪表放大器的输出。 检测器还包括一个比较器，用于将仪表放大器的输出与预定的限制信号进行比较，并在仪表放大器的输出超过极限航程时产生一个输出。 调节器响应于比较器的输出，从而减少对桥接网络的供电。 当气体传感器处于特定高温时，极限信号相当于仪表放大器的输出。 该装置防止气体传感器在过度的操作温度下操作。

公开(公告)号：US08208144B2

公开(公告)日：2012-06-26

申请号：US12668926

申请日：2008-07-15

Applicant: Perry A. Palumbo

Inventor： Perry A. Palumbo

IPC: G01N21/59 ,  G01N21/55

CPC classification number: G01N21/59 ,  G01N21/49 ,  G01N21/51 ,  G01N21/55

Abstract: A spatial frequency optical measurement instrument (100) is provided according to the invention. The instrument (100) includes a spatial frequency mask (120) positioned in a light path and configured to encode light with spatial frequency information, a light receiver (140) positioned to receive the light encoded with the spatial frequency information, wherein the light encoded with the spatial frequency information has been interacted with a sample material, and a processing system (180) coupled to the light receiver (140) and configured to determine a change in the spatial frequency information due to the interaction of the light with the sample material.

Abstract translation: 根据本发明提供一种空间频率光学测量仪器（100）。 仪器（100）包括位于光路中并被配置为用空间频率信息对光进行编码的空间频率掩模（120），光接收器（140）定位成接收用空间频率信息编码的光，其中光编码 其中所述空间频率信息已经与样本材料相互作用，以及耦合到所述光接收器（140）并且被配置为确定由于所述光与所述样本材料的相互作用而导致的空间频率信息的变化的处理系统（180） 。