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公开(公告)号:US10355558B2
公开(公告)日:2019-07-16
申请号:US16236600
申请日:2018-12-30
IPC: H02K7/18 , H02K7/116 , H02K7/108 , F03D9/12 , F03D9/25 , H02S10/10 , H02S40/22 , H02S40/38 , H01L35/30 , F03G3/06 , F24S20/00 , H02S40/44
Abstract: Computer-processor controlled energy harvester system. The system uses a plurality of oscillating weight type energy collectors, each configured to store the energy from changes in the system's ambient motion as stored mechanical energy, often in a compressed spring. The energy collectors are configured to move between a first position where the energy collector stores energy, to a second position where the energy collectors release stored energy to a geared electrical generator shaft, thus producing electrical energy, often stored in a battery. A plurality of processor controlled electronic actuators, usually one per energy collector, control when each energy collector stores and releases energy. The processor can use accelerometer sensors, battery charge sensors, and suitable software and firmware to optimize system function. The system can use the energy for various useful purposes, including sensor monitoring, data acquisition, wireless communications, and the like, and can also receive supplemental power from other sources.
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公开(公告)号:US20170169910A1
公开(公告)日:2017-06-15
申请号:US15442670
申请日:2017-02-26
Inventor: Allison Sihan Jia , Muzhi Liu , Yuhao Wang , Kevin Shaokang You , Jingyi Zhang , Zhuotong Xian
CPC classification number: G21K7/00 , G01N23/00 , G01N23/20083 , G01N2223/304 , G01N2223/3103 , G01N2223/316
Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. At least one sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, often using a sample administration device configured to present a plurality of samples. The sample is exposed to brief bursts of coherent X-ray illumination, often further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from the samples is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same samples can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the samples.
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