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公开(公告)号：US20180020996A1
公开(公告)日：2018-01-25
申请号：US15713645
申请日：2017-09-23
Inventor： Yiming Wang , Vincent Huang , Hanjie Zou , Eileen Guo , Ruibo Wu , Zhuotong Xian
CPC classification number: A61B6/4064 , G01N23/083 , G01N23/20008 , G01N23/20083 , G01N23/223 , G01N2223/3103 , G21K7/00
Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample. Methods to further improve performance, such as concave or curved detectors, improved temperature control, and alternative X-ray optics are also disclosed.
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Patent Agency Ranking
公开(公告)号：US09583229B2
公开(公告)日：2017-02-28
申请号：US15218017
申请日：2016-07-23
Inventor： Yiying Cao , Roger Kim , Michael Chang , Zhuotong Xian , Katherine Han
CPC classification number: G21K7/00 , G01N23/20083 , G01N2223/3103
Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample.
Abstract translation: 改进的X射线激光显微镜系统和方法，结合了从X射线衍射和X射线成像方法获得的信息。 将样品置于超低温，超低压真空室中，暴露于使用X射线镜和针孔准直方法进一步浓缩的相干X射线照射的短暂阵列。 使用诸如自由电子X射线激光器的硬X射线激光器和X射线衍射方法获得来自样品的更高分辨率数据。 使用硬或软X射线激光源的任何一种可以获得来自相同样品的较低分辨率数据，以及使用纳米级蚀刻区域板技术的X射线成像方法。 在一些实施例中，可以同时获得衍射和成像数据。 来自两个来源的数据被组合以创建样本的更完整的表示。
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公开(公告)号：US20170169910A1
公开(公告)日：2017-06-15
申请号：US15442670
申请日：2017-02-26
Inventor： Allison Sihan Jia , Muzhi Liu , Yuhao Wang , Kevin Shaokang You , Jingyi Zhang , Zhuotong Xian
CPC classification number: G21K7/00 , G01N23/00 , G01N23/20083 , G01N2223/304 , G01N2223/3103 , G01N2223/316
Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. At least one sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, often using a sample administration device configured to present a plurality of samples. The sample is exposed to brief bursts of coherent X-ray illumination, often further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from the samples is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same samples can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the samples.
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公开(公告)号：US09943272B2
公开(公告)日：2018-04-17
申请号：US15713645
申请日：2017-09-23
Inventor： Yiming Wang , Vincent Huang , Hanjie Zou , Eileen Guo , Ruibo Wu , Zhuotong Xian
IPC: A61B6/00 , G21K7/00 , G01N23/20 , G01N23/083 , G01N23/223
CPC classification number: A61B6/4064 , G01N23/083 , G01N23/20008 , G01N23/20083 , G01N23/223 , G01N2223/3103 , G21K7/00
Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample. Methods to further improve performance, such as concave or curved detectors, improved temperature control, and alternative X-ray optics are also disclosed.
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公开(公告)号：US09859029B2
公开(公告)日：2018-01-02
申请号：US15442670
申请日：2017-02-26
Inventor： Allison Sihan Jia , Muzhi Liu , Yuhao Wang , Kevin Shaokang You , Jingyi Zhang , Zhuotong Xian
CPC classification number: G21K7/00 , G01N23/00 , G01N23/20083 , G01N2223/304 , G01N2223/3103 , G01N2223/316
Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. At least one sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, often using a sample administration device configured to present a plurality of samples. The sample is exposed to brief bursts of coherent X-ray illumination, often further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from the samples is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same samples can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the samples.
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公开(公告)号：US20160329119A1
公开(公告)日：2016-11-10
申请号：US15218017
申请日：2016-07-23
Inventor： Yiying Cao , Roger Kim , Michael Chang , Zhuotong Xian , Katherine Han
IPC: G21K7/00
CPC classification number: G21K7/00 , G01N23/20083 , G01N2223/3103
Abstract: Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, and exposed to brief bursts of coherent X-ray illumination further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from a sample is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same sample can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the sample.
Abstract translation: 改进的X射线激光显微镜系统和方法，结合了从X射线衍射和X射线成像方法获得的信息。 将样品置于超低温，超低压真空室中，暴露于使用X射线镜和针孔准直方法进一步浓缩的相干X射线照射的短暂阵列。 使用诸如自由电子X射线激光器的硬X射线激光器和X射线衍射方法获得来自样品的更高分辨率数据。 使用硬或软X射线激光源的任何一种可以获得来自相同样品的较低分辨率数据，以及使用纳米级蚀刻区域板技术的X射线成像方法。 在一些实施例中，可以同时获得衍射和成像数据。 来自两个来源的数据被组合以创建样本的更完整的表示。
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