公开(公告)号：US09859029B2

公开(公告)日：2018-01-02

申请号：US15442670

申请日：2017-02-26

申请人： Rising Star Pathway, a California Corporation

发明人： Allison Sihan Jia ,  Muzhi Liu ,  Yuhao Wang ,  Kevin Shaokang You ,  Jingyi Zhang ,  Zhuotong Xian

IPC分类号： G01N23/00 ,  G21K7/00

CPC分类号： G21K7/00 ,  G01N23/00 ,  G01N23/20083 ,  G01N2223/304 ,  G01N2223/3103 ,  G01N2223/316

摘要： Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. At least one sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, often using a sample administration device configured to present a plurality of samples. The sample is exposed to brief bursts of coherent X-ray illumination, often further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from the samples is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same samples can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the samples.

公开(公告)号：US20170169910A1

公开(公告)日：2017-06-15

申请号：US15442670

申请日：2017-02-26

申请人： Rising Star Pathway, a California Corporation

发明人： Allison Sihan Jia ,  Muzhi Liu ,  Yuhao Wang ,  Kevin Shaokang You ,  Jingyi Zhang ,  Zhuotong Xian

IPC分类号： G21K7/00 ,  G01N23/00

CPC分类号： G21K7/00 ,  G01N23/00 ,  G01N23/20083 ,  G01N2223/304 ,  G01N2223/3103 ,  G01N2223/316

摘要： Improved system and method of X-ray laser microscopy that combines information obtained from both X-ray diffraction and X-ray imaging methods. At least one sample is placed in an ultra-cold, ultra-low pressure vacuum chamber, often using a sample administration device configured to present a plurality of samples. The sample is exposed to brief bursts of coherent X-ray illumination, often further concentrated using X-ray mirrors and pinhole collimation methods. Higher resolution data from the samples is obtained using hard X-ray lasers, such as free electron X-ray lasers, and X-ray diffraction methods. Lower resolution data from the same samples can be obtained using any of hard or soft X-ray laser sources, and X-ray imaging methods employing nanoscale etched zone plate technology. In some embodiments both diffraction and imaging data can be obtained simultaneously. Data from both sources are combined to create a more complete representation of the samples.