摘要:
The invention provides a circuit that can observe data within shift registers without altering the data. The circuit includes selectors connected to the inputs and outputs of the shift registers. The selectors selectively connect the input with the output of a selected shift register to form a wiring loop for the selected shift register. A control device connected to the wiring loop uses the wiring loop to cause the data to be continually transferred from the output of the selected shift register to the input of the selected shift register and back through the selected shift register in a circular manner. The control device includes a counter used for determining the length of a selected shift register and a set of registers to store, for future use when rotating data in the shift registers, the length of each shift register. The control device also includes a data output accessible from outside the circuit. An observation wire is connected to the wiring loop, and the data passes from the wiring loop to the control device through the observation wire. The control device outputs data appearing on the wiring loop as the data is circulated through the selected shift register to permit data within the selected shift register to be observed outside the circuit without altering the data within the selected shift register.
摘要:
Disclosed are embodiments of a multi-bank random access memory (RAM) structure that provides signal buffering at both the global and local connector level for improved performance. Specifically, inverters are incorporated into the global connector(s), which traverse groups of memory banks and which transmit signals (e.g., address signals, control signals, and/or data signals) from a memory controller, and also into alternating groups of local connectors, which connect nodes on the global connector(s) to corresponding groups of memory banks, such that any of the signals that are received by the memory banks from the memory controller via the global and local connectors are buffered by an even number of inverters and are thereby true signals. Signal buffering at both the global and local connector level results in relatively fast slews, short propagation delays, and low peak power consumption with minimal, if any, increase in area consumption.
摘要:
An apparatus for regulating eFUSE programming current includes a current control generator receiving an input reference current through a first current path of reference fuses, the input reference current proportional to a desired eFUSE programming current; a second current path including a reference programming FET and a second group of reference fuses; and a voltage comparator coupled to a gate terminal of the reference programming FET so as to adjust the gate voltage of the reference programming FET to equalize a first voltage across the first current path with a second voltage across the second current path. The gate voltage of the reference programming FET is an output of the current control generator, coupled to corresponding gates of one or more selected programming devices of an eFUSE array such that the selected programming devices source the desired eFUSE programming current to a selected eFUSE to be programmed.
摘要:
A fuse latch circuit with a current reference generator is described where the resistive switch point of the latch is stabilized against effects of manufacturing processing, operating voltage and temperature. A digital control word is used to select the desired resistive trip point of the fuse latch and compensation within the reference generator maintains this resistive trip point with high accuracy. The variable resistive trip point is set to a first value at test and then to a second value in use condition to enhance operating margin, and soft error immunity.
摘要:
A method and circuit for timing the start of a precharge period in an eDRAM. The circuit including: a delayed lock loop circuit for receiving a clock signal and generating a control signal for adjusting an internal delay of the clock signal; and means for generating a delayed clock signal in response to the control signal. The means for generating the delayed clock signal is a multiple stage delay circuit, each stage of the multiple delay stage circuit connected in series and each stage individually responsive to the control signal.
摘要:
The invention provides a circuit that can observe data within shift registers without altering the data. The circuit includes selectors connected to the inputs and outputs of the shift registers. The selectors selectively connect the input with the output of a selected shift register to form a wiring loop for the selected shift register. A control device connected to the wiring loop uses the wiring loop to cause the data to be continually transferred from the output of the selected shift register to the input of the selected shift register and back through the selected shift register in a circular manner. The control device includes a counter used for determining the length of a selected shift register and a set of registers to store, for future use when rotating data in the shift registers, the length of each shift register. The control device also includes a data output accessible from outside the circuit. An observation wire is connected to the wiring loop, and the data passes from the wiring loop to the control device through the observation wire. The control device outputs data appearing on the wiring loop as the data is circulated through the selected shift register to permit data within the selected shift register to be observed outside the circuit without altering the data within the selected shift register.
摘要:
An electrical fuse circuit design for reducing the testing time for a semiconductor device manufactured with redundant eFuse circuitry. A two-to-one multiplexer (MUX) is provided at each eFuse circuit in addition to the fuse latch and pattern latch. Information on which fuse is to be blown is stored in the fuse's pattern latch. The output of the pattern latch is ANDed with a program input to provide a select signal for the MUX. Based on the select signal, the MUX allows the shifted “1” to either go to the next latch in the shift chain or bypass the next latch or latches in the shift chain when the next fuse(s) is not to be blown. Accordingly, the invention enables only those fuse latches associated with fuses that are to be blown to hold up the propagation of the shifted “1” to the next eFuse circuits.
摘要:
A reference generator with programmable m and b parameters and methods of use are provided. A circuit includes a first generator operable to generate a first voltage including a fraction of a supply voltage. The circuit further includes a second generator operable to generate a second voltage. The circuit further includes a mixer and buffer circuit operable to output a reference voltage including a sum of the first and second voltages.
摘要:
An apparatus for regulating eFUSE programming current includes a current control generator receiving an input reference current through a first current path of reference fuses, the input reference current proportional to a desired eFUSE programming current; a second current path including a reference programming FET and a second group of reference fuses; and a voltage comparator coupled to a gate terminal of the reference programming FET so as to adjust the gate voltage of the reference programming FET to equalize a first voltage across the first current path with a second voltage across the second current path. The gate voltage of the reference programming FET is an output of the current control generator, coupled to corresponding gates of one or more selected programming devices of an eFUSE array such that the selected programming devices source the desired eFUSE programming current to a selected eFUSE to be programmed.
摘要:
The status of multiple on-chip power supply systems is indicated for use in modifying chip test flow and diagnosing chip failure. Digital compliance signals are received, each compliance signal associated with one of multiple on-chip power supplies. Each power supply has an associated compliance level, and each compliance signal indicates whether its associated power supply is operating at the associated compliance level. The compliance signals are converted into a power supply status signal indicating status of the compliance signals associated with the power supply. The power supply status signal is output. If a power supply is operating at its associated compliance level, the output power supply status signal indicates that the power supply is passing. If the power supply is not operating at its associated compliance level, the output power supply status signal indicates that the power supply is failing. If a power supply is failing, a memory test may be aborted, simplifying chip failure diagnosis.