Method for programming a block of memory cells, non-volatile memory device and memory card device
    11.
    发明申请
    Method for programming a block of memory cells, non-volatile memory device and memory card device 失效
    用于编程存储器单元,非易失性存储器件和存储卡器件的块的方法

    公开(公告)号:US20070242518A1

    公开(公告)日:2007-10-18

    申请号:US11402649

    申请日:2006-04-12

    IPC分类号: G11C11/34

    CPC分类号: G11C16/3459 G11C16/3454

    摘要: A method is provided for programming a block of memory cells of a non-volatile memory device. A first group of memory cells of the block of memory cells is selected. At least one programming pulse is programmed into all memory cells of the first group. A threshold level is detected for each one of the memory cells of the first group only. The first group of memory cells is verified by comparing each one of the detected threshold levels with predefined target levels provided for each one of the first group of memory cells.

    摘要翻译: 提供了一种用于对非易失性存储器件的存储器单元的块进行编程的方法。 选择存储器单元块的第一组存储单元。 至少一个编程脉冲被编程到第一组的所有存储单元中。 仅针对第一组的每个存储器单元检测阈值电平。 通过将检测到的阈值水平中的每一个与为第一组存储器单元中的每一个提供的预定义的目标水平进行比较来验证第一组存储器单元。

    Nonvolatile semiconductor memory device and method for testing the same
    13.
    发明申请
    Nonvolatile semiconductor memory device and method for testing the same 审中-公开
    非易失性半导体存储器件及其测试方法

    公开(公告)号:US20070230261A1

    公开(公告)日:2007-10-04

    申请号:US11396928

    申请日:2006-04-04

    摘要: A nonvolatile semiconductor memory device includes transistor-based memory cells. Each memory cell has a first and a second source/drain region, a channel region separating the first and the second source/drain region, a storage layer and a control gate. The control gates of the memory cells are connected to word lines. The first and second source/drain regions are connected to bit lines respectively. Each memory cell may be programmed by injecting first charge carriers of a first polarity and may be erased by injecting second charge carriers having the opposite polarity into the storage layer respectively. By applying a high stress voltage between bit line and word line, weak insulator structures may break through such that they become detectable as short-circuits by a low voltage leakage test. By applying the stress voltage contemporaneously on both sides of the memory cells, an early overerase/overprogram, resulting from hot carrier injection, is avoided.

    摘要翻译: 非易失性半导体存储器件包括基于晶体管的存储单元。 每个存储单元具有第一和第二源极/漏极区域,分隔第一和第二源极/漏极区域的沟道区域,存储层和控制栅极。 存储单元的控制栅极连接到字线。 第一和第二源/漏区分别连接到位线。 可以通过注入第一极性的第一电荷载流子来对每个存储单元进行编程,并且可以通过将具有相反极性的第二电荷载体分别注入到存储层中来擦除。 通过在位线和字线之间施加高应力电压,弱绝缘体结构可能突破,使得它们通过低电压泄漏测试成为短路检测。 通过将应力电压同时施加在记忆细胞的两侧,避免了由热载体注入引起的早期过度/过度程序。

    Integrated circuit, and method for transferring data
    14.
    发明授权
    Integrated circuit, and method for transferring data 有权
    集成电路和数据传输方法

    公开(公告)号:US07903480B2

    公开(公告)日:2011-03-08

    申请号:US12023592

    申请日:2008-01-31

    IPC分类号: G11C7/10

    摘要: An integrated circuit and a method for transferring data is provided. One embodiment provides a method for transferring data in an integrated circuit. The method includes driving a first line in accordance with data to be transferred. The data is transmitted from the first line to a second line based on a capacitive coupling.

    摘要翻译: 提供了一种用于传送数据的集成电路和方法。 一个实施例提供了一种用于在集成电路中传送数据的方法。 该方法包括根据要传送的数据来驱动第一行。 基于电容耦合,数据从第一行传输到第二行。