公开(公告)号：US07439757B2

公开(公告)日：2008-10-21

申请号：US11442140

申请日：2006-05-30

申请人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

发明人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

IPC分类号： G01R31/00

CPC分类号： G09G3/006 ,  G02F1/1303 ,  G02F1/1309 ,  G09G3/3406

摘要： A liquid crystal display (LCD) inspection apparatus for inspecting an LCD panel, includes a worktable to support an LCD panel seated on a front side of the worktable, probe units to be electrically connected to the LCD panel, a backlight unit to emit light toward the LCD panel, a first polarizing plate arranged in front of the LCD panel to polarize the light, and a second polarizing plate arranged between the LCD panel and the backlight unit to polarize the light, and a shutter unit to selectively shut off the light emitted from the backlight unit toward the LCD panel.

摘要翻译： 一种用于检查LCD面板的液晶显示器（LCD）检查装置，包括：工作台，用于支撑安置在工作台前侧的LCD面板，与LCD面板电连接的探针单元;背光单元，用于朝向 LCD面板，布置在LCD面板的前方以使光偏振的第一偏振片和布置在LCD面板和背光单元之间以使光偏振的第二偏振片，以及快门单元，用于选择性地切断发出的光 从背光单元朝向LCD面板。

公开(公告)号：US08305542B2

公开(公告)日：2012-11-06

申请号：US13180287

申请日：2011-07-11

申请人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

发明人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

IPC分类号： G02F1/1345

CPC分类号： G02F1/1345 ,  G02F1/13458 ,  G02F2001/136254 ,  G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

摘要： A thin film transistor array substrate comprises thin film transistors and pixel electrodes formed at respective pixels that are defined by gate lines and data lines that orthogonally intersect each other. The thin film transistor array substrate further comprises a plurality of gate pad units that group a plurality of gate pads extended from the gate lines, and a plurality of data pad units that groups a plurality of data pads extended from the data lines. The thin film transistor array substrate further includes a plurality of gate test terminals connected to the gate pad units and beside at least one side of the respective gate pad units, and a plurality of data test terminals connected to the data pad units and located beside at least one side of the respective data pad units.

摘要翻译： 薄膜晶体管阵列基板包括薄膜晶体管和形成在各个像素处的像素电极，栅极线和彼此正交相交的数据线限定。 薄膜晶体管阵列基板还包括对从栅极线延伸的多个栅极焊盘进行分组的多个栅极焊盘单元，以及对从数据线延伸的多个数据焊盘进行分组的多个数据焊盘单元。 所述薄膜晶体管阵列基板还包括多个栅极测试端子，所述多个栅极测试端子连接到所述栅极焊盘单元并且位于各个栅极焊盘单元的至少一侧旁边，以及多个数据测试端子，所述多个数据测试端子连接到所述数据焊盘单元并位于 相应数据垫单元的最少一侧。

公开(公告)号：US07830484B2

公开(公告)日：2010-11-09

申请号：US11449783

申请日：2006-06-09

申请人： Soung Yeoul Eom ,  Dong Woo Kang ,  Bong Chul Kim ,  Ki Soub Yang

发明人： Soung Yeoul Eom ,  Dong Woo Kang ,  Bong Chul Kim ,  Ki Soub Yang

IPC分类号： G02F1/1343 ,  G02R31/00

CPC分类号： G02F1/136259 ,  G02F2203/69

摘要： A TFT substrate for inspection for shorts, includes a substrate defined by a display area and a non-display area outside the display area; a plurality of first and second lines formed in the display area on the substrate; pad lines formed to be extended from one side of each of the first lines to the non-display area; a plurality of signal inspection bars formed in the non-display area to cross the pad lines at one side of the pad lines; a shorting inspection bar spaced apart from the outermost signal inspection bar at a predetermined interval and substantially parallel with the signal inspection bar and connected to the pad lines; and a plurality of transparent electrode patterns partially overlapped with the pad lines and connected to one of the signal inspection bars.

摘要翻译： 用于检查短路的TFT基板包括由显示区域和显示区域外部的非显示区域限定的基板; 形成在所述基板上的所述显示区域中的多个第一和第二线; 衬垫线形成为从每个第一行的一侧延伸到非显示区域; 形成在所述非显示区域中的多个信号检查条，以跨越所述焊盘线的一侧的所述焊盘线; 一个与最外面的信号检查条隔开预定间隔并基本上与信号检查条平行并连接到焊盘线的短路检查条; 以及多个透明电极图案，其与所述焊盘线部分地重叠并且连接到所述信号检查条之一。

公开(公告)号：US07753567B2

公开(公告)日：2010-07-13

申请号：US11442219

申请日：2006-05-30

申请人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

发明人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

IPC分类号： B60Q1/06

CPC分类号： F21V29/30 ,  F21V29/59 ,  F21Y2115/10 ,  G02F1/1309 ,  G02F1/133603 ,  G02F2001/133628 ,  H05K7/20972

摘要： A backlight unit for a test device of an LCD panel is disclosed. The backlight unit includes: a chamber enclosing a predetermined space, the chamber being provided with a plurality of through holes formed around the chamber perimeter to allow air flow between the interior and exterior of the chamber; a backlight provided in the chamber to emit a light to an LCD panel positioned in the chamber; and a plurality of circulating fans provided in the chamber to circulate air inside the chamber.

摘要翻译： 公开了一种用于LCD面板的测试装置的背光单元。 所述背光单元包括：包围预定空间的室，所述室设置有围绕所述室周边形成的多个通孔，以允许空气在所述室的内部和外部之间流动; 设置在所述室中以向位于所述室中的LCD面板发光的背光; 以及设置在所述室中的多个循环风扇，以使所述室内的空气循环。

公开(公告)号：US20090290785A1

公开(公告)日：2009-11-26

申请号：US12536067

申请日：2009-08-05

申请人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

发明人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

IPC分类号： G06K9/00

CPC分类号： G02F1/1309

摘要： A liquid crystal display (LCD) inspection apparatus and method are provided. The inspection apparatus and method are capable of automatically and accurately detecting defects of an LCD panel, and providing information of the automatically-detected defects of the LCD panel to the operator, thereby enabling the operator to easily recognize the defects.

摘要翻译： 提供了一种液晶显示（LCD）检查装置和方法。 检查装置和方法能够自动且准确地检测LCD面板的缺陷，并且向操作者提供LCD面板的自动检测的缺陷的信息，从而使操作者能够容易地识别缺陷。

公开(公告)号：US07999901B2

公开(公告)日：2011-08-16

申请号：US11479860

申请日：2006-06-29

申请人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

发明人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

IPC分类号： G02F1/1345 ,  G09G3/36

CPC分类号： G02F1/1345 ,  G02F1/13458 ,  G02F2001/136254 ,  G09G3/006 ,  G09G3/3648 ,  G09G2300/0426

摘要： A thin film transistor array substrate comprises thin film transistors and pixel electrodes formed at respective pixels that are defined by gate lines and data lines that orthogonally intersect each other. The thin film transistor array substrate further comprises a plurality of gate pad units that group a plurality of gate pads extended from the gate lines, and a plurality of data pad units that groups a plurality of data pads extended from the data lines. The thin film transistor array substrate further includes a plurality of gate test terminals connected to the gate pad units and beside at least one side of the respective gate pad units, and a plurality of data test terminals connected to the data pad units and located beside at least one side of the respective data pad units.

摘要翻译： 薄膜晶体管阵列基板包括薄膜晶体管和形成在各个像素处的像素电极，栅极线和彼此正交相交的数据线限定。 薄膜晶体管阵列基板还包括对从栅极线延伸的多个栅极焊盘进行分组的多个栅极焊盘单元，以及对从数据线延伸的多个数据焊盘进行分组的多个数据焊盘单元。 所述薄膜晶体管阵列基板还包括多个栅极测试端子，所述多个栅极测试端子连接到所述栅极焊盘单元并且位于相应的栅极焊盘单元的至少一侧旁边，以及多个数据测试端子，连接到所述数据焊盘单元并位于 相应数据垫单元的最少一侧。

公开(公告)号：US20090146679A1

公开(公告)日：2009-06-11

申请号：US12318571

申请日：2008-12-31

申请人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

发明人： Dong Woo Kang ,  Soung Yeoul Eom ,  Bong Chul Kim ,  Ki Soub Yang

IPC分类号： G01R31/00

CPC分类号： G09G3/006 ,  G02F1/1309 ,  G09G3/3666 ,  G09G2300/0426

摘要： An LCD test method and apparatus for reducing the number of channels of a probe unit is provided. An apparatus for testing a liquid crystal display including: a stage on which a liquid crystal panel is placed; a plurality of vertically divided blocks, wherein each of the vertically divided blocks include a plurality of adjacent data lines; a data probe unit that provides test pattern signals respectively to groups of at least two of the plurality of vertically divided blocks of the liquid crystal panel; a plurality of horizontally divided blocks, wherein each of the horizontally divided blocks include a plurality of adjacent gate lines; a gate probe unit that provides scanning signals respectively to the plurality of horizontally divided blocks of the liquid crystal panel; and a controller that provides test pattern signals to the data probe unit and provides scanning signals to the gate probe unit.

摘要翻译： 提供了用于减少探针单元的通道数量的LCD测试方法和设备。 一种用于测试液晶显示器的装置，包括：放置液晶面板的阶段; 多个垂直分割块，其中每个垂直分割块包括多个相邻的数据线; 数据探测单元，分别向液晶面板的多个垂直分割块中的至少两个的组提供测试图形信号; 多个水平分割块，其中每个水平分割块包括多个相邻的栅极线; 栅极探针单元，其分别向液晶面板的多个水平分割块提供扫描信号; 以及控制器，其向所述数据探测单元提供测试图案信号，并向所述门探针单元提供扫描信号。

公开(公告)号：US07411410B2

公开(公告)日：2008-08-12

申请号：US11644959

申请日：2006-12-26

申请人： Dong Woo Kang ,  Soung Yeoul Eom ,  Ki Soub Yang

发明人： Dong Woo Kang ,  Soung Yeoul Eom ,  Ki Soub Yang

IPC分类号： G01R31/00 ,  G01R31/28

CPC分类号： G02F1/1309

摘要： An LCD test device and a test process thereof are disclosed, in which a defect of an LCD panel is exactly identified through exact electrical connection between an LCD panel and a probe unit. The LCD test device includes a work table on which an LCD panel is mounted, a clamping unit on the work table, clamping a top surface of an edge of the LCD panel mounted on the work table, a probe unit electrically connected with a pad of the LCD panel fixed to the work table by the clamping unit, and a back light unit supplying light to the LCD panel fixed to the work table. Accordingly, since the defect of the LCD panel can be tested exactly, reliability of the test is improved, and it is possible to prevent yield and the cost from being reduced in advance.

摘要翻译： 公开了一种LCD测试装置及其测试方法，其中通过LCD面板和探针单元之间的精确电连接精确地识别LCD面板的缺陷。 LCD测试装置包括安装有LCD面板的工作台，工作台上的夹紧单元，夹持安装在工作台上的LCD面板的边缘的顶面;探针单元，电连接到工作台 LCD面板由夹紧单元固定在工作台上，背光单元向固定在工作台上的LCD面板提供光。 因此，由于可以精确地测试LCD面板的缺陷，所以提高了测试的可靠性，并且可以预先防止产量和成本的降低。

公开(公告)号：US08048744B2

公开(公告)日：2011-11-01

申请号：US12626811

申请日：2009-11-27

申请人： Dong Woo Kang

发明人： Dong Woo Kang

IPC分类号： H01L21/8234

CPC分类号： H01L21/823462 ,  H01L21/823456

摘要： A semiconductor device and fabricating method thereof are disclosed. The method includes forming a polysilicon layer on a semiconductor substrate including a high-voltage area and a low-voltage area, partially etching the polysilicon layer in the low-voltage area, forming an anti-reflective layer on the polysilicon layer to reduce a step difference between the high-voltage and low-voltage areas, forming a photoresist pattern in the high-voltage and low-voltage areas, and forming a high-voltage gate and a low-voltage gate by etching the polysilicon layer using the photoresist pattern as an etch mask.

摘要翻译： 公开了一种半导体器件及其制造方法。 该方法包括在包括高电压区域和低电压区域的半导体衬底上形成多晶硅层，部分蚀刻低电压区域中的多晶硅层，在多晶硅层上形成抗反射层以减少步骤 高压区域和低电压区域之间的差异，在高电压和低电压区域中形成光致抗蚀剂图案，并且通过使用光致抗蚀剂图案蚀刻多晶硅层来形成高压栅极和低压栅极，作为 蚀刻掩模

公开(公告)号：US20100167458A1

公开(公告)日：2010-07-01

申请号：US12460005

申请日：2009-07-10

申请人： Yong Woo Shin ,  Woo-Hyun Kim ,  Dae Yup Na ,  Hyun Jun Cho ,  Dong Woo Kang ,  Doo Young Kim ,  Hyun Kyo Shin ,  Cheol Hoon Yang

发明人： Yong Woo Shin ,  Woo-Hyun Kim ,  Dae Yup Na ,  Hyun Jun Cho ,  Dong Woo Kang ,  Doo Young Kim ,  Hyun Kyo Shin ,  Cheol Hoon Yang

IPC分类号： H01L31/18

CPC分类号： H01L31/022425 ,  H01L31/046 ,  H01L31/0468 ,  Y02B10/10 ,  Y02E10/50

摘要： A thin film type solar cell and a method for manufacturing the same is disclosed, which is capable of providing a wide light-transmission area without lowering cell efficiency and increasing processing time, so that the solar cell can be used as a substitute for a glass window in a building. The thin film type solar cell generally comprises a substrate; a plurality of front electrodes at fixed intervals on the substrate; a plurality of semiconductor layers at fixed intervals with a contact portion or separating channel interposed in-between, the plurality of semiconductor layers on the plurality of front electrodes; and a plurality of rear electrodes at fixed intervals by the each separating channel interposed in-between, the each rear electrode being electrically connected with the each front electrode; wherein the each rear electrode is patterned in such a way that a light-transmitting portion is included in a predetermined portion of the rear electrode.

摘要翻译： 公开了一种薄膜型太阳能电池及其制造方法，其能够提供宽的透光面积而不降低电池效率和增加处理时间，使得太阳能电池可用作玻璃的替代品 窗户在建筑物。 薄膜型太阳能电池通常包括基板; 在所述基板上以固定间隔的多个前电极; 以固定间隔的多个半导体层，其中插入有位于其间的接触部分或分离通道，所述多个前电极上的多个半导体层; 以及通过插入其间的每个分离通道以固定间隔的多个后电极，每个后电极与每个前电极电连接; 其中每个后电极被图案化，使得在后电极的预定部分中包括光透射部分。