公开(公告)号：US07653170B2

公开(公告)日：2010-01-26

申请号：US11440481

申请日：2006-05-25

申请人： Heinz Mattes ,  Thomas Piorek ,  Sebastian Sattler ,  Olaf Stroeble

发明人： Heinz Mattes ,  Thomas Piorek ,  Sebastian Sattler ,  Olaf Stroeble

IPC分类号： G04F10/04

CPC分类号： G01R31/31922 ,  G01R31/31937 ,  G04F10/04 ,  G04F10/06

摘要： An electrical circuit used for measuring times is disclosed. In one embodiment, the electrical circuit has a counter, a decoder and a multiplicity of time trap elements. At least the counter and the time trap elements are located together on an integrated semiconductor component. Each time trap element has a data input, a clock input, a delay output and a output port. The time trap element contains a delay element and a flip flop. The delay element outputs a signal change at the data input with a time delay at the delay output. The flip flop has a data input, a clock input and an output port, the data inputs, the clock inputs and the output ports of the flip flop and of the time trap element being connected to one another. The time trap elements are connected as ring oscillator.

摘要翻译： 公开了一种用于测量时间的电路。 在一个实施例中，电路具有计数器，解码器和多个时间陷波元件。 至少计数器和时间陷阱元件一起位于集成半导体部件上。 每次陷阱元件都具有数据输入，时钟输入，延迟输出和输出端口。 时间陷阱元件包含延迟元件和触发器。 延迟元件在延迟输出端以时间延迟输出数据输入端的信号变化。 触发器具有数据输入，时钟输入和输出端口，触发器的数据输入，时钟输入和输出端口以及时间陷阱元件彼此连接。 时间陷阱元件连接为环形振荡器。

公开(公告)号：US07400995B2

公开(公告)日：2008-07-15

申请号：US10566461

申请日：2004-07-08

申请人： Heinz Mattes ,  Sebastian Sattler

发明人： Heinz Mattes ,  Sebastian Sattler

IPC分类号： G06F19/00

CPC分类号： G01R31/2839 ,  G01R35/005

摘要： A test device and method is disclosed. In one embodiment, the test device includes a precision signal generator for generating a test signal, which generator is connected via a respective connecting line to a respective input contact intended for connection to an input of an integrated circuit, and at least one reference signal generator for generating a reference signal. Furthermore, at least one comparator unit is provided for a respective input contact said comparator unit being able to be operated in a test mode. In the test mode, the test signal is compared with the reference signal. The precision signal generator is turned off by the comparator unit if the test signal exceeds or falls below the reference signal.

摘要翻译： 公开了一种测试装置和方法。 在一个实施例中，测试装置包括用于产生测试信号的精密信号发生器，该发生器经由相应的连接线连接到用于连接到集成电路的输入的相应输入触点，以及至少一个参考信号发生器 用于产生参考信号。 此外，为相应的输入触点提供至少一个比较器单元，所述比较器单元能够在测试模式下操作。 在测试模式下，将测试信号与参考信号进行比较。 如果测试信号超过或低于参考信号，则比较器单元关闭精密信号发生器。

公开(公告)号：US20070226602A1

公开(公告)日：2007-09-27

申请号：US11530257

申请日：2006-09-08

申请人： Stephane Kirmser ,  Heinz Mattes ,  Sebastian Sattler

发明人： Stephane Kirmser ,  Heinz Mattes ,  Sebastian Sattler

IPC分类号： G06F11/00

CPC分类号： G01R31/31711 ,  G01R25/00 ,  G01R31/31725

摘要： M periods of the test signal and of the reference signal are received. The periods of the test signal and of the reference signal are in each case Tsig long. The test signal is sampled with N sampled values at a sampling frequency fs=1/Ts. Also, N*Ts=M*Tsig, where N>M. The sampled values are numbered progressively by n, for which 0≦n ≦N−1. The sampled values have a defined relative phase shift with respect to the reference signal. The phase shift Tφ is calculated by ∑ i = 0 M - 1 ⁢   ⁢ Idx ⁡ ( i ) + K , K being a constant and Idx(i) corresponding to the number n which is either the first sampled value after a test signal zero crossing during the reference signal's ith period or the last sampled value before a test signal zero crossing during the reference signal's ith period. Either only rising or only falling zero crossings are taken into account.

摘要翻译： 接收测试信号和参考信号的M个周期。 在每种情况下，测试信号和参考信号的周期都是长的。 测试信号以采样频率f N 1 = 1 / T S N的采样值采样。 此外，N * T S = M * T S，其中N> M。 采样值逐渐被n编号，0 <= n <= N-1。 采样值相对于参考信号具有限定的相对相移。 相位偏移T 由