公开(公告)号：US20130015870A1

公开(公告)日：2013-01-17

申请号：US13183393

申请日：2011-07-14

申请人： Joshua G. Nickel ,  Mattia Pascolini ,  Adil Syed

发明人： Joshua G. Nickel ,  Mattia Pascolini ,  Adil Syed

IPC分类号： G01R31/20

CPC分类号： G01R1/06772 ,  G01R31/2822

摘要： Electronic device structures such as structures containing antennas, cables, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a test system to perform conducted testing. The test system may include a vector network analyzer or other test unit that generates radio-frequency test signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using a contact test probe that has at least signal and ground pins. The test probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.

摘要翻译： 可以使用测试系统对包含天线，电缆，连接器，焊接，电子设备部件，导电壳体结构和其他结构的结构的电子设备结构进行故障测试，以执行进行的测试。 测试系统可以包括矢量网络分析器或其它测试单元，其在一个频率范围内产生射频测试信号。 射频测试信号可以使用至少具有信号和接地引脚的接触测试探头传输到被测电子设备结构。 测试探头可以接收相应的射频信号。 可以分析发送和接收的射频测试信号以确定被测电子设备结构是否包含故障。

公开(公告)号：US20120262188A1

公开(公告)日：2012-10-18

申请号：US13086670

申请日：2011-04-14

申请人： Joshua G. Nickel ,  Robert W. Schlub

发明人： Joshua G. Nickel ,  Robert W. Schlub

IPC分类号： G01R27/04

CPC分类号： G01R1/06772 ,  G01R31/2822 ,  H04B17/20

摘要： Wireless electronic devices include wireless communications circuitry such as transceiver circuitry coupled to an antenna resonating element. The transceiver circuitry and the antenna element may be formed on first and second substrates, respectively. In compact wireless devices, transceiver and antenna matching circuits may be formed on the first substrate. During production testing, a radio-frequency test probe with integrated matching circuitry may be used to mate with a corresponding contact point on the first substrate. The integrated matching circuitry may include resistors, capacitors, and inductors soldered in desired series-parallel configurations within the test probe. When the test probe is mated to the contact point on the first substrate, a test unit connected to the test probe may be used to perform radio-frequency measurements to determine whether the transceiver circuitry satisfies design criteria.

摘要翻译： 无线电子设备包括诸如耦合到天线谐振元件的收发器电路之类的无线通信电路。 收发器电路和天线元件可以分别形成在第一和第二基板上。 在紧凑型无线设备中，可以在第一基板上形成收发器和天线匹配电路。 在生产测试期间，可以使用具有集成匹配电路的射频测试探针与第一基板上的相应接触点相配合。 集成匹配电路可以包括在测试探针内以期望的串并联配置焊接的电阻器，电容器和电感器。 当测试探针与第一衬底上的接触点配合时，连接到测试探针的测试单元可用于执行射频测量，以确定收发器电路是否满足设计标准。

公开(公告)号：US20120139571A1

公开(公告)日：2012-06-07

申请号：US12959350

申请日：2010-12-02

申请人： Joshua G. Nickel ,  Robert W. Mayor ,  Glenn D. MacGougan ,  William J. Noellert ,  Joseph Hakim

发明人： Joshua G. Nickel ,  Robert W. Mayor ,  Glenn D. MacGougan ,  William J. Noellert ,  Joseph Hakim

IPC分类号： G01R31/00

CPC分类号： G01R29/0821 ,  H04W24/08

摘要： A portable test chamber with an open top may serve as a field testing apparatus for wireless testing of electronic devices. A wireless device under test may be mounted within a cavity in the test chamber. The cavity may be surrounded by a dielectric lining of anechoic material. A layer of electromagnetic shielding such as metal foil may cover the outer surfaces of the dielectric lining. The chamber may have a box shape with a rectangular opening at its top. Satellite navigation system signals or other wireless signals may be received through the opening at the top of the test chamber during testing. The electromagnetic shielding may reduce the effects of multipath interference during field tests.

摘要翻译： 具有开口顶部的便携式测试室可用作电子设备的无线测试的现场测试装置。 被测试的无线设备可以安装在测试室中的空腔内。 空腔可以被消声材料的电介质衬里包围。 诸如金属箔的电磁屏蔽层可以覆盖电介质衬里的外表面。 该室可以具有在其顶部具有矩形开口的盒形。 卫星导航系统信号或其他无线信号可以在测试期间通过测试室顶部的开口接收。 电磁屏蔽可以减少现场测试时多径干扰的影响。

公开(公告)号：US09319908B2

公开(公告)日：2016-04-19

申请号：US13272067

申请日：2011-10-12

申请人： Joshua G. Nickel ,  Mattia Pascolini ,  Jr-Yi Shen

发明人： Joshua G. Nickel ,  Mattia Pascolini ,  Jr-Yi Shen

IPC分类号： H04W24/06 ,  G01R29/10

CPC分类号： H04W24/06 ,  G01R29/10

摘要： A test station may include a test host, a test unit, and a test enclosure. A device under test (DUT) having at least first and second antennas may be placed in the test enclosure during production testing. Radio-frequency test signals may be conveyed from the test unit to the DUT using a test antenna in the test enclosure. In a first time period during which the performance of the first antenna is being tested, the DUT may be oriented in a first position such that path loss between the first antenna and the test antenna is minimized. In a second time period during which the performance of the second antenna is being tested, the DUT may be oriented in a second position such that path loss between the second antenna and the test antenna is minimized. The DUT is marked as a passing DUT if gathered test data is satisfactory.

摘要翻译： 测试台可以包括测试主机，测试单元和测试机箱。 具有至少第一和第二天线的被测设备（DUT）可以在生产测试期间被放置在测试外壳中。 射频测试信号可以使用测试机箱中的测试天线从测试单元传送到DUT。 在测试第一天线的性能的第一时间段期间，DUT可以被定向在第一位置，使得第一天线和测试天线之间的路径损耗最小化。 在测试第二天线的性能的第二时间段期间，DUT可以定位在第二位置，使得第二天线和测试天线之间的路径损耗最小化。 如果收集的测试数据令人满意，DUT被标记为通过的DUT。

公开(公告)号：US09285419B2

公开(公告)日：2016-03-15

申请号：US13173387

申请日：2011-06-30

申请人： Joshua G. Nickel ,  Jr-Yi Shen

发明人： Joshua G. Nickel ,  Jr-Yi Shen

IPC分类号： G01R31/00 ,  G01R31/28 ,  H04B17/00 ,  G01R29/10 ,  G01R31/302

CPC分类号： G01R31/2891 ,  G01R29/10 ,  G01R31/3025

摘要： Electronic devices may be tested using a test station with a test fixture. The test fixture may include a first holding structure in which a device under test may be placed and a second holding structure for supporting test probes. The second holding structure may be mated with a test probe alignment structure during test station setup operations. The test probe alignment structure may include registration features configured to set the relative position of the first and second holding structures to a known configuration and may include test probe alignment features that can be used to correctly position the placement of the test probes. If at least one of the test probes is not sufficiently aligned to its corresponding alignment feature, the test probe alignment structures will not be able to engage properly with the second holding structure, and the position of the problematic test probe may be adjusted accordingly.

摘要翻译： 可以使用具有测试夹具的测试台来测试电子设备。 测试夹具可以包括其中可以放置被测器件的第一保持结构和用于支撑测试探针的第二保持结构。 在测试台设置操作期间，第二保持结构可以与测试探针对准结构配合。 测试探针对准结构可以包括配置特征，其配置为将第一和第二保持结构的相对位置设置为已知构造，并且可以包括可用于正确定位测试探针的放置的测试探针对准特征。 如果至少一个测试探针不能与其对应的对准特征充分对齐，则测试探针对准结构将不能与第二保持结构适当地接合，并且可以相应地调整有问题的测试探针的位置。

公开(公告)号：US09274142B2

公开(公告)日：2016-03-01

申请号：US13097847

申请日：2011-04-29

申请人： Joshua G. Nickel ,  Jr-Yi Shen

发明人： Joshua G. Nickel ,  Jr-Yi Shen

IPC分类号： G01R31/20 ,  G01R1/07 ,  G01R31/312

CPC分类号： G01R1/07 ,  G01R31/312

摘要： Conductive electronic device structures such as a conductive housing member that forms part of an antenna may be tested during manufacturing. A test system may be provided that has a capacitive coupling probe. The probe may have electrodes. The electrodes may be formed from patterned metal structures in a dielectric substrate. A test unit may provide radio-frequency test signals in a range of frequencies. The radio-frequency test signals may be applied to the conductive housing member or other conductive structures under test using the electrodes. Complex impedance data, forward transfer coefficient data, or other data may be used to determine whether the structures are faulty. A fixture may be used to hold the capacitive coupling probe in place against the conductive electronic device structures during testing.

摘要翻译： 可以在制造期间测试形成天线的一部分的诸如导电壳体构件的导电电子器件结构。 可以提供具有电容耦合探针的测试系统。 探头可以具有电极。 电极可以由介电衬底中的图案化金属结构形成。 测试单元可以在一定频率范围内提供射频测试信号。 可以使用电极将射频测试信号施加到导电壳体构件或其他待测导体结构。 可以使用复阻抗数据，前向传输系数数据或其他数据来确定结构是否有故障。 在测试期间，固定装置可用于将电容耦合探针固定在导电电子器件结构上。

公开(公告)号：US08798554B2

公开(公告)日：2014-08-05

申请号：US13368855

申请日：2012-02-08

申请人： Dean F. Darnell ,  Yuehui Ouyang ,  Hao Xu ,  Enrique Ayala Vazquez ,  Yijun Zhou ,  Peter Bevelacqua ,  Joshua G. Nickel ,  Nanbo Jin ,  Matthew A. Mow ,  Robert W. Schlub ,  Mattia Pascolini ,  Hongfei Hu

发明人： Dean F. Darnell ,  Yuehui Ouyang ,  Hao Xu ,  Enrique Ayala Vazquez ,  Yijun Zhou ,  Peter Bevelacqua ,  Joshua G. Nickel ,  Nanbo Jin ,  Matthew A. Mow ,  Robert W. Schlub ,  Mattia Pascolini ,  Hongfei Hu

IPC分类号： H04B1/40

CPC分类号： H01Q1/243 ,  H01Q5/35

摘要： Electronic devices may be provided that contain wireless communications circuitry. The wireless communications circuitry may include radio-frequency transceiver circuitry and antenna structures. The antenna structures may form an antenna having first and second feeds at different locations. The transceiver circuit may have a first circuit that handles communications using the first feed and may have a second circuit that handles communications using the second feed. A first filter may be interposed between the first feed and the first circuit and a second filter may be interposed between the second feed and the second circuit. The first and second filters and the antenna may be configured so that the first circuit can use the first feed without being adversely affected by the presence of the second feed and so that the second circuit can use the second feed without being adversely affected by the presence of the first feed.

摘要翻译： 可以提供包含无线通信电路的电子设备。 无线通信电路可以包括射频收发器电路和天线结构。 天线结构可以形成在不同位置具有第一和第二馈送的天线。 收发器电路可以具有处理使用第一馈送的通信的第一电路，并且可以具有处理使用第二馈送的通信的第二电路。 第一过滤器可以插入在第一进料和第一回路之间，并且第二过滤器可以介于第二进料和第二回路之间。 第一和第二滤波器和天线可以被配置成使得第一电路可以使用第一馈电而不受第二馈电的存在的不利影响，并且使得第二电路可以使用第二馈电而不受存在的不利影响 的第一个饲料。

公开(公告)号：US20130271328A1

公开(公告)日：2013-10-17

申请号：US13448180

申请日：2012-04-16

申请人： Joshua G. Nickel ,  Jr-Yi Shen ,  William J. Noellert

发明人： Joshua G. Nickel ,  Jr-Yi Shen ,  William J. Noellert

IPC分类号： G01R29/08

CPC分类号： G01R29/10

摘要： A radio-frequency test system configured for testing device structures under test is provided. The test system may include a radio-frequency tester, a test probe that is coupled to the tester, and an auxiliary test fixture that receives the device structures under test. During testing, the device structures under test may be mounted on the auxiliary test fixture. The auxiliary test fixture may provide a ground contact point and a ground reference plane. The device structures under test may include a radio-frequency circuit coupled to a conductive member via a signal path. During testing, the test probe may mate with the conductive member on the device structures under test and the ground contact point on the auxiliary test fixture. The ground reference plane in the auxiliary test fixture may serve to provide proper grounding for the signal path to help improve the accuracy of test results associated with the radio-frequency circuit.

摘要翻译： 提供了一种配置用于测试被测设备结构的射频测试系统。 测试系统可以包括射频测试器，耦合到测试器的测试探针和接收被测器件结构的辅助测试夹具。 在测试期间，被测设备结构可以安装在辅助测试夹具上。 辅助测试夹具可以提供接地点和接地参考平面。 所测试的器件结构可以包括经由信号路径耦合到导电部件的射频电路。 在测试期间，测试探针可以与被测设备结构上的导电部件和辅助测试夹具上的接地点相配合。 辅助测试夹具中的接地参考平面可用于为信号路径提供适当的接地，以帮助提高与射频电路相关的测试结果的准确性。

公开(公告)号：US20130093447A1

公开(公告)日：2013-04-18

申请号：US13272067

申请日：2011-10-12

申请人： Joshua G. Nickel ,  Mattia Pascolini ,  Jr-Yi Shen

发明人： Joshua G. Nickel ,  Mattia Pascolini ,  Jr-Yi Shen

IPC分类号： G01R31/00

CPC分类号： H04W24/06 ,  G01R29/10

摘要： A test station may include a test host, a test unit, and a test enclosure. A device under test (DUT) having at least first and second antennas may be placed in the test enclosure during production testing. Radio-frequency test signals may be conveyed from the test unit to the DUT using a test antenna in the test enclosure. In a first time period during which the performance of the first antenna is being tested, the DUT may be oriented in a first position such that path loss between the first antenna and the test antenna is minimized. In a second time period during which the performance of the second antenna is being tested, the DUT may be oriented in a second position such that path loss between the second antenna and the test antenna is minimized. The DUT is marked as a passing DUT if gathered test data is satisfactory.

摘要翻译： 测试台可以包括测试主机，测试单元和测试机箱。 具有至少第一和第二天线的被测设备（DUT）可以在生产测试期间被放置在测试外壳中。 射频测试信号可以使用测试机箱中的测试天线从测试单元传送到DUT。 在测试第一天线的性能的第一时间段期间，DUT可以被定向在第一位置，使得第一天线和测试天线之间的路径损耗最小化。 在测试第二天线的性能的第二时间段期间，DUT可以定位在第二位置，使得第二天线和测试天线之间的路径损耗最小化。 如果收集的测试数据令人满意，DUT被标记为通过的DUT。

公开(公告)号：US20130050046A1

公开(公告)日：2013-02-28

申请号：US13223102

申请日：2011-08-31

申请人： Daniel W. Jarvis ,  Mattia Pascolini ,  Joshua G. Nickel

发明人： Daniel W. Jarvis ,  Mattia Pascolini ,  Joshua G. Nickel

IPC分类号： H01Q1/50 ,  G01R31/28

CPC分类号： H01Q9/0421 ,  H01Q1/243 ,  H01Q9/145 ,  Y10T29/49004

摘要： Custom antenna structures may be used to compensate for manufacturing variations in electronic device antennas. An antenna may have an antenna feed and conductive structures such as portions of a peripheral conductive electronic device housing member. The custom antenna structures compensate for manufacturing variations that could potentially lead to undesired variations in antenna performance. The custom antenna structures may make customized alterations to antenna feed structures or conductive paths within an antenna. An antenna may be formed from a conductive housing member that surrounds an electronic device. The custom antenna structures may be formed from a printed circuit board with a customizable trace. The customizable trace may have a contact pad portion on the printed circuit board. The customizable trace may be customized to connect the pad to a desired one of a plurality of contacts associated with the conductive housing member to form a customized antenna feed terminal.

摘要翻译： 定制天线结构可用于补偿电子设备天线的制造变化。 天线可以具有天线馈电和导电结构，例如外围导电电子器件壳体部件的部分。 定制天线结构补偿可能导致天线性能不期望的变化的制造变化。 定制的天线结构可以对天线馈送结构或天线内的导电路径进行定制的改变。 天线可以由围绕电子设备的导电外壳构件形成。 定制天线结构可以由具有可定制轨迹的印刷电路板形成。 可定制的迹线可以在印刷电路板上具有接触焊盘部分。 可定制的迹线可以被定制以将焊盘连接到与导电外壳构件相关联的多个触点中期望的一个触点，以形成定制的天线馈电端子。