-
公开(公告)号：US20130050046A1
公开(公告)日：2013-02-28
申请号：US13223102
申请日：2011-08-31
CPC分类号： H01Q9/0421 , H01Q1/243 , H01Q9/145 , Y10T29/49004
摘要： Custom antenna structures may be used to compensate for manufacturing variations in electronic device antennas. An antenna may have an antenna feed and conductive structures such as portions of a peripheral conductive electronic device housing member. The custom antenna structures compensate for manufacturing variations that could potentially lead to undesired variations in antenna performance. The custom antenna structures may make customized alterations to antenna feed structures or conductive paths within an antenna. An antenna may be formed from a conductive housing member that surrounds an electronic device. The custom antenna structures may be formed from a printed circuit board with a customizable trace. The customizable trace may have a contact pad portion on the printed circuit board. The customizable trace may be customized to connect the pad to a desired one of a plurality of contacts associated with the conductive housing member to form a customized antenna feed terminal.
摘要翻译： 定制天线结构可用于补偿电子设备天线的制造变化。 天线可以具有天线馈电和导电结构，例如外围导电电子器件壳体部件的部分。 定制天线结构补偿可能导致天线性能不期望的变化的制造变化。 定制的天线结构可以对天线馈送结构或天线内的导电路径进行定制的改变。 天线可以由围绕电子设备的导电外壳构件形成。 定制天线结构可以由具有可定制轨迹的印刷电路板形成。 可定制的迹线可以在印刷电路板上具有接触焊盘部分。 可定制的迹线可以被定制以将焊盘连接到与导电外壳构件相关联的多个触点中期望的一个触点，以形成定制的天线馈电端子。
-
公开(公告)号：US09287627B2
公开(公告)日：2016-03-15
申请号：US13223102
申请日：2011-08-31
CPC分类号： H01Q9/0421 , H01Q1/243 , H01Q9/145 , Y10T29/49004
摘要： Custom antenna structures may be used to compensate for manufacturing variations in electronic device antennas. An antenna may have an antenna feed and conductive structures such as portions of a peripheral conductive electronic device housing member. The custom antenna structures compensate for manufacturing variations that could potentially lead to undesired variations in antenna performance. The custom antenna structures may make customized alterations to antenna feed structures or conductive paths within an antenna. An antenna may be formed from a conductive housing member that surrounds an electronic device. The custom antenna structures may be formed from a printed circuit board with a customizable trace. The customizable trace may have a contact pad portion on the printed circuit board. The customizable trace may be customized to connect the pad to a desired one of a plurality of contacts associated with the conductive housing member to form a customized antenna feed terminal.
摘要翻译： 定制天线结构可用于补偿电子设备天线的制造变化。 天线可以具有天线馈电和导电结构，例如外围导电电子器件壳体部件的部分。 定制天线结构补偿可能导致天线性能不期望的变化的制造变化。 定制的天线结构可以对天线馈送结构或天线内的导电路径进行定制的改变。 天线可以由围绕电子设备的导电外壳构件形成。 定制天线结构可以由具有可定制轨迹的印刷电路板形成。 可定制的迹线可以在印刷电路板上具有接触焊盘部分。 可定制的迹线可以被定制以将焊盘连接到与导电外壳构件相关联的多个触点中期望的一个触点，以形成定制的天线馈电端子。
-
公开(公告)号：US20130015870A1
公开(公告)日：2013-01-17
申请号：US13183393
申请日：2011-07-14
申请人： Joshua G. Nickel , Mattia Pascolini , Adil Syed
发明人： Joshua G. Nickel , Mattia Pascolini , Adil Syed
IPC分类号： G01R31/20
CPC分类号： G01R1/06772 , G01R31/2822
摘要： Electronic device structures such as structures containing antennas, cables, connectors, welds, electronic device components, conductive housing structures, and other structures can be tested for faults using a test system to perform conducted testing. The test system may include a vector network analyzer or other test unit that generates radio-frequency test signals in a range of frequencies. The radio-frequency test signals may be transmitted to electronic device structures under test using a contact test probe that has at least signal and ground pins. The test probe may receive corresponding radio-frequency signals. The transmitted and received radio-frequency test signals may be analyzed to determine whether the electronic device structures under test contain a fault.
摘要翻译： 可以使用测试系统对包含天线，电缆，连接器，焊接，电子设备部件，导电壳体结构和其他结构的结构的电子设备结构进行故障测试，以执行进行的测试。 测试系统可以包括矢量网络分析器或其它测试单元，其在一个频率范围内产生射频测试信号。 射频测试信号可以使用至少具有信号和接地引脚的接触测试探头传输到被测电子设备结构。 测试探头可以接收相应的射频信号。 可以分析发送和接收的射频测试信号以确定被测电子设备结构是否包含故障。
-
4.发明授权Methods for reducing path loss while testing wireless electronic devices with multiple antennas 有权在测试具有多个天线的无线电子设备的同时降低路径损耗的方法公开(公告)号：US09319908B2
公开(公告)日：2016-04-19
申请号：US13272067
申请日：2011-10-12
申请人： Joshua G. Nickel , Mattia Pascolini , Jr-Yi Shen
发明人： Joshua G. Nickel , Mattia Pascolini , Jr-Yi Shen
摘要： A test station may include a test host, a test unit, and a test enclosure. A device under test (DUT) having at least first and second antennas may be placed in the test enclosure during production testing. Radio-frequency test signals may be conveyed from the test unit to the DUT using a test antenna in the test enclosure. In a first time period during which the performance of the first antenna is being tested, the DUT may be oriented in a first position such that path loss between the first antenna and the test antenna is minimized. In a second time period during which the performance of the second antenna is being tested, the DUT may be oriented in a second position such that path loss between the second antenna and the test antenna is minimized. The DUT is marked as a passing DUT if gathered test data is satisfactory.
摘要翻译： 测试台可以包括测试主机，测试单元和测试机箱。 具有至少第一和第二天线的被测设备（DUT）可以在生产测试期间被放置在测试外壳中。 射频测试信号可以使用测试机箱中的测试天线从测试单元传送到DUT。 在测试第一天线的性能的第一时间段期间，DUT可以被定向在第一位置，使得第一天线和测试天线之间的路径损耗最小化。 在测试第二天线的性能的第二时间段期间，DUT可以定位在第二位置，使得第二天线和测试天线之间的路径损耗最小化。 如果收集的测试数据令人满意，DUT被标记为通过的DUT。
-
公开(公告)号：US08798554B2
公开(公告)日：2014-08-05
申请号：US13368855
申请日：2012-02-08
申请人： Dean F. Darnell , Yuehui Ouyang , Hao Xu , Enrique Ayala Vazquez , Yijun Zhou , Peter Bevelacqua , Joshua G. Nickel , Nanbo Jin , Matthew A. Mow , Robert W. Schlub , Mattia Pascolini , Hongfei Hu
发明人： Dean F. Darnell , Yuehui Ouyang , Hao Xu , Enrique Ayala Vazquez , Yijun Zhou , Peter Bevelacqua , Joshua G. Nickel , Nanbo Jin , Matthew A. Mow , Robert W. Schlub , Mattia Pascolini , Hongfei Hu
IPC分类号： H04B1/40
摘要： Electronic devices may be provided that contain wireless communications circuitry. The wireless communications circuitry may include radio-frequency transceiver circuitry and antenna structures. The antenna structures may form an antenna having first and second feeds at different locations. The transceiver circuit may have a first circuit that handles communications using the first feed and may have a second circuit that handles communications using the second feed. A first filter may be interposed between the first feed and the first circuit and a second filter may be interposed between the second feed and the second circuit. The first and second filters and the antenna may be configured so that the first circuit can use the first feed without being adversely affected by the presence of the second feed and so that the second circuit can use the second feed without being adversely affected by the presence of the first feed.
摘要翻译： 可以提供包含无线通信电路的电子设备。 无线通信电路可以包括射频收发器电路和天线结构。 天线结构可以形成在不同位置具有第一和第二馈送的天线。 收发器电路可以具有处理使用第一馈送的通信的第一电路，并且可以具有处理使用第二馈送的通信的第二电路。 第一过滤器可以插入在第一进料和第一回路之间，并且第二过滤器可以介于第二进料和第二回路之间。 第一和第二滤波器和天线可以被配置成使得第一电路可以使用第一馈电而不受第二馈电的存在的不利影响，并且使得第二电路可以使用第二馈电而不受存在的不利影响 的第一个饲料。
-
6.发明申请Methods for Reducing Path Loss While Testing Wireless Electronic Devices with Multiple Antennas 有权使用多个天线测试无线电子设备时减少路径损耗的方法公开(公告)号：US20130093447A1
公开(公告)日：2013-04-18
申请号：US13272067
申请日：2011-10-12
申请人： Joshua G. Nickel , Mattia Pascolini , Jr-Yi Shen
发明人： Joshua G. Nickel , Mattia Pascolini , Jr-Yi Shen
IPC分类号： G01R31/00
摘要： A test station may include a test host, a test unit, and a test enclosure. A device under test (DUT) having at least first and second antennas may be placed in the test enclosure during production testing. Radio-frequency test signals may be conveyed from the test unit to the DUT using a test antenna in the test enclosure. In a first time period during which the performance of the first antenna is being tested, the DUT may be oriented in a first position such that path loss between the first antenna and the test antenna is minimized. In a second time period during which the performance of the second antenna is being tested, the DUT may be oriented in a second position such that path loss between the second antenna and the test antenna is minimized. The DUT is marked as a passing DUT if gathered test data is satisfactory.
摘要翻译： 测试台可以包括测试主机，测试单元和测试机箱。 具有至少第一和第二天线的被测设备（DUT）可以在生产测试期间被放置在测试外壳中。 射频测试信号可以使用测试机箱中的测试天线从测试单元传送到DUT。 在测试第一天线的性能的第一时间段期间，DUT可以被定向在第一位置，使得第一天线和测试天线之间的路径损耗最小化。 在测试第二天线的性能的第二时间段期间，DUT可以定位在第二位置，使得第二天线和测试天线之间的路径损耗最小化。 如果收集的测试数据令人满意，DUT被标记为通过的DUT。
-
公开(公告)号：US09270012B2
公开(公告)日：2016-02-23
申请号：US13363743
申请日：2012-02-01
申请人： Joshua G. Nickel , Mattia Pascolini
发明人： Joshua G. Nickel , Mattia Pascolini
摘要： An electronic device may have tunable antenna structures. A tunable antenna may have an antenna resonating element and an antenna ground. An adjustable electronic component such as an adjustable capacitor, adjustable inductor, or adjustable phase-shift element may be used in tuning the antenna. An impedance matching circuit may be coupled between the tunable antenna and a radio-frequency transceiver. The adjustable electronic component may be coupled to the antenna resonating element or other structures in the antenna or may form part of the impedance matching circuit, a transmission line, a parasitic antenna element, or other antenna structures. During manufacturing, manufacturing variations may cause the performance of the tunable antenna to deviate from desired specifications. Calibration operations may be performed to identify compensating adjustments to be made with the adjustable electronic component. Calibration data for the adjustable component may be stored in control circuitry in the electronic device.
摘要翻译： 电子设备可以具有可调谐的天线结构。 可调谐天线可以具有天线谐振元件和天线接地。 可调电子部件，例如可调电容器，可调电感器或可调相移元件可用于调谐天线。 阻抗匹配电路可以耦合在可调谐天线和射频收发器之间。 可调电子部件可以耦合到天线谐振元件或天线中的其他结构，或者可以形成阻抗匹配电路，传输线，寄生天线元件或其他天线结构的一部分。 在制造过程中，制造变化可能导致可调谐天线的性能偏离所需规格。 可以执行校准操作以识别要用可调电子部件进行的补偿调整。 可调组件的校准数据可以存储在电子设备中的控制电路中。
-
公开(公告)号：US08947113B2
公开(公告)日：2015-02-03
申请号：US13466017
申请日：2012-05-07
申请人： Liang Han , Jayesh Nath , Matthew A. Mow , Peter Bevelacqua , Joshua G. Nickel , Mattia Pascolini , Robert W. Schlub , Ruben Caballero
发明人： Liang Han , Jayesh Nath , Matthew A. Mow , Peter Bevelacqua , Joshua G. Nickel , Mattia Pascolini , Robert W. Schlub , Ruben Caballero
IPC分类号： G01R31/00
CPC分类号： G01R1/045 , G01R31/2822 , G01R35/005
摘要： A test system for characterizing an antenna tuning element is provided. The test system may include a test host, a radio-frequency tester, and a test fixture. The test system may calibrate the radio-frequency tester using known coaxial standards. The test system may then calibrate transmission line effects associated with the test fixture using a THRU-REFLECT-LINE calibration algorithm. The antenna tuning element may be mounted on a test socket that is part of the test fixture. While the antenna tuning element is mounted on the test socket, scattering parameter measurements may be obtained using the radio-frequency tester. An equivalent circuit model for the test socket can be obtained based on the measured scattering parameters and known characteristics of the antenna tuning element. Once the test socket has been characterized, an equivalent circuit model for the antenna tuning element can be obtained by extracting suitable modeling parameters from the measured scattering parameters.
摘要翻译： 提供了一种用于表征天线调谐元件的测试系统。 测试系统可以包括测试主机，射频测试仪和测试夹具。 测试系统可以使用已知的同轴标准校准射频测试仪。 然后，测试系统可以使用THRU-REFLECT-LINE校准算法来校准与测试夹具相关联的传输线效应。 天线调谐元件可以安装在作为测试夹具的一部分的测试插座上。 当天线调谐元件安装在测试插座上时，可以使用射频测试仪获得散射参数测量值。 基于测量的散射参数和天线调谐元件的已知特性，可以获得用于测试插座的等效电路模型。 一旦测试插座被表征，可以通过从测量的散射参数中提取合适的建模参数来获得天线调谐元件的等效电路模型。
-
公开(公告)号：US20130194139A1
公开(公告)日：2013-08-01
申请号：US13363743
申请日：2012-02-01
申请人： Joshua G. Nickel , Mattia Pascolini
发明人： Joshua G. Nickel , Mattia Pascolini
摘要： An electronic device may have tunable antenna structures. A tunable antenna may have an antenna resonating element and an antenna ground. An adjustable electronic component such as an adjustable capacitor, adjustable inductor, or adjustable phase-shift element may be used in tuning the antenna. An impedance matching circuit may be coupled between the tunable antenna and a radio-frequency transceiver. The adjustable electronic component may be coupled to the antenna resonating element or other structures in the antenna or may form part of the impedance matching circuit, a transmission line, a parasitic antenna element, or other antenna structures. During manufacturing, manufacturing variations may cause the performance of the tunable antenna to deviate from desired specifications. Calibration operations may be performed to identify compensating adjustments to be made with the adjustable electronic component. Calibration data for the adjustable component may be stored in control circuitry in the electronic device.
摘要翻译： 电子设备可以具有可调谐的天线结构。 可调谐天线可以具有天线谐振元件和天线接地。 可调电子部件，例如可调电容器，可调电感器或可调相移元件可用于调谐天线。 阻抗匹配电路可以耦合在可调谐天线和射频收发器之间。 可调电子部件可以耦合到天线谐振元件或天线中的其他结构，或者可以形成阻抗匹配电路，传输线，寄生天线元件或其他天线结构的一部分。 在制造过程中，制造变化可能导致可调谐天线的性能偏离所需规格。 可以执行校准操作以识别要用可调电子部件进行的补偿调整。 可调组件的校准数据可以存储在电子设备中的控制电路中。
-
公开(公告)号：US20110282593A1
公开(公告)日：2011-11-17
申请号：US12869617
申请日：2010-08-26
申请人： Joshua G. Nickel , Ruben Caballero , Jason Flickinger , Scott A. Myers , Mattia Pascolini , Robert W. Schlub , Trent Weber
发明人： Joshua G. Nickel , Ruben Caballero , Jason Flickinger , Scott A. Myers , Mattia Pascolini , Robert W. Schlub , Trent Weber
CPC分类号： G01R31/04
摘要： A method of manufacture for a portable computing device is described. In particular, methods and apparatus for assessing a quality of weld joints used to connect one or more components of the portable computing device are described. The weld joints can include one or more weld points. At a weld check station, using a vector network analyzer, a test signal generated can be passed through the weld joint and a response signal can be measured. The measured characteristics can be used to assess a quality of the weld joint. In one embodiment, the vector network analyzer can be used to generate a number of high frequency test signals that are passed through the weld to perform a time domain reflectometry measurement where the weld joint can be accepted or rejected based upon the measurement.
摘要翻译： 描述了便携式计算设备的制造方法。 特别地，描述了用于评估用于连接便携式计算设备的一个或多个部件的焊接接头的质量的方法和设备。 焊缝可以包括一个或多个焊接点。 在焊接检查站，使用矢量网络分析仪，产生的测试信号可以通过焊接接头，并且可以测量响应信号。 测量的特性可用于评估焊缝的质量。 在一个实施例中，矢量网络分析器可以用于产生通过焊缝的多个高频测试信号，以执行时域反射测量，其中基于测量能够接受或拒绝焊接接头。
-
-
-
-
-
-
-
-
-
搜索结果
82 条记录 (耗时 0.023 秒)