公开(公告)号：US20170122940A1

公开(公告)日：2017-05-04

申请号：US15320118

申请日：2015-06-01

Applicant: Konica Minolta, Inc.

Inventor： Tomonori KANEKO ,  Takatoshi KAYA

IPC: G01N33/543

Abstract: The present invention provides a sandwich assay for quantifying a glycoprotein, which is a substance to be detected, in a sample using a labeled lectin, wherein the effect attributed to a contaminant, namely noise on the quantified value of the substance to be detected, is suppressed by introduction of a simple treatment. The sandwich assay includes a treatment for inhibiting the binding of the labeled lectin to a sugar chain carried by the contaminant non-specifically adsorbed to the measurement region, which contaminant is contained in the sample and which sugar chain is the same as that of the substance to be detected.

公开(公告)号：US20170030833A1

公开(公告)日：2017-02-02

申请号：US15301538

申请日：2014-04-08

Applicant: Konica Minolta, Inc.

Inventor： Yukito NAKAMURA ,  Takatoshi KAYA ,  Kosuke NAGAE ,  Akitoshi NOZAKI ,  Fumio NAGAI ,  Ryouta ISHIKAWA ,  Akiyuki NAMATAME

IPC: G01N21/64 ,  G01N33/543

CPC classification number: G01N21/648 ,  G01J3/0224 ,  G01J3/4406 ,  G01N21/6428 ,  G01N21/6445 ,  G01N33/54373 ,  G01N2021/6439 ,  G01N2021/6463 ,  G01N2201/0612 ,  G01N2201/0683

Abstract: The present invention pertains to a surface plasmon enhanced fluorescence analysis device and a surface plasmon enhanced fluorescence measurement method which use GC-SPFS and make it possible to detect a substance to be detected with high sensitivity. This surface plasmon enhanced fluorescence measurement device has: a light source for irradiating the diffraction grating of a chip with excited light; a polarizer for removing linearly polarized light from fluorescent light emitted from a fluorescent substance on the diffraction grating; and a photodetector for detecting the linearly polarized light removed by the polarizer.

Abstract translation: 本发明涉及使用GC-SPFS的表面等离子体增强荧光分析装置和表面等离子体增强荧光测定方法，能够以高灵敏度检测被检测物质。 该表面等离子体增强荧光测量装置具有：用激发光照射芯片的衍射光栅的光源; 用于从衍射光栅上的荧光物质发射的荧光中去除线偏振光的偏振器; 以及用于检测由偏振器去除的线偏振光的光电检测器。