DIFFRACTED LIGHT REMOVAL SLIT AND OPTICAL SAMPLE DETECTION SYSTEM USING SAME

    公开(公告)号:US20200319104A1

    公开(公告)日:2020-10-08

    申请号:US16754231

    申请日:2018-09-20

    Abstract: The present invention is to provide a diffracted light removal slit and an optical sample detection system including the same, in which diffracted light of excitation light can be reliably removed without affecting reflected light of the excitation light in a sample detection device utilizing the reflected light of the excitation light. A diffracted light removal slit is provided between a light source unit and an excitation light reflector in an optical sample detection system that emits excitation light from the light source unit and also performs predetermined measurement using reflected light of the excitation light reflected at the excitation light reflector. The diffracted light removal slit includes: a main portion provided in a direction substantially perpendicular to an optical path of the excitation light; and a sidewall portion extending from an end portion of the main portion and inclined toward an upstream side in an optical path direction of the excitation light.

    MEASUREMENT DEVICE
    5.
    发明申请
    MEASUREMENT DEVICE 审中-公开

    公开(公告)号:US20200150035A1

    公开(公告)日:2020-05-14

    申请号:US16610707

    申请日:2018-04-20

    Abstract: A measurement device is for measuring a sample arranged on a thick film transparent medium. In the measurement device, a light projecting surface, a light receiving surface, the thick film transparent medium, and a sample are set so as to satisfy the following formula (α) for eliminating noise light reflected from a back surface of the thick film transparent medium: h

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