Abstract:
A first frame having a first through-hole is arranged on a support so that one opening of the first through-hole is closed. A liquid containing a capturer is fed into the first through-hole, and a capturer is immobilized on the support exposed in the first through-hole. After removing the liquid from the support, a second frame having the second through-hole is arranged on the support in the first through-hole so that one opening of the second through-hole is closed.
Abstract:
A first frame having a first through-hole is arranged on a support so that one opening of the first through-hole is closed. A liquid containing a capturer for capturing a substance to be detected is fed into the first through-hole, and the capturer is immobilized on the support exposed in the first through-hole. After removing the liquid from the support, a second frame having the second through-hole is arranged on the support in the first through-hole so that one opening of the second through-hole is closed.
Abstract:
A surface plasmon fluorescence analysis device that has a chip holder, a light source, an angle adjustment unit, a light sensor, a filter holder, an excitation light cut filter, a scattered light transmission unit, a transmission adjustment unit, and a control unit. As seen in plan view, the area occupied by the scattered light transmission unit is arranged on the excitation light cut filter or on the filter holder and is smaller than the area of a fluorescence transmission region as seen in plan view.
Abstract:
The present invention is to provide a diffracted light removal slit and an optical sample detection system including the same, in which diffracted light of excitation light can be reliably removed without affecting reflected light of the excitation light in a sample detection device utilizing the reflected light of the excitation light. A diffracted light removal slit is provided between a light source unit and an excitation light reflector in an optical sample detection system that emits excitation light from the light source unit and also performs predetermined measurement using reflected light of the excitation light reflected at the excitation light reflector. The diffracted light removal slit includes: a main portion provided in a direction substantially perpendicular to an optical path of the excitation light; and a sidewall portion extending from an end portion of the main portion and inclined toward an upstream side in an optical path direction of the excitation light.
Abstract:
A measurement device is for measuring a sample arranged on a thick film transparent medium. In the measurement device, a light projecting surface, a light receiving surface, the thick film transparent medium, and a sample are set so as to satisfy the following formula (α) for eliminating noise light reflected from a back surface of the thick film transparent medium: h
Abstract:
The present invention pertains to a surface plasmon enhanced fluorescence analysis device and a surface plasmon enhanced fluorescence measurement method which use GC-SPFS and make it possible to detect a substance to be detected with high sensitivity. This surface plasmon enhanced fluorescence measurement device has: a light source for irradiating the diffraction grating of a chip with excited light; a polarizer for removing linearly polarized light from fluorescent light emitted from a fluorescent substance on the diffraction grating; and a photodetector for detecting the linearly polarized light removed by the polarizer.
Abstract:
A surface plasmon fluorescence analysis device that has a chip holder, a light source, an angle adjustment unit, a light sensor, a filter holder, an excitation light cut filter, a scattered light transmission unit, a transmission adjustment unit, and a control unit. As seen in plan view, the area occupied by the scattered light transmission unit is arranged on the excitation light cut filter or on the filter holder and is smaller than the area of a fluorescence transmission region as seen in plan view.