公开(公告)号：US20240171291A1

公开(公告)日：2024-05-23

申请号：US18374053

申请日：2023-09-28

Applicant: Keysight Technologies, Inc.

Inventor： Huaizhi Yang ,  Ya Jing ,  Jin-Ming Zhao ,  Zi Quan Bai

IPC: H04B17/00 ,  H04B17/15 ,  H04B17/309

CPC classification number: H04B17/0085 ,  H04B17/191 ,  H04B17/309

Abstract: A system, device and method for optimization of a radiated transmission matrix by the selecting probe antennae and applying a compensation network in the test system are described. Among other benefits, the anechoic chamber in which the DUT is disposed is comparatively small and inexpensive. The time-consuming process of inverse matrix tuning or isolation level checking that plagues known systems, device and methods of testing DUT is substantially avoided. Because of small size of shield box and probe antenna selection algorithm, low path loss and acceptable power in testing can be realized.

公开(公告)号：US11240878B2

公开(公告)日：2022-02-01

申请号：US17145768

申请日：2021-01-11

Applicant: Keysight Technologies, Inc.

Inventor： Stephen G. Duffy ,  Xu Zhao ,  Hong-Wei Kong ,  Ya Jing

IPC: H04W88/06 ,  H04W76/15 ,  H04W36/14 ,  H04W24/06 ,  H04W36/24 ,  H04W36/28 ,  H04W88/02

Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

公开(公告)号：US11057120B2

公开(公告)日：2021-07-06

申请号：US16551244

申请日：2019-08-26

Applicant: Keysight Technologies, Inc.

Inventor： Ya Jing ,  Hong-Wei Kong ,  Zhu Wen

IPC: G01R29/10 ,  H04B17/10

Abstract: A method for testing an antenna array uses a probe antenna to measure an RF signal antenna pattern of the antenna array. The method includes measuring the RF signal antenna pattern at a first position and at a second position relative to the antenna array. The first position and the second position are located at different distances from the antenna array in a middle field of the antenna array. The middle field satisfies near field criteria for the antenna array and also satisfies far field criteria for each antenna element of the plurality of antenna elements in the antenna array. The method further includes determining, based on the first measurement and based on the second measurement, the RF signal antenna pattern at a third position relative to the antenna array located in a far field of the antenna array.

公开(公告)号：US10567984B2

公开(公告)日：2020-02-18

申请号：US15423440

申请日：2017-02-02

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Yu Zuo ,  Zhu Wen ,  Ya Jing ,  Shao-Bo Chen

IPC: H04W24/06 ,  H04B7/0413 ,  H04B17/12

Abstract: A testing system includes a test chamber including an array of spaced-apart probe antennas and a positioner configured to support a device under test (DUT) having an array of digital antenna elements, a radio frequency (RF) signal generator and analyzer configured to send and receive RF test signals to/from the spaced-apart probe antennas, and an RF switch component configured to selectively couple the RF signal generator and analyzer to the array of spaced-apart probe antennas within the test chamber. A digital test instrument includes at least one digital signal generator and analyzer configured to generate digital test signals to the digital antenna elements of the DUT in a transmitter test mode, and to analyze received digital test signals from the digital antenna elements of the DUT in a receiver test mode, a programmable hardware device configured to implement a custom digital fiber interface protocol for the generated and received digital test signals, and a digital fiber interface configured to couple the programmable hardware device to the array of digital antenna elements of the DUT and transceive the digital test signals to/from the array of digital antenna elements of the DUT. A synchronization module is configured to synchronize the RF signal generator and analyzer, and the digital test instrument. A test controller is configured to control operation of the positioner, the RF signal generator and analyzer, the RF switch component and the digital test instrument during testing of the DUT.

公开(公告)号：US20200028598A1

公开(公告)日：2020-01-23

申请号：US16367642

申请日：2019-03-28

Applicant: Keysight Technologies, Inc.

Inventor： Ya Jing ,  Hong-Wei Kong ,  Zhu Wen

IPC: H04B17/10 ,  H04B17/12 ,  G01R29/10

Abstract: A method is provided for testing an antenna array of a DUT using a probe antenna, the antenna array including multiple antenna elements. The method includes providing a correction table that includes predetermined correction data of differences between far field antenna patterns from different positions in a far field of the antenna array and a middle field antenna pattern from a position in a middle field of the antenna array, where the middle field satisfies near field criteria for the antenna array and satisfies far field criteria for each antenna element in the antenna array; measuring an antenna pattern at a first position in the middle field of the antenna array; retrieving predetermined correction data from the correction table corresponding to a second position located in the far field of the antenna array; and translating the measured antenna pattern to the far field by adding the retrieved predetermined correction data.

公开(公告)号：US20170373773A1

公开(公告)日：2017-12-28

申请号：US15629211

申请日：2017-06-21

Applicant: Keysight Technologies, Inc.

Inventor： Ya Jing ,  Hong-Wei Kong

IPC: H04B17/318 ,  H04W24/08 ,  H04B7/0413

Abstract: A MIMO test system is provided that performs non-cable-conducted, over-the-air radiated calibration and test modes of operations. A DUT is located in an anechoic chamber having a plurality of probe antennas disposed therein. During the calibration mode, the test instrument causes predetermined signals to be transmitted over a transmission channel comprising a non-cable-conducted, OTA interface between probe antennas of the chamber and antenna ports of the DUT and obtains measurements of received power and relative phase. The test instrument uses the measurements to construct a radiation channel matrix associated with the transmission channel and obtains an inverse matrix of the radiation channel matrix. During the test mode, the test system performs a non-cable-conducted, OTA radiated test during which the test instrument applies the inverse matrix to DUT performance measurements obtained by the test instrument to calibrate out the radiation channel matrix from the DUT performance measurements.

公开(公告)号：US20160337052A1

公开(公告)日：2016-11-17

申请号：US15153544

申请日：2016-05-12

Applicant: Keysight Technologies, Inc.

Inventor： Zhu Wen ,  Hong-Wei Kong ,  Ya Jing

IPC: H04B17/14 ,  H04B17/345 ,  H04B7/04 ,  H04B17/12

CPC classification number: H04B17/14 ,  H04B7/0413 ,  H04B10/2575 ,  H04B17/0085 ,  H04B17/12 ,  H04B17/345 ,  H04B2210/006

Abstract: A test system includes a single-channel signal generator configured to generate an autocorrelation test signal to be distributed to each of a plurality of RF channels of a device under test (DUT). A time offset network includes a plurality of time offset channels each corresponding to one of the plurality of RF channels of the DUT, and is configured to, in combination with the DUT, provide corresponding autocorrelation test signals each with a different time delay as respective RF channel test signals. A single-channel measurement instrument is configured to process a single-channel test signal, based upon a combination of the RF channel test signals, to independently measure at least one characteristic of each of the RF channels of the DUT. The time offset network may be configured to be coupled between the single-channel signal generator and the DUT. Or, the time offset network may be configured to be coupled between the DUT and the single-channel measurement instrument.

Abstract translation: 测试系统包括单通道信号发生器，其被配置为产生要分配给被测器件（DUT）的多个RF通道中的每一个的自相关测试信号。 时间偏移网络包括多个时间偏移信道，每个时间偏移信道各自对应于DUT的多个RF信道中的一个，并且被配置为与DUT组合提供每个具有不同时间延迟的相应的自相关测试信号作为相应的RF 通道测试信号。 单通道测量仪器被配置为基于RF通道测试信号的组合来处理单通道测试信号，以独立地测量DUT的每个RF通道的至少一个特性。 时间偏移网络可以被配置为耦合在单信道信号发生器和DUT之间。 或者，时间偏移网络可以被配置为耦合在DUT和单通道测量仪器之间。

公开(公告)号：US12176961B2

公开(公告)日：2024-12-24

申请号：US18031835

申请日：2020-10-22

Applicant: Keysight Technologies, Inc.

Inventor： Ya Jing ,  Thorsten Hertel ,  Zhu Wen ,  Li Cao

IPC: H04B17/10 ,  G01R29/10 ,  H04B17/11

Abstract: A method determines corrected TRP or TIS of an AUT in a near-field test chamber, the AUT having a phase center offset from a rotation center of the test chamber. The method includes performing EIRP or EIS measurements of the AUT at first sampling grid points on a first closed-surface geometric shape centered at the rotation center; mapping second sampling grid points to the first closed-surface geometric shape to provide mapped sampling grid points on the first closed-surface geometric shape, where the second sampling grid points are on a second closed-surface geometric shape centered at the phase center of the AUT; determining estimated EIRPs or EISs at the mapped sampling grid points using the EIRP or EIS measurements; scaling the estimated EIRPs or EISs at the mapped sampling grid points to provide scaled EIRPs or EISs; and calculating the corrected TRP or TIS based on the scaled EIRPs or EISs.

公开(公告)号：US11879924B2

公开(公告)日：2024-01-23

申请号：US17059572

申请日：2020-10-22

Applicant: Keysight Technologies, Inc.

Inventor： Zhu Wen ,  Ya Jing ,  Li Cao ,  Thorsten Hertel

IPC: G01R29/08 ,  G01R29/10

CPC classification number: G01R29/0892 ,  G01R29/0814 ,  G01R29/105

Abstract: A system and method are provided to determine at least one of equivalent isotropic radiated power (EIRP) or effective isotropic sensitivity (EIS) of an antenna under test (AUT) in a test chamber, the AUT including an antenna array with an array phase center that is offset from a center of a quiet zone of the test chamber. The method includes performing a local beam peak direction scan of an antenna pattern of the AUT using a probe antenna located at laterally offset positions at a near-field distance from the AUT to determine a beam peak direction; performing EIRP and/or EIS near-field measurements of the AUT in the determined beam peak direction using the probe antenna located at near-field distances from the AUT in a radial direction; deriving a far-field equivalent of the EIRP and/or EIS near-field measurement along the determined beam peak direction; and deriving the beam peak direction of the AUT.

公开(公告)号：US11606153B2

公开(公告)日：2023-03-14

申请号：US15531421

申请日：2015-01-19

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing ,  Xu Zhao

IPC: H04B17/29 ,  H04B17/15 ,  G06F11/273

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.