公开(公告)号：US20210136867A1

公开(公告)日：2021-05-06

申请号：US17145768

申请日：2021-01-11

Applicant: Keysight Technologies, Inc.

Inventor： Steve G. Duffy ,  Xu Zhao ,  Hong-Wei Kong ,  Ya Jing

IPC: H04W88/06 ,  H04W76/15 ,  H04W36/14 ,  H04W24/06 ,  H04W36/24 ,  H04W36/28

Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

公开(公告)号：US20160212641A1

公开(公告)日：2016-07-21

申请号：US15001164

申请日：2016-01-19

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing ,  Xu Zhao

IPC: H04W24/06 ,  H04B7/04

CPC classification number: H04B17/0087 ,  H04B7/0413 ,  H04B17/3911

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

Abstract translation: 用于测试被测设备的测试系统包括：信号处理器，被配置为产生多个独立信号，并且将第一衰落信道特性应用于每个独立信号以产生多个第一衰落测试信号; 测试系统接口，其被配置为将所述多个第一衰落测试信号提供给被测器件（DUT）的一个或多个信号输入接口; 第二信号处理器，被配置为将第二衰落信道特性应用于DUT的多个输出信号以产生多个第二衰落测试信号，其中从第一衰落信道特性导出第二衰落信道特性; 以及一个或多个测试仪器，被配置为从多个第二衰落测试信号中测量DUT的至少一个性能特性。

公开(公告)号：US11240878B2

公开(公告)日：2022-02-01

申请号：US17145768

申请日：2021-01-11

Applicant: Keysight Technologies, Inc.

Inventor： Stephen G. Duffy ,  Xu Zhao ,  Hong-Wei Kong ,  Ya Jing

IPC: H04W88/06 ,  H04W76/15 ,  H04W36/14 ,  H04W24/06 ,  H04W36/24 ,  H04W36/28 ,  H04W88/02

Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

公开(公告)号：US11606153B2

公开(公告)日：2023-03-14

申请号：US15531421

申请日：2015-01-19

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing ,  Xu Zhao

IPC: H04B17/29 ,  H04B17/15 ,  G06F11/273

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

公开(公告)号：US10917937B2

公开(公告)日：2021-02-09

申请号：US15520572

申请日：2014-10-20

Applicant: Keysight Technologies, Inc.

Inventor： Steve G. Duffy ,  Xu Zhao ,  Hong-Wei Kong ,  Ya Jing

IPC: H04W88/06 ,  H04W76/15 ,  H04W36/14 ,  H04W24/06 ,  H04W36/24 ,  H04W36/28 ,  H04W36/30 ,  H04W88/02

Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

公开(公告)号：US20170318623A1

公开(公告)日：2017-11-02

申请号：US15520572

申请日：2014-10-20

Applicant: Stephen G. DUFFY ,  Hongwei KONG ,  Ya JING ,  Xu ZHAO ,  Keysight Technologies, Inc.

Inventor： Steve G. Duffy ,  Xu Zhao ,  Hong-Wei Kong ,  Ya Jing

IPC: H04W88/06 ,  H04W36/28 ,  H04W24/06 ,  H04W36/14 ,  H04W76/02 ,  H04W36/30

CPC classification number: H04W88/06 ,  H04W24/06 ,  H04W36/14 ,  H04W36/24 ,  H04W36/28 ,  H04W36/30 ,  H04W76/15 ,  H04W88/02

Abstract: A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.

公开(公告)号：US09859995B2

公开(公告)日：2018-01-02

申请号：US15001164

申请日：2016-01-19

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing ,  Xu Zhao

IPC: H04W24/00 ,  H04B17/00 ,  H04B17/391 ,  H04B7/0413

CPC classification number: H04B17/0087 ,  H04B7/0413 ,  H04B17/3911

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

公开(公告)号：US20170317769A1

公开(公告)日：2017-11-02

申请号：US15531421

申请日：2015-01-19

Applicant: Keysight Technologies, Inc.

Inventor： Hong-Wei Kong ,  Ya Jing ,  Xu Zhao

IPC: H04B17/29 ,  H04B17/15

CPC classification number: H04B17/29 ,  G06F11/2733 ,  H04B17/15

Abstract: A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.