Abstract:
A method is provided for sensing data in a memory device. The memory device includes a block of memory cells coupled to a plurality of bit lines. The method includes precharging the plurality of bit lines to a first level VPRE. The method includes enabling current flow through selected memory cells on the plurality of bit lines to a reference line or to reference lines coupled to a reference voltage. The method includes preventing a voltage change as a result of the current flow on the bit lines from causing a bit line voltage to pass outside a range between the first level and a second level VKEEP, where the second level is lower than the first level and higher than the reference voltage. The method includes sensing data in the selected memory cells.
Abstract:
Systems, methods, circuits, and apparatus for managing page buffer circuits in memory devices are provided. In one aspect, a memory device includes a memory cell array, a page buffer circuit including a plurality of page buffers, and a cache data latch (CDL) circuit including a plurality of caches coupled to the plurality of page buffers through a plurality of data bus sections. The plurality of data bus sections are configured to be conductively connected together as a data bus for data transfer. Each data bus section corresponds to a page buffer in the page buffer circuit and is configured to conductively separate from at least one adjacent data bus section for data sensing in the memory cell array.
Abstract:
A page buffer circuit is coupled to a bit line of a memory array. The page buffer circuit includes a latch storing different data during different phases of a multi-phase program operation. A preparation phase is after the program phase and after the program verify phase of the present multi-phase program operation. For the preparation phase, the control circuitry causes the latch to store the preparation data indicating whether to program the memory cell in a subsequent multi-phase program operation following the present multi-phase program operation. Results of the program verify phase, and contents of the latch at a start of the present multi-phase program operation, are sufficient to determine the preparation data.