公开(公告)号：US11410713B2

公开(公告)日：2022-08-09

申请号：US16840946

申请日：2020-04-06

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Di Wu ,  Debra M. Bell ,  Anthony D. Veches ,  James S. Rehmeyer ,  Libo Wang

IPC: G11C7/22 ,  G11C7/10 ,  G11C8/10 ,  G11C11/4096 ,  G11C11/4076 ,  G11C11/406

Abstract: Tracking circuitry may be used to determine if commands and/or command sequences include illegal commands and/or illegal command sequences. If the commands and/or command sequences include illegal commands and/or illegal command sequences, the tracking circuitry may activate signals that prevent execution of the commands and/or notice of the detected illegal commands and/or command sequences.

公开(公告)号：US11127612B2

公开(公告)日：2021-09-21

申请号：US15962648

申请日：2018-04-25

Applicant: Micron Technology, Inc.

Inventor： James D. Huffaker ,  Kim M. Hartnett ,  Ajay Raghunathan ,  Libo Wang ,  Linmiao Zhang ,  Di Wu

IPC: G06F17/18 ,  G01N25/72 ,  H01L21/67 ,  H01L21/66

Abstract: Several embodiments of the present technology are directed to semiconductor devices, and systems and associated methods for treating semiconductor devices based on warpage data. In some embodiments, a method can include heating a plurality of semiconductor devices from a first temperature to a second temperature, and determining warpage data at a plurality of points on the surfaces of the semiconductor devices as they are being heated. The method can further comprise applying a multivariate analysis to the surface warpage data to generate a multivariate statistic for each of the semiconductor devices at various sample temperatures. The multivariate statistics can be used to determine whether the semiconductor devices exceed or fall below a threshold limit.

公开(公告)号：US20210263847A1

公开(公告)日：2021-08-26

申请号：US16800356

申请日：2020-02-25

Applicant: MICRON TECHNOLOGY, INC.

Inventor： James S. Rehmeyer ,  Libo Wang ,  Anthony D. Veches ,  Debra M. Bell ,  Di Wu

IPC: G06F12/06 ,  G06F11/10 ,  G06F16/2455

Abstract: Embodiments of the disclosure are drawn to apparatuses, systems, methods, and memories that are capable of performing pattern matching operations within a memory device. The pattern matching operations may be performed on data stored within the memory based on a pattern stored in a register. The result of the pattern matching operation may be provided by the memory. The data may be retrieved from a memory array for the pattern matching operation by a read operation, a refresh operation, an error correction operation, and/or a pattern matching operation. The data may be retrieved from incoming data input lines instead of or in addition to the memory array. How the data is stored or retrieved for pattern matching operations may be controlled by a memory controller.

公开(公告)号：US11586958B2

公开(公告)日：2023-02-21

申请号：US16840916

申请日：2020-04-06

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Di Wu ,  Anthony D. Veches ,  James S. Rehmeyer ,  Debra M. Bell ,  Libo Wang

IPC: G06N5/04 ,  G06N5/047 ,  G06K9/62 ,  G06N20/00

Abstract: Embodiments of the disclosure are drawn to apparatuses, systems, methods for performing operations associated with machine learning. Machine learning operations may include processing a data set, training a machine learning algorithm, and applying a trained algorithm to a data set. Some of the machine learning operations, such as pattern matching operations, may be performed within a memory device.