摘要:
The output buffer stage includes a half-bridge output stage having a first pair of complementary drivers connected in series between a supply line and a ground node, the high impedance state or conduction state of which is determined through a pair of control phases. The buffer stage includes a pair of switches controlled by the control phases, connected in series between them and connecting the transistors of the first stage in series. Each driver is connected in series with a switch, that is quickly opened to prevent under-threshold currents from circulating when the respective driver is turned off, and that is rapidly turned off when the respective driver is turned on.
摘要:
A reading circuit for nonvolatile memory cells, including a current-to-voltage converter, having an array load, connected to a memory cell, and a reference load connected to a reference generator. The array load and the reference load include PMOS transistors presenting an array shape factor (W/L)F and, respectively, a reference shape factor (W/L)R. The reading circuit further includes a charge pump that supplies a biasing voltage to a gate terminal of the memory cell. The biasing voltage is proportional to and higher than a supply voltage VDD. The ratio between the array shape factor (W/L)F and the reference shape factor (W/L)R is a non-integer.
摘要:
An equalization control circuit having an equalization signal generating stage having an enabling input receiving an address transition signal, a disabling input receiving a disabling signal, and an output generating an equalization control signal. An auxiliary line is supplied at one initial terminal (35a) with a biasing voltage correlated to the reading voltage supplied to the addressed array cell. An equalization filter is connected to the end terminal of the auxiliary line and generates the disabling signal when the voltage at the end terminal of the auxiliary line exceeds a preset threshold value.
摘要:
A read circuit for non-volatile memories having an array section, with a corresponding bitline, and a reference section, with a corresponding reference bitline. A differential amplifier for comparing voltage signals obtained by current/voltage conversion of a current signal of an array cell and of a reference current signal is connected to the respective bit lines. A cascode transistor for each one of the array and reference sections, each driven by a NOR logic gate; a charge transistor for the bitline and a charge transistor for the reference bitline; column decoding transistors for the array section and for the reference section; the circuit further comprising an additional transistor which is connected between the NOR gate of the array side and a node for acquiring the array voltage sent to the differential amplifier, the additional transistor increasing the speed of the process for reading the bitline when the bitline is not charged.
摘要:
A sensing circuit for a semiconductor memory, includes, a detecting amplifier including a first circuital branch is run through by a first current corresponding to the sum of a second current as a function of a comparison current and a cell current. The cell current is a function of a state of a memory cell to be read in a predetermined biasing condition. A second circuital branch is coupled as a current mirror configuration with the first circuital branch. The second circuital branch is run through by a third current proportional to the first current. A third circuital branch coupled to the second branch sinks a fourth current as a function of the comparison current. A fourth circuital branch coupled to is run through by a residual current equal to the difference between the third and the fourth current. The residual current assumes different values depending on the fact that the cell current is lower, equal or higher than the comparison current. A residual current sensitive means generates an indication of the state of the memory cell as a function of a value of the residual current.
摘要:
A basic electronic circuit generates a magnitude. The circuit has certain structural characteristics and the magnitude undergoes variations in function of the structural characteristics of the circuit. The circuit comprises at least two circuit parts suitable for supplying respective fractions of the magnitude and the at least two circuit parts have different structural characteristics.
摘要:
An architecture for implementing an integrated capacity includes a capacitive block inserted between first and second voltage reference. The block is formed The block is formed from elementary capacitive modules. An enable block is inserted between the first voltage reference and the capacitive block and includes switches connected to the elementary capacitive modules and driven on their control terminals by control signals. Each switch of the enable block is inserted between the first voltage reference and a first end of a corresponding elementary capacitive module. A verify and enable circuit is connected to the first voltage reference, as well as at the input of the first end of the elementary capacitive modules and at the output of the control terminals of the switches of the enable block. The verify and enable circuit detects the presence of a current value in each of the elementary capacitive modules and, if said current is detected, disables that elementary capacitive module of the capacitive block using the corresponding switch of the enable block.
摘要:
Described herein is a reading circuit for a nonvolatile memory device, wherein the currents flowing through an array memory cell to be read, and a reference memory cell with known contents, are converted into an array voltage and, respectively, into a reference voltage, which are compared to determine the contents of the array memory cell. The method envisages reducing the electrical stress to which the reference memory cell is subjected during reading, by generating and holding a sample of the reference voltage, then deselecting the reference memory cell, and then continuing reading using the sample of the reference voltage.
摘要:
A method for simultaneously programming a pre-established number of memory cells includes setting an initial number of memory cells to be simultaneously programmed equal to the pre-established number, and subdividing the initial number of memory cells to be programmed into subsets of memory cells. A program operation for simultaneously programming all the memory cells of each subset of memory cells is executed by forcing a current through all the memory cells of each subset of memory cells. The current has a program voltage associated therewith. The program voltage is compared to a threshold voltage during execution of the program operation. The method further includes stopping execution of the program operation if the threshold voltage is surpassed, reducing the initial number of memory cells to be simultaneously programmed, and restarting from the subdividing.
摘要:
A voltage-down converter for providing an output voltage lower than a power supply voltage of the converter is proposed. The converter includes voltage regulation means for obtaining an intermediate voltage corresponding to the output voltage from the power supply voltage by controlling a variable-conductivity element with a control signal resulting from a comparison between the intermediate voltage and a reference voltage, and an output stage for obtaining the output voltage from the power supply voltage by controlling a further variable-conductivity element with the control signal, wherein the further variable-conductivity element has a modular structure with at least one set of multiple basic modules, the converter further including means for enabling and/or disabling the modules of each set in succession according to a comparison between the output voltage and the intermediate voltage.