公开(公告)号：US20220335993A1

公开(公告)日：2022-10-20

申请号：US17811153

申请日：2022-07-07

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Di Wu ,  Debra M. Bell ,  Anthony D. Veches ,  James S. Rehmeyer ,  Libo Wang

IPC: G11C7/22 ,  G11C7/10 ,  G11C8/10 ,  G11C11/4096 ,  G11C11/4076

Abstract: Tracking circuitry may be used to determine if commands and/or command sequences include illegal commands and/or illegal command sequences. If the commands and/or command sequences include illegal commands and/or illegal command sequences, the tracking circuitry may activate signals that prevent execution of the commands and/or notice of the detected illegal commands and/or command sequences.

公开(公告)号：US11442940B2

公开(公告)日：2022-09-13

申请号：US16807692

申请日：2020-03-03

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Debra M. Bell ,  Libo Wang ,  Di Wu ,  James S. Rehmeyer ,  Anthony D. Veches

IPC: G06F16/2455 ,  G11C11/407 ,  G11C11/4096 ,  G11C11/54 ,  G11C7/10

Abstract: Embodiments of the disclosure are drawn to apparatuses, systems, methods, and memories that are capable of performing pattern matching operations within a memory device. The pattern matching operations may be performed on data stored within the memory based on a pattern stored in a register. The result of the pattern matching operation may be provided by the memory. The data on which the pattern matching operation is performed may not be output from the memory during the pattern matching operation.

公开(公告)号：US20190333796A1

公开(公告)日：2019-10-31

申请号：US15962648

申请日：2018-04-25

Applicant: Micron Technology, Inc.

Inventor： James D. Huffaker ,  Kim M. Hartnett ,  Ajay Raghunathan ,  Libo Wang ,  Linmiao Zhang ,  Di Wu

IPC: H01L21/67 ,  G01N25/72 ,  H01L21/66 ,  G06F17/18

Abstract: Several embodiments of the present technology are directed to semiconductor devices, and systems and associated methods for treating semiconductor devices based on warpage data. In some embodiments, a method can include heating a plurality of semiconductor devices from a first temperature to a second temperature, and determining warpage data at a plurality of points on the surfaces of the semiconductor devices as they are being heated. The method can further comprise applying a multivariate analysis to the surface warpage data to generate a multivariate statistic for each of the semiconductor devices at various sample temperatures. The multivariate statistics can be used to determine whether the semiconductor devices exceed or fall below a threshold limit.

公开(公告)号：US11586958B2

公开(公告)日：2023-02-21

申请号：US16840916

申请日：2020-04-06

Applicant: MICRON TECHNOLOGY, INC.

Inventor： Di Wu ,  Anthony D. Veches ,  James S. Rehmeyer ,  Debra M. Bell ,  Libo Wang

IPC: G06N5/04 ,  G06N5/047 ,  G06K9/62 ,  G06N20/00

Abstract: Embodiments of the disclosure are drawn to apparatuses, systems, methods for performing operations associated with machine learning. Machine learning operations may include processing a data set, training a machine learning algorithm, and applying a trained algorithm to a data set. Some of the machine learning operations, such as pattern matching operations, may be performed within a memory device.