High frequency deflection measurement of IR absorption with a modulated IR source
    11.
    发明授权
    High frequency deflection measurement of IR absorption with a modulated IR source 有权
    用调制IR光源进行红外吸收的高频偏转测量

    公开(公告)号:US08680467B2

    公开(公告)日:2014-03-25

    申请号:US13236115

    申请日:2011-09-19

    IPC分类号: G01J5/00 G01Q70/08 G01L9/00

    CPC分类号: G01Q30/02 G01N21/35 G01Q60/32

    摘要: A method of obtaining submicron resolution IR absorption data from a sample surface. A probe microscope probe interacts with the sample surface while a tunable source of IR radiation illuminates the sample-tip interaction region. The source is modulated at a frequency substantially overlapping the resonant frequency of the probe and may be modulated at the contact resonance frequency of the probe when the probe is in contact with the sample surface. The modulation frequency is continually adjusted to account for shifts in the probe resonant frequency due to sample or other variations. A variety of techniques are used to observe such shifts and accomplish the adjustments in a rapid manner.

    摘要翻译: 从样品表面获得亚微米分辨率IR吸收数据的方法。 探针显微镜探针与样品表面相互作用,而可调谐的红外辐射源照射样品尖端相互作用区域。 源以基本上与探针的谐振频率重叠的频率被调制,并且当探针与样品表面接触时可以以探针的接触共振频率调制源。 调制频率被连续地调整以考虑由于采样或其它变化引起的探头谐振频率的偏移。 使用各种技术来观察这种转移并以快速的方式完成调整。

    Dynamic power control, beam alignment and focus for nanoscale spectroscopy
    12.
    发明授权
    Dynamic power control, beam alignment and focus for nanoscale spectroscopy 有权
    动态功率控制,光束对准和聚焦纳米级光谱

    公开(公告)号:US08242448B2

    公开(公告)日:2012-08-14

    申请号:US12927248

    申请日:2010-11-09

    IPC分类号: G01J5/00

    CPC分类号: G01N21/3563 G01Q30/02

    摘要: Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.

    摘要翻译: 动态IR辐射功率控制,光束转向和聚焦调整,用于基于原子力显微镜的纳米级红外光谱系统。 在用来自IR源的光照射期间,监测由于局部IR样品吸收而导致AFM探针尖端与样品的相互作用。 动态地降低样品照度的功率,以使吸收率高的位置/波长处的样品过热度最小化,吸收低的位置/波长增加,以保持信噪比。 自动执行光束对准和聚焦优化作为波长的函数。

    Multiple modulation heterodyne infrared spectroscopy
    15.
    发明授权
    Multiple modulation heterodyne infrared spectroscopy 有权
    多调制外差红外光谱

    公开(公告)号:US09134341B2

    公开(公告)日:2015-09-15

    申请号:US13343599

    申请日:2012-03-16

    摘要: A heterodyne detection technique for highly localized IR spectroscopy based on an AFM. A pulsed IR source illuminates a sample and causes contact resonance of an AFM probe, which is a function of localized absorption. The probe is operated in intermittent contact mode and is therefore oscillated at a resonance frequency. A secondary oscillation is mixed in to the probe oscillation such that the sum of the secondary oscillation and the IR source pulse frequency is near another harmonic of the probe. A mixing effect causes measurable probe response at the other harmonic allowing data to be taken away from the pulse frequency.

    摘要翻译: 基于AFM的高度局部化红外光谱的外差检测技术。 脉冲IR源照亮样品并引起AFM探针的接触共振,这是局部吸收的函数。 探头在间歇接触模式下工作,因此以谐振频率振荡。 将次级振荡混合到探头振荡中,使得次级振荡和IR源脉冲频率之和接近于探头的另一谐波。 混合效应会在其他谐波处产生可测量的探头响应,从而可以将数据从脉冲频率中消除。

    Multiple modulation heterodyne infrared spectroscopy
    16.
    发明申请
    Multiple modulation heterodyne infrared spectroscopy 有权
    多调制外差红外光谱

    公开(公告)号:US20120204296A1

    公开(公告)日:2012-08-09

    申请号:US13343599

    申请日:2012-03-16

    IPC分类号: G01Q20/02

    摘要: A heterodyne detection technique for highly localized IR spectroscopy based on an AFM. A pulsed IR source illuminates a sample and causes contact resonance of an AFM probe, which is a function of localized absorption. The probe is operated in intermittent contact mode and is therefore oscillated at a resonance frequency. A secondary oscillation is mixed in to the probe oscillation such that the sum of the secondary oscillation and the IR source pulse frequency is near another harmonic of the probe. A mixing effect causes measurable probe response at the other harmonic allowing data to be taken away from the pulse frequency, resulting in background effect rejection and improved spatial resolution.

    摘要翻译: 基于AFM的高度局部化红外光谱的外差检测技术。 脉冲IR源照亮样品并引起AFM探针的接触共振,这是局部吸收的函数。 探头在间歇接触模式下工作,因此以谐振频率振荡。 将次级振荡混合到探头振荡中,使得次级振荡和IR源脉冲频率之和接近于探头的另一谐波。 混合效应会导致在其他谐波处的可测量的探头响应,从而允许数据从脉冲频率中消除,导致背景效应抑制和改善的空间分辨率。

    Dynamic power control, beam alignment and focus for nanoscale spectroscopy
    18.
    发明申请
    Dynamic power control, beam alignment and focus for nanoscale spectroscopy 有权
    动态功率控制,光束对准和聚焦纳米级光谱

    公开(公告)号:US20110205527A1

    公开(公告)日:2011-08-25

    申请号:US12927248

    申请日:2010-11-09

    IPC分类号: G01N21/35

    CPC分类号: G01N21/3563 G01Q30/02

    摘要: Dynamic IR radiation power control, beam steering and focus adjustment for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination with a beam from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise. Beam alignment and focus optimization as a function of wavelength are automatically performed.

    摘要翻译: 动态IR辐射功率控制,光束转向和聚焦调整,用于基于原子力显微镜的纳米级红外光谱系统。 在用来自IR源的光照射期间,监测由于局部IR样品吸收而导致AFM探针尖端与样品的相互作用。 动态地降低样品照度的功率,以使吸收率高的位置/波长处的样品过热度最小化,吸收低的位置/波长增加,以保持信噪比。 自动执行光束对准和聚焦优化作为波长的函数。

    Dynamic power control for nanoscale spectroscopy
    19.
    发明申请
    Dynamic power control for nanoscale spectroscopy 有权
    纳米级光谱的动态功率控制

    公开(公告)号:US20110203357A1

    公开(公告)日:2011-08-25

    申请号:US12660266

    申请日:2010-02-23

    IPC分类号: G01N13/00

    CPC分类号: G01Q30/02

    摘要: Dynamic IR radiation power control for use in a nanoscale IR spectroscopy system based on an Atomic Force Microscope. During illumination from an IR source, an AFM probe tip interaction with a sample due to local IR sample absorption is monitored. The power of the illumination at the sample is dynamically decreased to minimize sample overheating in locations/wavelengths where absorption is high and increased in locations/wavelengths where absorption is low to maintain signal to noise.

    摘要翻译: 动态红外辐射功率控制,用于基于原子力显微镜的纳米级红外光谱系统。 在来自IR源的照射期间,监测由于局部IR样品吸收而导致的AFM探针尖端与样品的相互作用。 动态地降低样品照度的功率,以使吸收率高的位置/波长处的样品过热度最小化,吸收低的位置/波长增加,以保持信噪比。

    High frequency deflection measurement of IR absorption
    20.
    发明授权
    High frequency deflection measurement of IR absorption 有权
    红外吸收的高频偏转测量

    公开(公告)号:US08001830B2

    公开(公告)日:2011-08-23

    申请号:US11803421

    申请日:2007-05-15

    IPC分类号: G01B5/28 G01N21/84 G01Q80/00

    摘要: An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community.

    摘要翻译: 已经证明了基于AFM的技术用于在样品表面上进行高度局部化的IR光谱。 在商业可行的分析仪器中实施的这种技术将是非常有用的。 必须改变实验设置的各个方面,以创建商业版本。 本发明解决了许多这些问题,从而产生了一般可用于科学界的驾驶室的分析技术的版本。