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公开(公告)号:US10082525B2
公开(公告)日:2018-09-25
申请号:US15511733
申请日:2015-09-18
Applicant: NHK Spring Co., Ltd.
Inventor: Yoshio Yamada , Kohei Hironaka
CPC classification number: G01R1/07357 , G01N2201/00 , G01R1/06722 , G01R1/07378 , H01L21/00 , H01L2221/00 , H01R13/2421 , H01R2201/20
Abstract: A probe unit according to the present invention is suitable for allowing a large current to flow. In the probe unit that accommodates a plurality of contact probes for electrically connecting an inspection target object and a signal processing device used to output an inspection signal, both ends of a large current probe (3) are electrically connected to electrodes of a contact target object, and a large current is made to flow via a metal block (50) that comes into contact with both end portions of the large current probe (3).
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公开(公告)号:US20170299631A1
公开(公告)日:2017-10-19
申请号:US15511733
申请日:2015-09-18
Applicant: NHK Spring Co., Ltd.
Inventor: Yoshio Yamada , Kohei Hironaka
CPC classification number: G01R1/07357 , G01N2201/00 , G01R1/06722 , G01R1/07378 , H01L21/00 , H01L2221/00 , H01R13/2421 , H01R2201/20
Abstract: A probe unit according to the present invention is suitable for allowing a large current to flow. In the probe unit that accommodates a plurality of contact probes for electrically connecting an inspection target object and a signal processing device used to output an inspection signal, both ends of a large current probe (3) are electrically connected to electrodes of a contact target object, and a large current is made to flow via a metal block (50) that comes into contact with both end portions of the large current probe (3).
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