公开(公告)号：US20120319007A1

公开(公告)日：2012-12-20

申请号：US13518115

申请日：2010-10-22

申请人： Michael Kempe ,  Ralf Netz ,  Gerhard Krampert

发明人： Michael Kempe ,  Ralf Netz ,  Gerhard Krampert

IPC分类号： G01N21/64

CPC分类号： G01N21/6458 ,  G02B21/16

摘要： A luminescence microscopy method includes a sample being used, which comprises a certain substance, wherein the certain substance can be converted repeatedly from a first state, in which it can be excited into emitting luminescence radiation, into a second state, in which it cannot be excited into emitting luminescence radiation. The substance present in the sample can be brought into the first state by irradiating switch radiation. The certain substance can be excited into emitting luminescence radiation by irradiating excitation radiation. The sample emitting luminescence radiation can be displayed. A high-resolution selection of sample regions extending perpendicularly to a sample surface is carried out by irradiating either the switch radiation or the excitation radiation as structured illumination of the sample. A high-resolution selection of the sample surface is carried out by irradiating the switch radiation and/or the excitation radiation as TIRF illumination of the sample.

摘要翻译： 发光显微镜方法包括使用的样品，其包含某种物质，其中某些物质可以从其可被激发发射发光辐射的第一状态重复地转换到第二状态，其中不能是 激发发射发光辐射。 存在于样品中的物质可以通过照射开关辐射而进入第一状态。 可以通过照射激发辐射来激发某些物质发射发光辐射。 可以显示发射发光辐射的样品。 垂直于样品表面延伸的样品区域的高分辨率选择是通过照射样品的结构照明中的开关辐射或激发辐射来进行的。 通过将开关辐射和/或激发辐射照射作为样品的TIRF照明来进行样品表面的高分辨率选择。

公开(公告)号：US20090296207A1

公开(公告)日：2009-12-03

申请号：US11783255

申请日：2007-04-06

申请人： Michael Goelles ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk

发明人： Michael Goelles ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk

IPC分类号： G02B21/06

CPC分类号： G01B11/14 ,  G02B21/0036 ,  G02B21/008

摘要： Laser scanning microscope and its operating method in which at least two first and second light distributions activated independently of each other and that can move in at least one direction illuminate a sample with the help of a beam-combining element, and the light is detected by the sample as it comes in, characterized by the fact that the scanning fields created by the light distributions on the sample are made to overlap mutually such that a reference pattern is created on the sample with one of the light distributions, which is then captured and used to create the overlap with the help of the second light distribution (correction values are determined) and/or a reference pattern arranged in the sample plane or in an intermediate image plane is captured by both scanning fields and used to create the overlap (correction values are determined) and/or structural characteristics of the sample are captured by the two scanning fields as reference pattern and used to create the overlap in which correction values are determined.

摘要翻译： 激光扫描显微镜及其操作方法，其中至少两个第一和第二光分布彼此独立地激活并且可以在至少一个方向上移动，借助于光束组合元件照射样品，并且光被 样品进入，其特征在于使由样品上的光分布产生的扫描场相互重叠，使得在具有一个光分布的样品上产生参考图案，然后被捕获， 用于通过第二光分布（校正值被确定）和/或布置在采样平面中或中间图像平面中的参考图案在两个扫描场捕获并用于创建重叠（校正 值被确定）和/或样本的结构特征被两个扫描场作为参考图案捕获并用于创建重叠 其中确定校正值。

公开(公告)号：US20080130125A1

公开(公告)日：2008-06-05

申请号：US11783289

申请日：2007-04-06

申请人： Michael Goelles ,  Ralf Netz ,  Marcus Heidkamp ,  Joerg-Michael Funk

发明人： Michael Goelles ,  Ralf Netz ,  Marcus Heidkamp ,  Joerg-Michael Funk

IPC分类号： G02B27/10

CPC分类号： G02B27/144 ,  G02B21/0064

摘要： A beam corradiator for combining two radiation beams, preferably movable beams independent from each other in at least one direction, to scan and/or influence a sample, preferably a manipulation system and an imaging system, with a partially reflecting layer being provided for the corradiation, wherein the thickness of the layer is provided with a preferably consistent incline or decline over the optically effective cross-section of the beam corradiatior.

摘要翻译： 一种用于组合两个辐射束，优选在至少一个方向上彼此独立的可移动光束以扫描和/或影响样品，优选地操纵系统和成像系统的光束校正器，其中提供了部分反射层用于辐照 ，其中所述层的厚度在所述光束辐射体的光学有效横截面上被提供优选地一致的倾斜或下降。

公开(公告)号：US20080068709A1

公开(公告)日：2008-03-20

申请号：US11783290

申请日：2007-04-06

申请人： Bernhard Zimmermann ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk ,  Ralf Engelmann

发明人： Bernhard Zimmermann ,  Ralf Netz ,  Frank Hecht ,  Joerg-Michael Funk ,  Ralf Engelmann

IPC分类号： G02B21/06

CPC分类号： G02B21/06 ,  G02B21/00 ,  G02B21/0032 ,  G02B21/0076 ,  G02B27/0972

摘要： Method for actuation control of a microscope, in particular of a Laser Scanning Microscope, in which, at least one first illumination light, preferably moving at least in one direction, as well as at least one second illumination light moving at least in one direction, illuminate a sample through a beam combination, a detection of the light coming from the sample takes place, whereby, at least one part of the illumination light is generated through the splitting of the light from a common illuminating unit, characterized in that, by means of a common control unit, a controlled splitting into the first and the second illumination light takes place, in which the intensity of the first illuminating light, specified by the user or specified automatically, is assigned a higher priority (is prioritized) compared to the specified value for the second illumination light, and an adjustment for the second illumination light takes place until a maximum value is obtained, which is determined by the value specified for the first illumination light.

摘要翻译： 显微镜，特别是激光扫描显微镜的致动控制方法，其中至少一个至少在一个方向上移动的第一照明光以及至少沿一个方向移动的至少一个第二照明光， 通过光束组合照射样品，发生来自样品的光的检测，由此通过从公共照明单元分离光而产生照明光的至少一部分，其特征在于，通过装置 发生公共控制单元的受控分割，进入第一和第二照明光，其中由用户指定或自动指定的第一照明光的强度被分配为比较高的优先级（优先化） 对于第二照明光的指定值，并且进行第二照明光的调整，直到获得由th确定的最大值 为第一个照明灯指定的e值。

公开(公告)号：US08705172B2

公开(公告)日：2014-04-22

申请号：US12913487

申请日：2010-10-27

申请人： Ingo Kleppe ,  Ralf Netz ,  Yauheni Novikau

发明人： Ingo Kleppe ,  Ralf Netz ,  Yauheni Novikau

IPC分类号： G02B21/06

CPC分类号： G02B21/0072 ,  G02B21/0036 ,  G02B21/0076 ,  G02B21/008

摘要： Method for enhancing the resolution of a microscope during the detection of an illuminated specimen and a microscope for carrying out the method, wherein in a first position, an illumination pattern is generated on the specimen, the resolution of which is preferably within the range of the attainable optical resolution of the microscope or higher, wherein a relative movement, preferably perpendicular to the direction of illumination, from a first into at least one second position of the illumination pattern on the specimen is generated at least once between the detection and the illumination pattern with a step width smaller than the resolution limit of the microscope and detection and storage of the detection signals take place both in the first and in the second position.

摘要翻译： 在用于检测被照射的样本的显微镜检测期间提高显微镜的分辨率的方法和用于实施该方法的显微镜的方法，其中在第一位置，在样本上产生照明图案，其分辨率优选在 显示器的可获得的光学分辨率或更高，其中在检测和照射图案之间至少产生一次关于样品上的照明图案的第一至至少一个第二位置的优选垂直于照明方向的相对运动 具有小于显微镜的分辨率极限的台阶宽度，检测信号的检测和存储在第一和第二位置都发生。