Abstract:
A memory includes a plurality of word lines each coupled with at least one memory cell, an address storing unit that may store at least one target address corresponding to at least one of the word lines, and a control unit that may sequentially activate the plurality of word lines in response to a refresh command that is inputted at a set interval, and may activate the word line selected based on the target address whenever the refresh command is inputted a set number of times that is equal to or more than two times.
Abstract:
A semiconductor device includes a normal code generation unit capable of generating a normal code, a test code output unit capable of storing a plurality of preliminary test codes to output a test code in response to a test control signal, and a reference voltage generation unit capable of generating a normal reference voltage in a normal operation mode and generating a test reference voltage in a test operation mode in response to the normal code and the test code.
Abstract:
A semiconductor memory device includes a command buffering unit suitable for receiving and buffering a command signal based on an enable control signal, a fuse array suitable for programming data based on the command signal, and an enable control unit suitable for generating the enable control signal, wherein an activation operation on the command buffering unit by the enable control signal is controlled during a programming operation period of the fuse array.
Abstract:
A semiconductor device includes a first control block suitable for selectively blocking a refresh command signal based on a period signal having a predetermined activating pattern and a predetermined mode signal activated in a predetermined mode to generate a refresh group signal; and a second control block suitable for controlling a refresh operation based on the refresh group signal.
Abstract:
A semiconductor memory device includes an address latch unit suitable for consecutively latching first refresh addresses, which correspond to successively-activated word lines, from consecutively received addresses for word lines to be activated in response to word line hit signals identifying the successively-activated word lines; an address comparison unit suitable for generating a comparison result signal by comparing the previously latched first address with the currently latched first address; a refresh control unit suitable for selecting a first refresh operation corresponding to the currently latched first address, and a second refresh operation corresponding to a second address in response to the comparison result signal, and a refresh command signal; and a refresh operation unit suitable for performing the first and second refresh operations on memory cells therein according to the selection of the refresh control unit.
Abstract:
A semiconductor memory device includes a memory cell array including a plurality of memory cells and a plurality of redundancy memory cells, a fuse array to be programmed with information of a defective memory cell among the memory cells of the memory cell array, and a control unit suitable for setting up a program operation section for programming the fuse array in response to an external command, wherein when the control unit sets up the program operation section, the control unit sets up a refresh operation section for refreshing the memory cell array, which is terminated before the program operation section ends without overlapping with the program operation section.
Abstract:
A semiconductor memory device includes a first bank, a second bank disposed separately from the first bank along a first direction, a third bank disposed separately from the first bank along a second direction substantially perpendicular to the first direction, a fourth bank disposed separately from the second bank along the second direction and from the third bank along the first direction, a first row control region, which is disposed between the first bank and the second bank, suitable for controlling a row decoding operation of the first bank and the second bank, a second row control region, which is disposed between the third bank and the fourth bank, suitable for controlling a row decoding operation of the third bank and the fourth bank, and a refresh control unit suitable for controlling a refresh operation of the first to fourth banks.
Abstract:
A memory includes a first cell array including a plurality of first memory cells connected to a plurality of word lines, a bit line selection unit configured to select one or more bit lines among a plurality of bit lines based on repair information, a second cell array including a plurality of second memory cells connected to the plurality of word lines and the plurality of bit lines, wherein a group of the plurality of second memory cells connected to a corresponding word line stores the number of activations of the corresponding word line when the one or more connected bit lines are selected and an activation number update unit configured to update a value stored in the second memory cells, which are connected to the one or more selected bit lines and the activated word line among the plurality of word lines.
Abstract:
A memory includes first to Nth word lines, first to Mth redundancy word lines configured to replace M number of word lines among the first to Nth word lines, and a control circuit configured to activate at least one adjacent word line adjacent to a Kth redundancy word line (1≦K≦M) in response to an active signal, in the case where a word line corresponding to an inputted address among the first to Nth word lines is replaced with the Kth redundancy word line among the first to Mth redundancy word lines in a first mode.
Abstract translation:存储器包括第一至第N字线,第一至第M冗余字线,被配置为替换第一至第N字线中的M个字线,以及控制电路,被配置为激活与第K个冗余字相邻的至少一个相邻字线 在第一至第M冗余字线中替换与第一至第N字线中输入的地址对应的字线替换为第K冗余字线的情况下,响应于有效信号,线(1 @ K @ M) 在第一模式。
Abstract:
A memory device includes a parity circuit configured to detect presence or absence of an error using a plurality of command signals and a plurality of address signals, a command shift circuit configured to shift the plurality of command signals by a preset delay value in synchronization with a control clock, a clock control circuit configured to deactivate the control clock when there is no valid command signal in command signals being shifted in the command shift circuit, and a decoder circuit configured to decode a plurality of command signals output from the command shift circuit.