CIRCUIT AND METHOD TO DETECT WORD-LINE LEAKAGE AND PROCESS DEFECTS IN NON-VOLATILE MEMORY ARRAY

    公开(公告)号:US20230008272A1

    公开(公告)日:2023-01-12

    申请号:US17837377

    申请日:2022-06-10

    Abstract: An integrated circuit die includes memory sectors, each memory sector including a memory array. The die includes a voltage regulator with a first transistor driven by an output voltage to thereby generate a gate voltage, the output voltage being generated based upon a difference between a constant current and a leakage current. A selection circuit selectively couples the gate voltage to a selected one of the plurality of memory sectors. A leakage detector circuit drives a second transistor with the output voltage to thereby generate a copy voltage based upon a difference between a variable current and a replica of the constant current, increases the variable current in response to the copy voltage being greater than the gate voltage, and asserts a leakage detection signal in response to the copy voltage being less than the gate voltage, the leakage detection signal indicating excess leakage within the memory array.

    MEMORY CIRCUIT ARRANGEMENT FOR ACCURATE AND SECURE READ

    公开(公告)号:US20210375333A1

    公开(公告)日:2021-12-02

    申请号:US17321344

    申请日:2021-05-14

    Abstract: The present disclosure is directed to arranging user data memory cells and test memory cells in a configurable memory array that can perform both differential and single ended read operations during memory start-up and normal memory use, respectively. Different arrangements of the user data memory cells and the test memory cells in the memory array result in increased effectiveness of memory array, in terms of area optimization, memory read accuracy and encryption for data security.

    CHARGE PUMP CIRCUIT CONFIGURED FOR POSITIVE AND NEGATIVE VOLTAGE GENERATION

    公开(公告)号:US20210050778A1

    公开(公告)日:2021-02-18

    申请号:US16911967

    申请日:2020-06-25

    Inventor: Vikas RANA

    Abstract: A charge pump includes an intermediate node capacitively coupled to receive a first clock signal oscillating between a ground and positive supply voltage, the intermediate node generating a first signal oscillating between a first and second voltage. A level shifting circuit shifts the first signal in response to a second clock signal to generate a second signal oscillating between first and third voltages. A CMOS switching circuit includes a first transistor having a source coupled to an input, a second transistor having a source coupled to an output and a gate coupled to receive the second signal. A common drain of the CMOS switching circuit is capacitively coupled to receive the first clock signal. When positively pumping, the first voltage is twice the second voltage and the third voltage is ground. When negatively pumping, the first and third voltages are of opposite polarity and the second voltage is ground.

    CHARGE PUMP REGULATION CIRCUIT TO INCREASE PROGRAM AND ERASE EFFICIENCY IN NONVOLATILE MEMORY

    公开(公告)号:US20200235660A1

    公开(公告)日:2020-07-23

    申请号:US16742248

    申请日:2020-01-14

    Abstract: A charge pump circuit generates a charge pump output signal at a first node and is enabled by a control signal. A diode has an anode coupled to the first node and a cathode coupled to a second node. A current mirror arrangement sources a first current to the second node and sinks a second current from a third node. A comparator causes the control signal to direct the charge pump circuit to generate the charge pump output signal as having a voltage that ramps upwardly in magnitude (but negative in sign) if the voltage at the second node is greater than the voltage at the third node, and causes the control signal to direct the charge pump circuit to cease the ramping of the voltage of the charge pump output signal if the voltage at the second node is at least equal to the voltage at the third node.

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