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11.发明申请DISPLAY APPARATUS AND METHOD OF DETECTING SHORT-CIRCUIT FAILURE OF THE DISPLAY APPARATUS 有权显示装置和检测显示装置短路故障的方法公开(公告)号：US20130307548A1
公开(公告)日：2013-11-21
申请号：US13665392
申请日：2012-10-31
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor： June-Woo Lee , Jae-Beom Choi , Kwan-Wook Jung , Sung-Soo Choi , Seong-Jun Kim , Guang-Hai Jin , Ga-Young Kim , Jee-Hoon Kim
CPC classification number: H01L27/124 , G01R31/025 , H01L27/3276 , H01L2251/568
Abstract: A display apparatus is disclosed. The apparatus includes a plurality of unit pixels each comprising a plurality of sub pixels, a plurality of scan wires, and a plurality of scan lines branching off from each of the scan wires and extending in a first direction. The number of scan lines from each scan wire equals the number of sub pixels for each pixel, and each scan line connects one of the scan wires with one of the sub pixels of each of a plurality of unit pixels. The apparatus also includes a plurality of data lines extending in a second direction orthogonal to the first direction and which are connected to the plurality of sub pixels. The apparatus also includes a first power supply line extending in the second direction and connected to the sub pixels, and a plurality of test pads, each connected to the scan lines of one of the scan wires.
Abstract translation: 公开了一种显示装置。 该装置包括多个单位像素，每个单位像素包括多个子像素，多条扫描线以及从每条扫描线分支并沿第一方向延伸的多条扫描线。 来自每条扫描线的扫描线的数量等于每个像素的子像素的数量，并且每个扫描线将一条扫描线与多个单位像素中的每一个的子像素中的一个连接。 该装置还包括在与第一方向正交的第二方向上延伸并连接到多个子像素的多条数据线。 该装置还包括在第二方向上延伸并连接到子像素的第一电源线和多个测试焊盘，每个测试焊盘连接到扫描线之一的扫描线。
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12.发明授权公开(公告)号：US09613551B2
公开(公告)日：2017-04-04
申请号：US13670195
申请日：2012-11-06
Applicant: Samsung Display Co., Ltd.
Inventor： June-Woo Lee , Jae-Beom Choi , Kwan-Wook Jung , Sung-Soo Choi , Seong-Jun Kim , Guang-Hai Jin , Ga-Young Kim , Jee-Hoon Kim
IPC: G09G3/30 , G09G3/36 , G09G3/00 , G09G3/3233 , G01R31/02
CPC classification number: G09G3/006 , G01R31/025 , G09G3/3233 , G09G2300/0852 , G09G2310/0262 , G09G2320/043
Abstract: An organic light emitting diode display apparatus and a method and apparatus for easily inspecting the organic light emitting diode display apparatus to determine whether an electrical failure occurs. The organic light emitting diode display apparatus comprises a plurality of pixels each comprising a pixel electrode, an intermediate layer including an organic emission layer, and an opposite electrode; scan lines and data lines corresponding to the plurality of pixels; first power supply lines connected to the plurality of pixels and extending in a first direction; second power supply lines connected to the first power supply lines; and a control line unit for simultaneously supplying control signals to the plurality of pixels, the control line unit including a plurality of control lines extending in one direction and two common lines being respectively connected to both ends of each of the plurality of control lines.
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13.发明授权Apparatus and method for inspecting an organic light-emitting display apparatus 有权用于检查有机发光显示装置的装置和方法公开(公告)号：US09530339B2
公开(公告)日：2016-12-27
申请号：US14261260
申请日：2014-04-24
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor： June-Woo Lee , Kwan-Wook Jung , Guang-Hai Jin , Jae-Beom Choi
CPC classification number: G09G3/006 , G01R31/023 , G01R31/024 , G09G3/3208 , G09G2330/12
Abstract: A device for inspecting an organic light-emitting display apparatus includes a power supply unit, a power receiving unit, a wiring location sensing unit, and a control unit. The power supply unit applies an AC signal to each of wirings arranged in the organic light-emitting display apparatus. The power receiving unit senses an electrical signal from each of the wirings. The wiring location sensing unit senses a location of each of the wirings. The control unit determines whether each of the wirings has a defect based on the sensed electrical signal and information pertaining to each wiring type of the wirings.
Abstract translation: 用于检查有机发光显示装置的装置包括电源单元，受电单元，布线位置感测单元和控制单元。 电源单元对布置在有机发光显示装置中的各配线施加交流信号。 电力接收单元感测来自每个布线的电信号。 接线位置检测单元感测每个布线的位置。 控制单元基于感测到的电信号和与布线的每种布线类型相关的信息来确定每个布线是否具有缺陷。
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公开(公告)号：US08963821B2
公开(公告)日：2015-02-24
申请号：US13802347
申请日：2013-03-13
Applicant: Samsung Display Co., Ltd.
Inventor： Guang-Hai Jin , Dong-Gyu Kim , Kwan-Wook Jung , Kyong-Hun Cho , Moo-Jin Kim
CPC classification number: G09G3/20 , G09G2310/0267 , G09G2330/08 , G09G2330/12 , G11C19/00 , G11C19/28
Abstract: A scan driving device includes: a first node transmitted with a clock signal input to a first clock signal input terminal; a second node transmitted with an input signal according to a clock signal input to a second clock signal input terminal; a first transistor transmitting a power source voltage to an output terminal according to a voltage of the first node; a second transistor formed to transmit the clock signal input to the third clock signal input terminal to the output terminal according to the voltage of the second node; and a dummy transistor formed to transmit the clock signal input to the third clock signal input terminal to the output terminal according to the voltage of the second node. One of the second transistor and the dummy transistor is cut off.
Abstract translation: 扫描驱动装置包括：以输入到第一时钟信号输入端的时钟信号发送的第一节点; 根据输入到第二时钟信号输入端的时钟信号，用输入信号发送第二节点; 第一晶体管，根据第一节点的电压将电源电压传输到输出端; 第二晶体管，被形成为根据第二节点的电压将输入到第三时钟信号输入端的时钟信号传输到输出端; 以及虚拟晶体管，其被形成为根据第二节点的电压将输入到第三时钟信号输入端子的时钟信号传输到输出端子。 第二晶体管和虚拟晶体管中的一个被切断。
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15.发明授权Thin film transistor substrate, display apparatus utilizing same, and related manufacturing methods 有权薄膜晶体管基板，利用其的显示装置及相关的制造方法公开(公告)号：US08804062B2
公开(公告)日：2014-08-12
申请号：US13649982
申请日：2012-10-11
Applicant: Samsung Display Co., Ltd.
Inventor： Guang-Hai Jin , Jae-Beom Choi , Kwan-Wook Jung , June-Woo Lee , Sung-Soo Choi , Seong-Jun Kim
IPC: G02F1/136 , G02F1/1343
CPC classification number: H01L27/3276 , G02F1/134309 , G02F1/136259 , G02F1/136286 , G02F2001/134345 , G02F2001/136263 , H01L27/124 , H01L27/3248 , H01L27/326 , H01L2251/568
Abstract: A thin film transistor and a display apparatus include: a substrate; a plurality of first conductive lines formed on the substrate, each including a main body and a curved portion connected to the main body; a plurality of second conductive lines crossing the curved portions of the first conductive lines; and a plurality of pixel electrodes formed adjacent to the first conductive lines. The plurality of pixel electrodes includes a first pixel electrode disposed toward a side of one first conductive line, and a second pixel electrode disposed toward the other side of the one first conductive line. The display apparatus also includes an intermediate layer connected to the pixel electrodes for displaying images and an opposite electrode formed thereon.
Abstract translation: 薄膜晶体管和显示装置包括：基板; 形成在所述基板上的多个第一导电线，各自包括主体和连接到所述主体的弯曲部分; 与第一导电线的弯曲部分交叉的多个第二导电线; 以及与第一导电线相邻形成的多个像素电极。 多个像素电极包括朝向一个第一导电线的一侧设置的第一像素电极和朝向一个第一导电线的另一侧设置的第二像素电极。 显示装置还包括连接到用于显示图像的像素电极的中间层和形成在其上的相对电极。
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Patent Agency Ranking
公开(公告)号：US20130307557A1
公开(公告)日：2013-11-21
申请号：US13672031
申请日：2012-11-08
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor： June-Woo Lee , Jae-Beom Choi , Kwan-Wook Jung , Sung-Soo Choi , Seong-Jun Kim , Guang-Hai Jin , Ga-Young Kim , Jee-Hoon Kim
CPC classification number: G09G3/006 , G09G3/3233 , G09G2300/0819 , G09G2300/0852
Abstract: A method of inspecting a short circuit defect between first wires extending in a first direction and a second direction intersecting the first direction and second wires extending in the first or second direction, the method including inspecting a short circuit defect between the first and second wires by using a potential difference monitored only in the second wires.
Abstract translation: 一种在第一方向上延伸的第一线和与第一方向相交的第二方向的第一线和第一或第二方向上延伸的第二线之间的短路缺陷的检查方法，该方法包括：检查第一和第二线之间的短路缺陷， 使用仅在第二导线中监测的电位差。
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17.发明申请公开(公告)号：US20130293236A1
公开(公告)日：2013-11-07
申请号：US13670195
申请日：2012-11-06
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor： June-Woo Lee , Jae-Beom Choi , Kwan-Wook Jung , Sung-Soo Choi , Seong-Jun Kim , Guang-Hai Jin , Ga-Young Kim , Jee-Hoon Kim
CPC classification number: G09G3/006 , G01R31/025 , G09G3/3233 , G09G2300/0852 , G09G2310/0262 , G09G2320/043
Abstract: An organic light emitting diode display apparatus and a method and apparatus for easily inspecting the organic light emitting diode display apparatus to determine whether an electrical failure occurs. The organic light emitting diode display apparatus comprises a plurality of pixels each comprising a pixel electrode, an intermediate layer including an organic emission layer, and an opposite electrode; scan lines and data lines corresponding to the plurality of pixels; first power supply lines connected to the plurality of pixels and extending in a first direction; second power supply lines connected to the first power supply lines; and a control line unit for simultaneously supplying control signals to the plurality of pixels, the control line unit including a plurality of control lines extending in one direction and two common lines being respectively connected to both ends of each of the plurality of control lines.
Abstract translation: 一种有机发光二极管显示装置和用于容易地检查有机发光二极管显示装置以确定是否发生电气故障的方法和装置。 有机发光二极管显示装置包括多个像素，每个像素包括像素电极，包括有机发射层的中间层和相对电极; 对应于所述多个像素的扫描线和数据线; 连接到所述多个像素并沿第一方向延伸的第一电源线; 连接到第一电源线的第二电源线; 以及控制线单元，用于同时向所述多个像素提供控制信号，所述控制线单元包括分别连接到所述多个控制线中的每一个的两端的在一个方向上延伸的多个控制线和两条公共线。
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公开(公告)号：US11683966B2
公开(公告)日：2023-06-20
申请号：US17134722
申请日：2020-12-28
Applicant: Samsung Display Co., Ltd.
Inventor： Guang-Hai Jin , Jae-Beom Choi , Se-Hun Park , Jae-Seol Cho
IPC: H01L27/32 , H10K59/131 , H01L29/94 , H01L29/66 , H01L49/02 , H10K59/121
CPC classification number: H10K59/131 , H01L28/60 , H01L29/66181 , H01L29/94 , H10K59/1216
Abstract: A capacitor includes an active layer, a gate insulation layer on the active layer, a gate electrode on the gate insulation layer, an interlayer insulating layer on the gate electrode, and a first electrode on the interlayer insulating layer and connected to the active layer through at least one contact hole.
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公开(公告)号：US09997741B2
公开(公告)日：2018-06-12
申请号：US15374840
申请日：2016-12-09
Applicant: SAMSUNG DISPLAY CO., LTD.
Inventor： Jong-Hyun Choi , Dong-Hyun Lee , Dae-Woo Lee , Seong-Hyun Jin , Guang-Hai Jin
CPC classification number: H01L51/56 , H01L27/1259 , H01L27/3211 , H01L27/3218 , H01L27/3246 , H01L27/3248 , H01L27/3262 , H01L27/3265 , H01L51/0023 , H01L51/5265 , H01L51/5271 , H01L51/5275
Abstract: A method of manufacturing an organic light-emitting display includes a first mask process forming an active layer of a TFT and a refractive layer on a substrate, forming a DBR layer covering the active and refractive layers, a second mask process forming a gate electrode and a first electrode unit on the DBR layer, forming an interlayer insulation layer covering the gate electrode and the first electrode unit, a third mask process forming contact holes in the interlayer insulation layer and the DBR layer exposing portions of the active layer and a hole exposing the first electrode unit, a fourth mask process forming source and drain electrodes on the interlayer insulation layer that contact the active layer via the contact holes, and forming a pixel electrode from the first electrode unit, and a fifth mask process forming a pixel definition layer exposing the pixel electrode.
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公开(公告)号：US09361820B2
公开(公告)日：2016-06-07
申请号：US13672031
申请日：2012-11-08
Applicant: Samsung Display Co., Ltd.
Inventor： June-Woo Lee , Jae-Beom Choi , Kwan-Wook Jung , Sung-Soo Choi , Seong-Jun Kim , Guang-Hai Jin , Ga-Young Kim , Jee-Hoon Kim
CPC classification number: G09G3/006 , G09G3/3233 , G09G2300/0819 , G09G2300/0852
Abstract: A method of inspecting a short circuit defect between first wires extending in a first direction and a second direction intersecting the first direction and second wires extending in the first or second direction, the method including inspecting a short circuit defect between the first and second wires by using a potential difference monitored only in the second wires.
Abstract translation: 一种在第一方向上延伸的第一线和与第一方向相交的第二方向的第一线和第一或第二方向上延伸的第二线之间的短路缺陷的检查方法，该方法包括：检查第一和第二线之间的短路缺陷， 使用仅在第二导线中监测的电位差。
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