公开(公告)号：US20140367741A1

公开(公告)日：2014-12-18

申请号：US14155192

申请日：2014-01-14

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jung-Gil YANG ,  Sang-Su KIM ,  Chang-Jae YANG

IPC: H01L29/04 ,  H01L29/78

CPC classification number: H01L29/04 ,  H01L21/823807 ,  H01L21/823821 ,  H01L21/845 ,  H01L27/0207 ,  H01L27/092 ,  H01L27/0924 ,  H01L27/1104 ,  H01L27/1211 ,  H01L29/1054 ,  H01L29/165 ,  H01L29/66545 ,  H01L29/66636 ,  H01L29/66651 ,  H01L29/78 ,  H01L29/7848

Abstract: Provided is a semiconductor device comprising a substrate including a first area and a second area, first through third crystalline layers sequentially stacked on the first area and having first through third lattice constants, respectively, a first gate electrode formed on the third crystalline layer, fourth and fifth crystalline layers sequentially stacked on the second area and having fourth and fifth lattice constants, respectively, and a second gate electrode formed on the fifth crystalline layer, wherein the third lattice constant is greater than the second lattice constant, the second lattice constant is greater than the first lattice constant, and the fifth lattice constant is smaller than the fourth lattice constant.

Abstract translation: 本发明提供一种半导体器件，包括：包括第一区域和第二区域的衬底，分别依次层叠在第一区域上并具有第一至第三晶格常数的第一至第三晶体层，形成在第三晶体层上的第一栅电极，第四晶体管 和分别依次层叠在第二区域上并具有第四和第五晶格常数的第五晶体层和形成在第五晶体层上的第二栅电极，其中第三晶格常数大于第二晶格常数，第二晶格常数为 大于第一晶格常数，第五晶格常数小于第四晶格常数。