公开(公告)号：US10521292B2

公开(公告)日：2019-12-31

申请号：US15608982

申请日：2017-05-30

Applicant: Silicon Motion Inc.

Inventor： Chen-Yu Weng

IPC: G11C29/00 ,  G06F11/10 ,  G11C7/02 ,  G11C11/56 ,  G11C29/42 ,  G11C29/50 ,  G06F11/22

Abstract: A self-test method of a flash memory device includes: generating input data; encoding the input data to generate an error correction code; utilizing the input data and the error correction code to simulate to read a page of a flash memory of the flash memory device to generate soft information; and decoding the soft information to generate a decoding result.

公开(公告)号：US20170262333A1

公开(公告)日：2017-09-14

申请号：US15608982

申请日：2017-05-30

Applicant: Silicon Motion Inc.

Inventor： Chen-Yu Weng

IPC: G06F11/10 ,  G11C7/02 ,  G11C11/56 ,  G11C29/42 ,  G06F11/22 ,  G11C29/50

CPC classification number: G06F11/1044 ,  G06F11/1048 ,  G06F11/2215 ,  G11C7/02 ,  G11C11/5642 ,  G11C29/42 ,  G11C29/50004

Abstract: A self-test method of a flash memory device includes: generating input data; encoding the input data to generate an error correction code; utilizing the input data and the error correction code to simulate to read a page of a flash memory of the flash memory device to generate soft information; and decoding the soft information to generate a decoding result.

公开(公告)号：US20170222659A1

公开(公告)日：2017-08-03

申请号：US15012872

申请日：2016-02-02

Applicant: Silicon Motion Inc.

Inventor： Chen-Yu Weng

IPC: H03M13/11 ,  H03M13/00

CPC classification number: H03M13/1111 ,  H03M13/1128

Abstract: A method for decoding low-density parity check data to decode a codeword is disclosed. The method includes: receiving initial estimates representing a codeword from variable nodes; sending the initial estimates to corresponding check nodes; using all initial estimates to calculate a posteriori probability (APP) values and extrinsic information and sending the APP values and the extrinsic information to the variable nodes; monitoring the extrinsic information (branch information?) received at the check nodes; when the extrinsic information begins to converge, activating a syndrome check for the values at the variable nodes; and when the syndrome check equals zero, activating early termination for the decoding process.

公开(公告)号：US20150155058A1

公开(公告)日：2015-06-04

申请号：US14551060

申请日：2014-11-23

Applicant: Silicon Motion Inc.

Inventor： Chen-Yu Weng

IPC: G11C29/48 ,  G06F11/10

CPC classification number: G06F11/1044 ,  G06F11/1048 ,  G06F11/2215 ,  G11C7/02 ,  G11C11/5642 ,  G11C29/42 ,  G11C29/50004

Abstract: A self-test method of a flash memory device includes: generating input data; encoding the input data to generate an error correction code; utilizing the input data and the error correction code to simulate to read a page of a flash memory of the flash memory device to generate soft information; and decoding the soft information to generate a decoding result.

Abstract translation: 闪存器件的自检方法包括：产生输入数据; 编码输入数据以产生纠错码; 利用所述输入数据和所述纠错码来模拟所述闪速存储器件的闪速存储器的页面以产生软信息; 并解码软信息以产生解码结果。