公开(公告)号：US20180181179A1

公开(公告)日：2018-06-28

申请号：US15387680

申请日：2016-12-22

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Venkateswar Reddy Kowkutla ,  Chunhua Hu ,  Erkan Bilhan ,  Sumant Dinkar Kale

IPC: G06F1/28

CPC classification number: G06F1/24 ,  G06F1/28

Abstract: A functional safety POR system requires implementing voltage detectors and supervisory functions in a complex SOC. These features are implemented within the SOC without external components. Three stages of voltage monitoring are implemented to ensure redundancy.

公开(公告)号：US20170184662A1

公开(公告)日：2017-06-29

申请号：US15275694

申请日：2016-09-26

Applicant: Texas Instruments Incorporated

Inventor： Devanathan Varadarajan ,  Sumant Dinkar Kale

IPC: G01R31/28 ,  G06F11/20 ,  G11C29/12

CPC classification number: G11C29/4401 ,  G01R31/2851 ,  G06F11/2017 ,  G11C29/12 ,  G11C29/44 ,  G11C29/70 ,  G11C29/702 ,  G11C29/72 ,  G11C29/787 ,  G11C29/838 ,  G11C2029/0401

Abstract: A large-scale integrated circuit with built-in self-repair (BISR) circuitry for enabling redundancy repair for embedded memories in each of a plurality of processor cores with embedded built-in self-test (BIST) circuitry. The BISR circuitry receives and decodes BIST data from the embedded memories into fail signature data in a physical-aware form on which repair analysis can be performed. The fail signature data is reformatted into a unified repair format, such that a fuse encoder circuit can be used to encode fuse patterns in that unified repair format for a repair entity for each of the embedded memories. The fuse patterns are reconfigured into the appropriate order for storing in shadow fuse registers associated with the specific embedded memories.