Centralized built-in soft-repair architecture for integrated circuits with embedded memories

    公开(公告)号:US10134483B2

    公开(公告)日:2018-11-20

    申请号:US15275694

    申请日:2016-09-26

    Abstract: A large-scale integrated circuit with built-in self-repair (BISR) circuitry for enabling redundancy repair for embedded memories in each of a plurality of processor cores with embedded built-in self-test (BIST) circuitry. The BISR circuitry receives and decodes BIST data from the embedded memories into fail signature data in a physical-aware form on which repair analysis can be performed. The fail signature data is reformatted into a unified repair format, such that a fuse encoder circuit can be used to encode fuse patterns in that unified repair format for a repair entity for each of the embedded memories. The fuse patterns are reconfigured into the appropriate order for storing in shadow fuse registers associated with the specific embedded memories.

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