公开(公告)号：US12222388B2

公开(公告)日：2025-02-11

申请号：US18488936

申请日：2023-10-17

Applicant: Tektronix, Inc.

Inventor： Pirooz Hojabri ,  Joshua J. O'Brien ,  Gregory A. Martin ,  Patrick Satarzadeh ,  Karen Hovakimyan

IPC: G01R31/317 ,  G01R31/28 ,  G01R31/3187 ,  G01R31/319

Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.

公开(公告)号：US11146298B2

公开(公告)日：2021-10-12

申请号：US16588580

申请日：2019-09-30

Applicant: Tektronix, Inc.

Inventor： Gregory A. Martin

IPC: H04B1/04

Abstract: A signal generator device includes a digital signal waveform generator to produce a digital signal waveform, a first frequency band signal path having a first frequency band filter to receive the digital signal waveform and to pass first frequency band components of the digital signal waveform, and a first digital-to-analog converter to receive the first frequency band components of the digital signal waveform and to produce a first frequency band analog signal, a second frequency band signal path having a second frequency band filter to receive the digital signal waveform and to pass second frequency band components of the digital signal waveform, a second digital-to-analog converter to receive the second frequency band components of the digital signal waveform and to produce a second frequency band analog signal, and a combining element to combine the first frequency band analog signal and the second frequency band analog signal to produce a wideband analog signal. A method of generating a wideband analog signal includes generating a digital waveform, splitting the digital waveform into at least a first frequency band signal and a second frequency band signal, converting the first frequency band signal into a first frequency band analog signal, converting the second frequency band signal into a second frequency analog signal, and combining the first frequency band analog signal with the second frequency band analog signal to produce the wideband analog signal.

公开(公告)号：US20210270893A1

公开(公告)日：2021-09-02

申请号：US17324007

申请日：2021-05-18

Applicant: Tektronix, Inc.

Inventor： Pirooz Hojabri ,  Joshua J. O'Brien ,  Gregory A. Martin ,  Patrick Satarzadeh ,  Karen Hovakimyan

IPC: G01R31/317 ,  G01R31/28 ,  G01R31/3187 ,  G01R31/319

Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.

公开(公告)号：US10735013B2

公开(公告)日：2020-08-04

申请号：US16526875

申请日：2019-07-30

Applicant: Tektronix, Inc.

Inventor： Karen Hovakimyan ,  Gregory A. Martin ,  Daniel G. Knierim

IPC: H03M1/10 ,  H03M1/84

Abstract: A time-interleaved digital-to-analog converter system, comprising a digital pre-distorter configured to receive an input digital signal and an error signal and output a distorted digital signal based on the input digital signal and the error signal; a time-interleaved digital-to-analog converter having a first sample rate, the time-interleaved digital-to-analog converter configured to convert the distorted digital signal to an analog signal; and a calibration system. The calibration system includes an analog-to-digital converter having a second sample rate equal to or lower than the first sample rate, the analog-to-digital converter configured to receive the analog signal and covert the analog signal to a down-sampled digital signal, a discrete-time linear model configured to receive the input digital signal and the error signal and output a model signal, and a combiner to subtract the down-sampled digital signal from the model signal to generate the error signal.

公开(公告)号：US20200212926A1

公开(公告)日：2020-07-02

申请号：US16588613

申请日：2019-09-30

Applicant: Tektronix, Inc.

Inventor： Gregory A. Martin ,  Pirooz Hojabri

IPC: H03M1/66

Abstract: A signal source device includes at least one digital-to-analog converter, at least one connector, a first output path from the at least one digital-to-analog converter to the at least one connector, and a second output path from the at least one digital-to-analog converter to the at least one connector. A method of generating a analog signal includes generating at least one analog signal from at least one digital-to-analog converter, transmitting a first analog signal of the at least one analog signal along a first output path from the at least one digital-to-analog converter to at least one connector, and transmitting a second analog signal of the at least one analog signal along a second output path from the at least one digital-to-analog converter to the at least one connector.

公开(公告)号：US20190383873A1

公开(公告)日：2019-12-19

申请号：US16440944

申请日：2019-06-13

Applicant: TEKTRONIX, INC.

Inventor： Pirooz Hojabri ,  Joshua O'Brien ,  Gregory A. Martin ,  Patrick Satarzadeh ,  Karen Hovakimyan

IPC: G01R31/317 ,  G01R31/319 ,  G01R31/3187 ,  G01R31/28

Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.

公开(公告)号：US09529017B2

公开(公告)日：2016-12-27

申请号：US14178684

申请日：2014-02-12

Applicant: TEKTRONIX, INC.

Inventor： Gregory A. Martin ,  David D. Farrell ,  Evan A. Dickinson

IPC: G06T11/20 ,  G01R13/02 ,  G09G5/02

CPC classification number: G01R13/02 ,  G01R13/0227 ,  G06T11/203 ,  G09G5/02

Abstract: A test and measurement instrument and method of switching waveform display styles includes acquiring an electrical signal, storing peak detect data samples from the electrical signal to one or more memory devices, storing filtered data samples or unfiltered data from the electrical signal, automatically switching to a first waveform display style having the peak detect data samples configured in a first mode when a user selects the unfiltered data, and automatically switching to a second waveform display style having the peak detect data samples configured in a second mode when the user selects the filtered data samples.

Abstract translation: 用于切换波形显示样式的测试和测量仪器和方法包括获取电信号，将来自电信号的峰值检测数据样本存储到一个或多个存储器件，从电信号中存储滤波数据样本或未滤波数据，自动切换到 当用户选择未过滤的数据时，具有以第一模式配置的峰值检测数据样本的第一波形显示样式，并且当用户选择过滤数据时，自动切换到具有以第二模式配置的峰值检测数据样本的第二波形显示样式 样品。

公开(公告)号：US20140160144A1

公开(公告)日：2014-06-12

申请号：US14178684

申请日：2014-02-12

Applicant: TEKTRONIX, INC.

Inventor： Gregory A. Martin ,  David D. Farrell ,  Evan A. Dickinson

IPC: G06T11/20 ,  G09G5/02 ,  G01R13/02

CPC classification number: G01R13/02 ,  G01R13/0227 ,  G06T11/203 ,  G09G5/02

Abstract: A test and measurement instrument and method of switching waveform display styles includes acquiring an electrical signal, storing peak detect data samples from the electrical signal to one or more memory devices, storing filtered data samples or unfiltered data from the electrical signal, automatically switching to a first waveform display style having the peak detect data samples configured in a first mode when a user selects the unfiltered data, and automatically switching to a second waveform display style having the peak detect data samples configured in a second mode when the user selects the filtered data samples.

Abstract translation: 用于切换波形显示样式的测试和测量仪器和方法包括获取电信号，将来自电信号的峰值检测数据样本存储到一个或多个存储器件，从电信号中存储滤波数据样本或未滤波数据，自动切换到 当用户选择未过滤的数据时，具有以第一模式配置的峰值检测数据样本的第一波形显示样式，并且当用户选择过滤数据时，自动切换到具有以第二模式配置的峰值检测数据样本的第二波形显示样式 样品。