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公开(公告)号：US11789070B2
公开(公告)日：2023-10-17
申请号：US17324007
申请日：2021-05-18
Applicant: Tektronix, Inc.
Inventor： Pirooz Hojabri , Joshua J. O'Brien , Gregory A. Martin , Patrick Satarzadeh , Karen Hovakimyan
IPC: G06F11/00 , G01R31/317 , G01R31/28 , G01R31/3187 , G01R31/319
CPC classification number: G01R31/3171 , G01R31/2841 , G01R31/3187 , G01R31/31905
Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
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公开(公告)号：US11146280B2
公开(公告)日：2021-10-12
申请号：US16554548
申请日：2019-08-28
Applicant: Tektronix, Inc.
Inventor： Gregory A. Martin , Patrick Satarzadeh , John J. Pickerd , Daniel G. Knierim
Abstract: A test and measurement instrument including a digital-to-analog converter having an output sample rate configured to receive a digital sample waveform and a reference clock and output an analog waveform at the sample rate, a waveform synthesizer configured to receive an input waveform having a baud rate and output a digital sample waveform having a baud rate less than the sample rate of the digital-to-analog converter, and a port configured to output the analog waveform.
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公开(公告)号：US20200209307A1
公开(公告)日：2020-07-02
申请号：US16538564
申请日：2019-08-12
Applicant: Tektronix, Inc.
Inventor： Gregory A. Martin , Patrick Satarzadeh , Karen Hovakimyan , Hungming Chang
IPC: G01R31/28 , G01R31/3167 , G01R31/319 , G01R31/317
Abstract: A test and measurement device having a signal source, including an impairment generator configured to output an impairment and a waveform synthesizer. The waveform synthesizer receives an input digital signal to be synthesized, receives the impairment, and synthesizes a synthesized digital signal based on the input digital signal and the impairment. The test and measurement instrument also includes a fixed sample rate digital-to-analog converter configured to receive a clock signal and the synthesized digital signal and output an analog signal.
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公开(公告)号：US20240044975A1
公开(公告)日：2024-02-08
申请号：US18488936
申请日：2023-10-17
Applicant: Tektronix, Inc.
Inventor： Pirooz Hojabri , Joshua J. O'Brien , Gregory A. Martin , Patrick Satarzadeh , Karen Hovakimyan
IPC: G01R31/317 , G01R31/28 , G01R31/3187 , G01R31/319
CPC classification number: G01R31/3171 , G01R31/2841 , G01R31/3187 , G01R31/31905
Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
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公开(公告)号：US11237204B2
公开(公告)日：2022-02-01
申请号：US16538564
申请日：2019-08-12
Applicant: Tektronix, Inc.
Inventor： Gregory A. Martin , Patrick Satarzadeh , Karen Hovakimyan , Hungming Chang
IPC: G01R31/28 , G01R31/3167 , G01R31/317 , G01R31/319
Abstract: A test and measurement device having a signal source, including an impairment generator configured to output an impairment and a waveform synthesizer. The waveform synthesizer receives an input digital signal to be synthesized, receives the impairment, and synthesizes a synthesized digital signal based on the input digital signal and the impairment. The test and measurement instrument also includes a fixed sample rate digital-to-analog converter configured to receive a clock signal and the synthesized digital signal and output an analog signal.
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Patent Agency Ranking
公开(公告)号：US11009546B2
公开(公告)日：2021-05-18
申请号：US16440944
申请日：2019-06-13
Applicant: TEKTRONIX, INC.
Inventor： Pirooz Hojabri , Joshua O'Brien , Gregory A. Martin , Patrick Satarzadeh , Karen Hovakimyan
IPC: G01R31/317 , G01R31/319 , G01R31/3187 , G01R31/28
Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
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公开(公告)号：US20200212923A1
公开(公告)日：2020-07-02
申请号：US16554548
申请日：2019-08-28
Applicant: Tektronix, Inc.
Inventor： Gregory A. Martin , Patrick Satarzadeh , John J. Pickerd , Daniel G. Knierim
Abstract: A test and measurement instrument including a digital-to-analog converter having an output sample rate configured to receive a digital sample waveform and a reference clock and output an analog waveform at the sample rate, a waveform synthesizer configured to receive an input waveform having a baud rate and output a digital sample waveform having a baud rate less than the sample rate of the digital-to-analog converter, and a port configured to output the analog waveform.
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公开(公告)号：US12222388B2
公开(公告)日：2025-02-11
申请号：US18488936
申请日：2023-10-17
Applicant: Tektronix, Inc.
Inventor： Pirooz Hojabri , Joshua J. O'Brien , Gregory A. Martin , Patrick Satarzadeh , Karen Hovakimyan
IPC: G01R31/317 , G01R31/28 , G01R31/3187 , G01R31/319
Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
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公开(公告)号：US20210270893A1
公开(公告)日：2021-09-02
申请号：US17324007
申请日：2021-05-18
Applicant: Tektronix, Inc.
Inventor： Pirooz Hojabri , Joshua J. O'Brien , Gregory A. Martin , Patrick Satarzadeh , Karen Hovakimyan
IPC: G01R31/317 , G01R31/28 , G01R31/3187 , G01R31/319
Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
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公开(公告)号：US20190383873A1
公开(公告)日：2019-12-19
申请号：US16440944
申请日：2019-06-13
Applicant: TEKTRONIX, INC.
Inventor： Pirooz Hojabri , Joshua O'Brien , Gregory A. Martin , Patrick Satarzadeh , Karen Hovakimyan
IPC: G01R31/317 , G01R31/319 , G01R31/3187 , G01R31/28
Abstract: A test and measurement device includes an input configured to receive an analog signal from a Device Under Test (DUT), an Analog to Digital Converter (ADC) coupled to the input and structured to convert the analog signal to a digital signal, a receiver implemented in a first Field Programmable Gate Array (FPGA) and structured to accept the digital signal and perform signal analysis on the digital signal, a transmitter implemented in a second FPGA and structured to generate a digital output signal, and a Digital to Analog Converter (DAC) coupled to the transmitter and structured to convert the digital output signal from the transmitter to an analog signal, and structured to send the analog signal to the DUT. The receiver and the transmitter are coupled together by a high speed data link over which data about the current testing environment may be shared.
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