公开(公告)号：US20220034967A1

公开(公告)日：2022-02-03

申请号：US17375451

申请日：2021-07-14

Applicant: Tektronix, Inc.

Inventor： Sam J. Strickling ,  Daniel S. Froelich ,  Michelle L. Baldwin ,  Jonathan San ,  Lin-Yung Chen ,  Shane A. Hazzard

IPC: G01R31/319 ,  G01R31/3185

Abstract: A calibrated test and measurement cable for connecting one or more devices under test and a test and measurement instrument, including a first port structured to electrically connect to a first signal lane, a second port structured to electrically connect to a second signal lane, a third port structured to electrically connect to a test and measurement instrument, and a multiplexer configured to switch between electrically connecting the first port to the third port and connected the second port to the third port. The first and second signal lanes can be included on the same device under test or different devices under test. An input can receive instructions to operate the multiplexer.

公开(公告)号：US20210297882A1

公开(公告)日：2021-09-23

申请号：US17207091

申请日：2021-03-19

Applicant: Tektronix, Inc.

Inventor： Sam J. Strickling ,  Andrew McCann ,  Daniel S. Froelich ,  Michelle L. Baldwin ,  Jonathan San ,  Lin-Yung Chen

IPC: H04W24/08 ,  G01R35/00

Abstract: Systems and methods for automated recognition of a device under test and retrieving data associated with the device under test based on the recognition. The systems and methods include receiving a recognition key based on an identifying characteristic of the device under test, matching the received recognition key to a stored key in a database, retrieving data related to the stored key when the received recognition key matches the stored key, transmitting instructions to perform an action on a test and measurement device based on the retrieved data, receiving new data related to the device under test, and updating the data in the database related to the stored key with the new data.