利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

382 条记录 (耗时 0.035 秒)

    Contact material for vacuum valve
    14.
    发明授权
    Contact material for vacuum valve 失效
    真空阀的接触材料

    公开(公告)号：US5409519A

    公开(公告)日：1995-04-25

    申请号：US69104

    申请日：1993-05-28

    申请人： Tsuneyo Seki ,  Tsutomu Okutomi ,  Atsushi Yamamoto

    发明人： Tsuneyo Seki ,  Tsutomu Okutomi ,  Atsushi Yamamoto

    IPC分类号： B22F5/00 ,  C22C5/06 ,  C22C9/00 ,  C22C30/00 ,  H01H1/02 ,  H01H11/04 ,  H01H33/66 ,  C22C30/02

    CPC分类号： H01H1/0203

    摘要： A contacts material for a vacuum valve including an arc-proof constituent having at least one component selected from the group consisting of tantalum, niobium, tungsten and molybdenum and an auxiliary constituent having at least one component selected from the group consisting of chromium, titanium, yttrium, zirconium, cobalt and vanadium. The contact material further includes a conductive constituent having at least one component selected from the group consisting of copper and silver. The amount of the arc-proof constituent is from 25% to 75% by volume. The total amount of the arc-proof constituent together with the auxiliary constituent is no more than 75% by volume. The amount of the conductive constituent is the balance.

    摘要翻译： 一种用于真空阀的接触材料，其包括具有至少一种选自钽，铌，钨和钼的组分的电弧组分和具有至少一种选自铬，钛， 钇，锆，钴和钒。 接触材料还包括具有至少一种选自铜和银的组分的导电组分。 防弧成分的量为25体积％〜75体积％。 防电弧成分与辅助成分的总量不超过75体积％。 导电成分的量是余量。

    Contact electrode for vacuum interrupter
    18.
    发明授权
    Contact electrode for vacuum interrupter 失效
    真空灭弧室接触极

    公开(公告)号：US5726407A

    公开(公告)日：1998-03-10

    申请号：US611000

    申请日：1996-03-07

    申请人： Tsutomu Okutomi ,  Tsuneyo Seki ,  Atsushi Yamamoto

    发明人： Tsutomu Okutomi ,  Tsuneyo Seki ,  Atsushi Yamamoto

    IPC分类号： H01H33/66 ,  H01H1/02 ,  H01H1/023 ,  H01H1/025 ,  H01H11/04

    CPC分类号： H01H1/0203 ,  H01H33/66261 ,  H01H33/664

    摘要： A contact electrode for a vacuum interrupter including a conductive component having at least one selected from the group consisting of copper and silver, and an arc-proof component with a melting temperature of more than 1500.degree. C. In the contact electrode, a gradient A/X of a quantity of a composition component of the contact electrode on a surface or the contact electrode is 0.2-12 volume %/mm. Where, X1 is one point on the line of any radius R1 on the surface of the contact electrode, X2 is another point on the line of the radius R1 on the surface of the contact electrode, and X is a gap between the one point X1 and the another point X2 measured by mm, where X=X2-X1, and X2>X1 .gtoreq.0. A1 is a quantity of the composition component measured by volume % in the contact electrode at the one point X1, A2 is a quantity of the composition component measured by volume % in the contact electrode at the another point X2 and A is a difference between the quantities A1 and A2 of the composition component measured by volume %, where A=A2-A1.

    摘要翻译： 一种用于真空断路器的接触电极，包括具有选自铜和银中的至少一种的导电组分和熔点高于1500℃的耐电弧组分。在接触电极中，梯度A 表面或接触电极上的接触电极的组成成分的量的/ X为0.2-12体积％/ mm。 其中，X1是接触电极表面上的任何半径R1的线上的一点，X2是接触电极表面上的半径R1的线上的另一点，X是一点X1之间的间隙 另一个点X2由mm测量，其中X = X2-X1，X2> X1> / = 0。 A1是在一点X1处的接触电极中的体积％的量的组成成分的量，A2是在另一点X2处的接触电极中的体积％测定的组成成分的量，A是在 组分成分的量A1和A2以体积％测定，其中A = A2-A1。

    Contacts material for vacuum valve
    19.
    发明授权
    Contacts material for vacuum valve 失效
    真空阀触点材料

    公开(公告)号：US5500499A

    公开(公告)日：1996-03-19

    申请号：US181085

    申请日：1994-01-13

    申请人： Tsuneyo Seki ,  Tsutomu Okutomi ,  Atsushi Yamamoto

    发明人： Tsuneyo Seki ,  Tsutomu Okutomi ,  Atsushi Yamamoto

    IPC分类号： H01H1/02 ,  H01H33/66

    CPC分类号： H01H1/0203

    摘要： A contacts material for a vacuum valve including an arc-proof constituent including at least one selected from the group of chromium, titanium, zirconium, vanadium and yttrium, an auxiliary constituent including at least one selected from the group of tantalum, niobium, tungsten and molybdenum and a conductive constituent including at least one selected from the group of copper and silver. In the contacts material, an amount of the arc-proof constituent is from 10% to 70% by volume, a total amount of the arc-proof constituent together with the auxiliary constituent is not more than 75% by volume and an amount of the conductive constituent is the balance.

    摘要翻译： 一种用于真空阀的接触材料，包括含有选自铬，钛，锆，钒和钇中的至少一种的防弧构件，包括选自钽，铌，钨中的至少一种的辅助成分和 钼和包含选自铜和银中的至少一种的导电成分。 在触点材料中，防电弧成分的量为10体积％〜70体积％，防弧成分与辅助成分的总量为75体积％以下， 导电成分是平衡。

    Vacuum interrupter and vacuum switch thereof
    20.
    发明授权
    Vacuum interrupter and vacuum switch thereof 有权
    真空灭弧室及其真空开关

    公开(公告)号：US06346683B1

    公开(公告)日：2002-02-12

    申请号：US09495317

    申请日：2000-02-01

    申请人： Tsutomu Okutomi ,  Takashi Kusano ,  Iwao Ohshima ,  Mitsutaka Homma ,  Atsushi Yamamoto ,  Takanobu Nishimura

    发明人： Tsutomu Okutomi ,  Takashi Kusano ,  Iwao Ohshima ,  Mitsutaka Homma ,  Atsushi Yamamoto ,  Takanobu Nishimura

    IPC分类号： H01H3366

    CPC分类号： H01H1/0203

    摘要： {W—CuxSb-balance Cu} alloy is employed for contacts. As the anti-arcing constituent in the alloy W or WMo in a content of 65 to 85%, of grain diameter 0.4 to 9 &mgr;m is employed. As auxiliary constituent, CuxSb is employed, the content of the CuxSb being 0.09 to 1.4 weight %, the x being x=1.9 to 5.5, the grain diameter being 0.02 to 20 &mgr;m, and the mean distance between grains being 0.2 to 300 &mgr;m. As conductive constituent, Cu or CuSb solid solution is employed, the Sb content present in solid solution form in the CuSb solid solution being less than 0.5%. As a result, not only is dispersion of CuxSb, which is evaporated on subjection to arcing, reduced, but also generation of severe cracks, which have an adverse effect in terms of occurrence of restriking. Arcing at the contacts surfaces is prevented, suppressing dispersion and exfoliation of W grains. In this way, damage due to melting and dispersion at the contacts surfaces is reduced, enabling both restriking to be prevented and the contact resistance characteristic to be improved.

    摘要翻译： {W-CuxSb-余量Cu}合金用于接触。 由于合金W或WMo中抗弧成分含量为65〜85％，粒径为0.4〜9μm。 作为辅助成分，使用CuxSb，CuxSb的含量为0.09〜1.4重量％，x为x = 1.9〜5.5，粒径为0.02〜20μm，晶粒间的平均距离为0.2〜300μm。 作为导电成分，使用Cu或CuSb固溶体，CuSb固溶体中以固溶体形式存在的Sb含量小于0.5％。 结果是，不仅在电弧放电时蒸发的CuxSb的分散减少，而且产生严重的裂纹，这在再起弧的发生方面具有不利的影响。 防止了在接触表面的电弧，抑制了W晶粒的分散和剥落。 以这种方式，由于触点表面的熔化和分散而导致的损坏减少，从而能够防止再起弧，并且提高接触电阻特性。