摘要:
The present invention is a device for detecting short burst errors. The device includes a first signal input, wherein the first signal input is configured to receive a first signal. The device includes a second signal input, wherein the second signal input is configured to receive a second signal. The device includes a logic gate, wherein the logic gate is operable for receiving the first signal vial the first signal input, receiving the second signal via the second signal input, and generating a logic output gate signal based on the received first signal and the second signal. Furthermore, the device includes a filter, wherein the filter is configured for receiving the logic output gate signal from the logic gate and generates a filter output signal based upon the received logic output gate signal, wherein the filter output signal is operable for flagging errors.
摘要:
A system, method, and device for detecting short burst errors in a queue-based system is disclosed. A first detector performs a data detection on a first input data set at a first time and on a second input data set at a second time. A second detector performs a data re-detection on input data sets. A decoder decodes derivations of the outputs of the first and second detector. A short burst error detector may perform a short burst error detection on decoded data and erase any detected errors. An output data buffer stores and orders the decoded data for output.
摘要:
Various embodiments of the present invention provide systems and methods for flaw scan in a data processing system. As one example, a data processing system is disclosed that includes a data detector circuit, a bit sign inverting circuit, and an LDPC decoder circuit. The data detector circuit receives a verification data set that is an invalid LDPC codeword, and applies a data detection algorithm to the verification data set to yield a detected output. The bit sign inverting circuit modifies the sign of one or more elements of a first derivative of the detected output to yield a second derivative of the detected output. The second derivative of the detected output is an expected valid LDPC codeword. The LDPC decoder circuit applies a decoding algorithm to the second derivative of the detected output to yield a decoded output.
摘要:
Various embodiments of the present invention provide systems and methods for validating elements of storage devices. A an example, various embodiments of the present invention provide semiconductor devices that include a write path circuit, a read path circuit and a validation circuit. The write path circuit is operable to receive a data input and to convert the data input into write data suitable for storage to a storage medium. The read path circuit is operable to receive read data and to convert the read data into a data output. The validation circuit is operable to: receive the write data, augment the write data with a first noise sequence to yield a first augmented data series; and augment a derivative of the first augmented data series with a second noise sequence to yield the read data.
摘要:
Various embodiments of the present invention provide systems and methods for detecting storage medium defects. As one example, a media defect detection system is disclosed that includes a data detector circuit that applies a detection algorithm to the data input and provides a hard output and a soft output. A first circuit combines a first derivative of the hard output with a derivative of the data input to yield a first combined signal. A second circuit combines a second derivative of the hard output with a derivative of the first combined signal to yield a second combined signal. A third circuit combines a derivative of the soft output with the second combined signal and a threshold value to yield a defect signal.
摘要:
The present invention is a device for detecting short burst errors. The device includes a first signal input, wherein the first signal input is configured to receive a first signal. The device includes a second signal input, wherein the second signal input is configured to receive a second signal. The device includes a logic gate, wherein the logic gate is operable for receiving the first signal vial the first signal input, receiving the second signal via the second signal input, and generating a logic output gate signal based on the received first signal and the second signal. Furthermore, the device includes a filter, wherein the filter is configured for receiving the logic output gate signal from the logic gate and generates a filter output signal based upon the received logic output gate signal, wherein the filter output signal is operable for flagging errors.
摘要:
In one embodiment, irregular electronic disturbance signals in a partial-response read channel are detected by a disturbance detector using state metrics generated by maximum-likelihood sequence detector. For example, a thermal asperity (TA) detector detects the occurrence of TAs in the read channel of perpendicularly recorded magnetic media by using the state metrics generated by a Viterbi detector. Changes in state metrics (e.g., magnitudes of the branch metrics of the trellis diagram) used by the Viterbi detector are tracked. If the magnitude of the rise of the path metric increases above a set threshold, then a TA is detected. Alternatively, or additionally, the rate of change of the magnitude of the path metrics is tracked. If the rate of change within a set time window is above a specified threshold, then a TA is detected.
摘要:
In one embodiment, irregular electronic disturbance signals in a partial-response read channel are detected by a disturbance detector using state metrics generated by maximum-likelihood sequence detector. For example, a thermal asperity (TA) detector detects the occurrence of TAs in the read channel of perpendicularly recorded magnetic media by using the state metrics generated by a Viterbi detector. Changes in state metrics (e.g., magnitudes of the branch metrics of the trellis diagram) used by the Viterbi detector are tracked. If the magnitude of the rise of the path metric increases above a set threshold, then a TA is detected. Alternatively, or additionally, the rate of change of the magnitude of the path metrics is tracked. If the rate of change within a set time window is above a specified threshold, then a TA is detected.
摘要:
Various embodiments of the present invention provide systems and methods for data processing. As an example, a data processing circuit having a data detection circuit is disclosed that includes: a scaling circuit, a soft output calculation circuit, and a factor calculation circuit. The scaling circuit is operable to scale a branch metric value by a scaling factor to yield a scaled output. The soft output calculation circuit is operable to calculate a soft output based at least in part on the scaled output. The factor calculation circuit operable to modify the scaling factor based at least in part on the soft output.
摘要:
Various embodiments of the present invention provide systems and methods for data processing. As an example, a data processing circuit having a data detection circuit is disclosed that includes: a scaling circuit, a soft output calculation circuit, and a factor calculation circuit. The scaling circuit is operable to scale a branch metric value by a scaling factor to yield a scaled output. The soft output calculation circuit is operable to calculate a soft output based at least in part on the scaled output. The factor calculation circuit operable to modify the scaling factor based at least in part on the soft output.