Cross-decoding for non-volatile storage
    1.
    发明授权
    Cross-decoding for non-volatile storage 有权
    用于非易失性存储的交叉解码

    公开(公告)号:US08719663B2

    公开(公告)日:2014-05-06

    申请号:US13323769

    申请日:2011-12-12

    申请人: Yan Li Hao Zhong

    发明人: Yan Li Hao Zhong

    IPC分类号: G11C29/00

    摘要: Cross-decoding assists decoding of an otherwise uncorrectable error when decoding a desired page of a multi-level-cell technology flash memory. A solid-state disk (SSD) controller adjusts space allocated to redundancy respectively within various pages (e.g. upper, middle, and lower pages) such that the respective pages have respective effective Bit Error Rates (BER)s, optionally including cross-decoding, that approach one another. Alternatively the controller adjusts the allocation to equalize decoding time (or alternatively access time), optionally including decoding time (accessing time) accrued as a result of cross-decoding when there is an otherwise uncorrectable error. The adjusting is via (a) respective ratios between allocation for ECC redundancy and user data space, and/or (b) respective coding rates and/or coding techniques for each of the various pages. Alternatively the controller adjusts the allocation to maximize total usable capacity by allocating to redundancy and data for the various pages, assuming that cross-decoding is to be used.

    摘要翻译: 当对多级单元技术闪存的期望页进行解码时,交叉解码协助解码否则不可校正的错误。 固态盘(SSD)控制器分别在各种页面(例如,上,中,下页)中调整分配给冗余的空间,使得各页具有相应的有效误码率(BER),可选地包括交叉解码, 相互接近 或者,控制器调整分配以均衡解码时间(或者可选地,访问时间),可选地包括当存在否则不可校正的错误时由于交叉解码而产生的解码时间(访问时间)。 调整是通过(a)用于ECC冗余的分配和用户数据空间之间的相应比率,和/或(b)各种页面中的每一个的相应编码率和/或编码技术。 或者,控制器通过分配冗余和各种页面的数据来调整分配以最大化总可用容量,假设要使用交叉解码。

    Selectively strengthening and weakening check-node messages in error-correction decoders
    2.
    发明授权
    Selectively strengthening and weakening check-node messages in error-correction decoders 有权
    在纠错解码器中选择性地加强和削弱校验节点消息

    公开(公告)号:US08245098B2

    公开(公告)日:2012-08-14

    申请号:US12538915

    申请日:2009-08-11

    IPC分类号: H03M13/00 G06F11/10

    摘要: In one embodiment, an LDPC decoder has a plurality of check-node units (CNUs) and a controller. Initially, the CNUs generate check-node messages based on an initial offset value selected by the controller. If the decoder converges on a trapping set, then the controller selects new offset values for missatisfied check nodes (MSCs), the locations of which are approximated, and/or unsatisfied check nodes (USCs). In particular, offset values are selected such that (i) the messages corresponding to the MSCs are decreased relative to the messages that would be generated using the initial offset value and/or (ii) the messages corresponding to the USCs are increased relative to the messages that would be generated using the initial offset value. Decoding is then continued for a specified number of iterations to break the trapping set. In other embodiments, the controller selects scaling factors rather than, or in addition to, offset values.

    摘要翻译: 在一个实施例中,LDPC解码器具有多个校验节点单元(CNU)和控制器。 最初,CNU基于由控制器选择的初始偏移值生成校验节点消息。 如果解码器收敛于陷阱集合,则控制器为不满意的校验节点(MSC)(其位置近似)和/或不满足的校验节点(USC)选择新的偏移值。 特别地,选择偏移值,使得(i)相对于MSC的消息相对于将使用初始偏移值生成的消息减少和/或(ii)相对于USC的消息相对于 将使用初始偏移值生成的消息。 然后继续解码指定数量的迭代以打破陷阱集。 在其他实施例中,控制器选择缩放因子,而不是或附加于偏移值。

    Systems and methods for storage channel testing
    3.
    发明授权
    Systems and methods for storage channel testing 有权
    存储通道测试的系统和方法

    公开(公告)号:US07990642B2

    公开(公告)日:2011-08-02

    申请号:US12425757

    申请日:2009-04-17

    IPC分类号: G11B27/36

    CPC分类号: G11B20/182 G11B2220/2516

    摘要: Various embodiments of the present invention provide systems and methods for validating elements of storage devices. A an example, various embodiments of the present invention provide semiconductor devices that include a write path circuit, a read path circuit and a validation circuit. The write path circuit is operable to receive a data input and to convert the data input into write data suitable for storage to a storage medium. The read path circuit is operable to receive read data and to convert the read data into a data output. The validation circuit is operable to: receive the write data, augment the write data with a first noise sequence to yield a first augmented data series; and augment a derivative of the first augmented data series with a second noise sequence to yield the read data.

    摘要翻译: 本发明的各种实施例提供用于验证存储设备的元件的系统和方法。 作为示例,本发明的各种实施例提供包括写入路径电路,读取路径电路和验证电路的半导体器件。 写入路径电路可操作用于接收数据输入并将数据输入转换成适合于存储的写数据到存储介质。 读路径电路可操作以接收读数据并将读数据转换为数据输出。 验证电路可操作以:接收写入数据,用第一噪声序列增加写入数据以产生第一增强数据序列; 并且用第二噪声序列来增加第一增强数据序列的导数以产生读取的数据。

    Programmable quasi-cyclic low-density parity check (QC LDPC) encoder for read channel
    5.
    发明申请
    Programmable quasi-cyclic low-density parity check (QC LDPC) encoder for read channel 有权
    用于读通道的可编程准循环低密度奇偶校验(QC LDPC)编码器

    公开(公告)号:US20100100788A1

    公开(公告)日:2010-04-22

    申请号:US12288221

    申请日:2008-10-17

    IPC分类号: H03M13/27 G06F11/10

    摘要: The present invention is a programmable QC LDPC encoder for encoding user data. The encoder may be configurable for implementation with a read channel. The encoder may include a plurality of barrel shifter circuits. The barrel shifter circuits are configured for generating a plurality of parity bits based on interleaved user bits received by the encoder. The barrel shifter circuits are further configured for outputting the parity bits. The encoder may further include an encoder interleaver memory. The encoder interleaver memory may be communicatively coupled with the barrel shifter circuits and may receive the parity bits output from the barrel shifter circuits. The encoder interleaver may be configured for interleaving the parity bits. Further, the encoder may be configured for outputting the interleaved parity bits to a multiplexer. The barrel shifter circuits may generate the plurality of parity bits via an encoding algorithm: p=u*GT.

    摘要翻译: 本发明是用于编码用户数据的可编程QC LDPC编码器。 编码器可以被配置为用读通道实现。 编码器可以包括多个桶形移位器电路。 桶形移位器电路被配置为基于由编码器接收的交织的用户比特生成多个奇偶校验位。 桶形移位器电路还被配置为输出奇偶校验位。 编码器还可以包括编码器交织器存储器。 编码器交织器存储器可以与桶形移位器电路通信耦合,并且可以接收从桶形移位器电路输出的奇偶校验位。 编码器交织器可以被配置为交织奇偶校验位。 此外,编码器可以被配置为将交错的奇偶校验位输出到多路复用器。 桶形移位器电路可以通过编码算法生成多个奇偶校验位:p = u * GT。

    Measuring cell damage for wear leveling in a non-volatile memory
    8.
    发明授权
    Measuring cell damage for wear leveling in a non-volatile memory 有权
    在非易失性存储器中测量电容器损坏

    公开(公告)号:US09329948B2

    公开(公告)日:2016-05-03

    申请号:US13620982

    申请日:2012-09-15

    摘要: An NVM controller measures cell damage for wear leveling in an NVM, thus improving performance, reliability, lifetime, and/or cost of a storage sub-system, such as an SSD. In a first aspect, the controller determines that an error reading a page of NVM was caused by cell damage and/or cell leakage. The controller reprograms and immediately reads back the page, detecting that the error was caused by cell damage if an error is detected during the immediate read. In a second aspect, the cell damage is tracked by updating cell damage counters for pages and/or blocks of NVM. In a third aspect, wear leveling is performed based at least in part upon measured cell damage for pages and/or blocks of NVM.

    摘要翻译: NVM控制器测量NVM中磨损均衡的单元损坏,从而提高存储子系统(如SSD)的性能,可靠性,寿命和/或成本。 在第一方面,控制器确定读取NVM的页面的错误是由于单元损坏和/或单元泄漏引起的。 控制器重新编程并立即读回页面,如果在立即读取期间检测到错误,则检测到错误是由单元损坏引起的。 在第二方面,通过更新针对NVM的页面和/或块的单元损坏计数器跟踪单元损坏。 在第三方面,至少部分地基于对NVM的页面和/或块的所测量的单元损坏来执行损耗均衡。

    MEASURING CELL DAMAGE FOR WEAR LEVELING IN A NON-VOLATILE MEMORY
    9.
    发明申请
    MEASURING CELL DAMAGE FOR WEAR LEVELING IN A NON-VOLATILE MEMORY 有权
    测量非易失性存储器中的磨损细胞损伤

    公开(公告)号:US20140082459A1

    公开(公告)日:2014-03-20

    申请号:US13620982

    申请日:2012-09-15

    IPC分类号: G06F11/16

    摘要: An NVM controller measures cell damage for wear leveling in an NVM, thus improving performance, reliability, lifetime, and/or cost of a storage sub-system, such as an SSD. In a first aspect, the controller determines that an error reading a page of NVM was caused by cell damage and/or cell leakage. The controller reprograms and immediately reads back the page, detecting that the error was caused by cell damage if an error is detected during the immediate read. In a second aspect, the cell damage is tracked by updating cell damage counters for pages and/or blocks of NVM. In a third aspect, wear leveling is performed based at least in part upon measured cell damage for pages and/or blocks of NVM.

    摘要翻译: NVM控制器测量NVM中磨损均衡的单元损坏,从而提高存储子系统(如SSD)的性能,可靠性,寿命和/或成本。 在第一方面,控制器确定读取NVM的页面的错误是由于单元损坏和/或单元泄漏引起的。 控制器重新编程并立即读回页面,如果在立即读取期间检测到错误,则检测到错误是由单元损坏引起的。 在第二方面,通过更新针对NVM的页面和/或块的单元损坏计数器跟踪单元损坏。 在第三方面,至少部分地基于对NVM的页面和/或块的所测量的单元损坏来执行损耗均衡。