Abstract:
The invention pertains to a calibration layer comprising an optically transparent polymer containing an amount of photobleachable luminscent material present in such a way that the final polymer film contains less than 10 wt. % of luminophore and has an optical attenuation of less than 0.3 absorption units in the wavelength region of interest. The invention further is concerned with a method of calibration of an optical image device, preferably an optical or Raman microscope, by using the decrease in luminescence as the result of photobleaching between two consecutive images for calibration.
Abstract:
The present invention is a method for providing a disk of an optical tester. The disk comprises a transparent substrate that has a first surface and an opposite second surface. The disk also includes a coating on the first surface of the transparent substrate. An identical coating can be applied to the second surface of the transparent substrate. The coating can have multiple layers of thin films. The present invention provides a method to determine the required thickness of the coating to enhance the sensitivity of zero flying height measurement.
Abstract:
Equipment for detecting impurities in transparent material comprising a light source to illuminate the material, a camera to detect light transmitted through the material and signal-processing apparatus for processing and analysing signals from the camera representing the light transmission through the material. This type of equipment is calibrated by dark areas being displayed on a film of transparent material (22, 24, 26) and the actual sizes (30) of the areas being determined. The sizes of the dark areas are then determined using the detecting equipment (34) and in this way determined sizes are compared with actual sizes (36) for calibration of the detecting equipment (38).
Abstract:
An optical reference signal with a gas sealed in a space, an optical fiber and a lens collecting the light beam exiting the optical fiber before the front end of the space and a photodetector at the back end of the space, which can be connected with an evaluation device. Such an optical reference element makes it possible to use cost-effective and readily available components to provide a reference signal for calibrating an optical spectrum analyzer, for example. The optical reference element is connected to the output of the optical device.
Abstract:
The present invention provides SEM systems, SEM calibration standards, and SEM calibration methods that improved accuracy in critical dimension measurements. The calibration standards have features formed with an amorphous material such as amorphous silicon. Amorphous materials lack the crystal grain structure of materials such as polysilicon and are capable of providing sharper edged features and higher accuracy patterns than grained materials. The amorphous material can be bound to a silicon wafer substrate through an intermediate layer of material, such as silicon dioxide. Where the intermediate layer is insulating material, as is silicon dioxide, the intermediate layer may be patterned with gaps to provide for electrical communication between the amorphous silicon and the silicon wafer. Charges imparted to the amorphous silicon during electron beam scanning may thereby drain to the silicon wafer rather than accumulating to a level where they would distort the electron beam.
Abstract:
Optical wavelength reference apparatus with wide wavelength range. Illuminated by a wideband source, a first reference such as absorption lines in a gas cell is used as a transfer standard, calibrating the response of the secondary reference over the range of the first reference. The performance of the second reference is extrapolated to a wider wavelength range, retaining the stability and accuracy characteristics of the first reference. Suitable secondary devices include etalons such as Fabry-Perot filters and Mach-Zehnder interferometers.
Abstract:
The invention relates to a reproducible standard for calibrating and checking the bright-field channel of a surface inspection device used for examining the flat surface of a sample and to a method for producing said standard whereby a microstructure is produced on a surface of a substrate provided as a standard, characterized in that the microstructure is smoothed out.
Abstract:
The present invention discloses a device for regenerating a sheet-like recording medium comprising a means for feeding a printed sheet-like recording medium, a regenerating treatment means having a step for eliminating image formed on said recording medium, a means for discriminating and separating the recording medium whether the treated recording medium is reusable or not and a means for storing the separated reusable recording medium. Further, the present invention discloses, as Examples, regenerating treatment means treating sheet-like recording media printed with following toners or inks with following degrading agent or a color eliminating agent; (i) a toner comprising biodegradable plastics as a constituent ingredient and an enzyme containing liquid as a degrading agent; (ii) a toner comprising photodegradable plastics as a constituent ingredient and an irradiation of a light containing a short wavelength light; (iii) a toner or an ink using a coloring material comprising an electron-donating color-forming organic compound and its developer and a color-eliminating agent; and (iv) a toner or an ink using a coloring material comprising an electron-accepting color-forming organic compound and its developer and a color-eliminating agent.