Optical measurement apparatus
    222.
    发明授权

    公开(公告)号:US11852524B2

    公开(公告)日:2023-12-26

    申请号:US17644185

    申请日:2021-12-14

    CPC classification number: G01J1/18 G01J2001/186

    Abstract: An optical measurement apparatus having an improved light intensity detection performance is provided. The optical measurement apparatus includes a light receiving element capable of converting a light intensity of light to be analyzed into an electrical signal; an input terminal to which the electrical signal is input; a first amplifier and a nonlinear element configuring a logarithmic amplifier; offset resistors; a switch unit; and a controller. An inverting input terminal of the first amplifier is electrically connected to the input terminal. The offset resistors have different resistance values. The switch unit can switch an offset resistor electrically connected between the voltage source and the input terminal, of the offset resistors. An offset current is input to the input terminal by the offset resistor electrically connected between the voltage source and the input terminal. The controller measures the light intensity based on an output voltage value of the first amplifier.

    Data output device
    228.
    发明授权

    公开(公告)号:US11125615B2

    公开(公告)日:2021-09-21

    申请号:US16540724

    申请日:2019-08-14

    Abstract: A data output device is provided. The data output device includes a converter circuit configured to generate a conversion signal based on an output signal; a boosting circuit configured to generate a boosting signal based on the output signal; and an output circuit configured to generate the output signal based on an input signal and a feedback signal, the feedback signal being based on the conversion signal and the boosting signal.

    Determining a voltage and/or frequency for a performance mode

    公开(公告)号:US11092646B1

    公开(公告)日:2021-08-17

    申请号:US16794105

    申请日:2020-02-18

    Abstract: According to certain aspects, a method includes receiving an input test signal at a test input, receiving an event signal, and passing the input test signal to a test output or blocking the input test signal from the test output based on the event signal. In certain aspects, the event signal indicates an occurrence of an event in a circuit block (e.g., a memory, a processor, or another type of circuit block). The event may include a precharge operation, opening of input latches, reset of a self-time loop, arrival of a data value at a flop in a signal path, an interrupt signal indicating an error or failure in the circuit block, or another type of event.

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