公开(公告)号：US09250266B2

公开(公告)日：2016-02-02

申请号：US13557879

申请日：2012-07-25

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/20 ,  G01R3/00

CPC classification number: G01R3/00 ,  Y10T29/49158 ,  Y10T29/49163 ,  Y10T29/49208 ,  Y10T29/49213 ,  Y10T29/4922 ,  Y10T29/49222

Abstract: In assembly of probe arrays for electrical test, a problem can arise where a bonding agent undesirably wicks between probes. According to embodiments of the invention, this wicking problem is alleviated by disposing an anti-wicking agent on a surface of the probe assembly such that wicking of the bonding agent along the probes toward the probe tips is hindered. The anti-wicking agent can be a solid powder, a liquid, or a gel. Once probe assembly fabrication is complete, the anti-wicking agent is removed. In preferred embodiments, a template plate is employed to hold the probe tips in proper position during fabrication. In this manner, undesirable bending of probes caused by introduction or removal of the anti-wicking agent can be reduced or eliminated.

公开(公告)号：US08988091B2

公开(公告)日：2015-03-24

申请号：US12880808

申请日：2010-09-13

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/067

CPC classification number: G01R1/073 ,  G01R1/06716 ,  G01R1/06733 ,  G01R1/06761 ,  G01R1/07357

Abstract: The present invention is a probe array for testing an electrical device under test comprising one or more ground/power probes and one or more signal probes and optionally a gas flow apparatus.

Abstract translation: 本发明是用于测试包括一个或多个接地/功率探针和一个或多个信号探针以及任选的气流装置的被测电气装置的探针阵列。

公开(公告)号：US08415963B2

公开(公告)日：2013-04-09

申请号：US13108368

申请日：2011-05-16

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/20 ,  G01R31/00

CPC classification number: G01R1/06733

Abstract: A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.

Abstract translation: 提供垂直折叠的探针，其可以在探针高度受限的情况下提供改善的擦洗性能。 更具体地，这种探针包括基部和尖端，以及从基部到尖端作为单个连续部件延伸的臂。 探针臂垂直折叠，使得其包括三个或更多个垂直臂部分。 垂直臂部具有相当大的垂直重叠，并且彼此横向移位。 当这种探针垂直向下放置在被测设备上时，探头变形。 在探针变形期间，至少两个垂直臂部彼此接触。 臂部之间的这种接触可以有利地增加探针尖端处的横向擦洗运动，并且还可以有利地减小探针电感。

公开(公告)号：US20120313660A1

公开(公告)日：2012-12-13

申请号：US13526759

申请日：2012-06-19

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/067

CPC classification number: G01R1/06733 ,  G01R1/06738 ,  G01R3/00

Abstract: A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is aligned along a scrub direction and also has a certain curvature along the scrub direction such that it may undergo both a scrub motion and a self-cleaning rotation upon application of a contact force between the skate and the conductive pad. While the scrub motion clears oxide from the pad to establish electrical contact, the rotation removes debris from the skate and thus preserves a low contact resistance between the skate and the pad. The use of probes with one or more blunt skates and methods of using such self-cleaning probes are especially advantageous when testing DUTs with low-K conductive pads or other mechanically fragile pads that tend to be damaged by large contact force concentration.

Abstract translation: 一种探针，其具有导电体和接触尖端，所述接触尖端由一个或多个钝头溜冰鞋端接，用于接合待测器件（DUT）的导电焊盘，用于进行电气测试。 接触尖端具有一定的宽度，并且钝溜冰鞋比尖端宽度窄。 溜冰鞋沿着洗涤方向对准，并且沿擦洗方向也具有一定的曲率，使得它可以在施加滑板和导电垫之间的接触力的同时进行擦洗运动和自清洁旋转。 当擦洗动作从衬垫中清除氧化物以建立电接触时，旋转从溜冰鞋去除碎屑，从而保持溜冰鞋和衬垫之间的低接触电阻。 使用具有一个或多个钝头溜冰鞋的探头以及使用这种自清洁探针的方法在使用低K导电垫或其他易受大接触力浓度损伤的机械脆性垫进行测试时尤为有利。

公开(公告)号：US20110273199A1

公开(公告)日：2011-11-10

申请号：US13118952

申请日：2011-05-31

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/067

CPC classification number: G01R1/07307 ,  G01R1/06733

Abstract: Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an array having two or more rows parallel to the contact line. With this arrangement of probes, the probe base thickness can be made greater than the contact pad spacing along the contact line, thereby advantageously increasing the lateral stiffness of the probes. The probe tip thickness is less than the contact pad spacing, so probes suitable for practicing the invention have a wide base section and a narrow tip section.

Abstract translation: 通过具有所有探针尖端沿着单个接触线对准的垂直探针的阵列提供紧密间隔的接触垫的改进的探测，而探针基底布置成平行于接触线的两行或更多行的阵列。 利用这种探针的布置，可以使探针基底厚度大于沿着接触线的接触垫间距，从而有利地增加探针的横向刚度。 探针尖端厚度小于接触垫间距，因此适用于实施本发明的探针具有宽的基部和窄的尖端部分。

公开(公告)号：US07952377B2

公开(公告)日：2011-05-31

申请号：US12419912

申请日：2009-04-07

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02 ,  G01R31/00

CPC classification number: G01R1/07307 ,  G01R1/06733

Abstract: Improved probing of closely spaced contact pads is provided by an array of vertical probes having all of the probe tips aligned along a single contact line, while the probe bases are arranged in an array having two or more rows parallel to the contact line. With this arrangement of probes, the probe base thickness can be made greater than the contact pad spacing along the contact line, thereby advantageously increasing the lateral stiffness of the probes. The probe tip thickness is less than the contact pad spacing, so probes suitable for practicing the invention have a wide base section and a narrow tip section.

Abstract translation: 通过具有所有探针尖端沿着单个接触线对准的垂直探针的阵列提供紧密间隔的接触垫的改进的探测，而探针基底布置成平行于接触线的两行或更多行的阵列。 利用这种探针的布置，可以使探针基底厚度大于沿着接触线的接触垫间距，从而有利地增加探针的横向刚度。 探针尖端厚度小于接触垫间距，因此适用于实施本发明的探针具有宽的基部和窄的尖端部分。

公开(公告)号：US20100289512A1

公开(公告)日：2010-11-18

申请号：US12777827

申请日：2010-05-11

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/067 ,  G01R31/00

CPC classification number: G01R1/06733 ,  G01R1/06738 ,  G01R3/00

Abstract: A probe having a conductive body and a contacting tip that is terminated by one or more blunt skates for engaging a conductive pad of a device under test (DUT) for performing electrical testing. The contacting tip has a certain width and the blunt skate is narrower than the tip width. The skate is aligned along a scrub direction and also has a certain curvature along the scrub direction such that it may undergo both a scrub motion and a self-cleaning rotation upon application of a contact force between the skate and the conductive pad. While the scrub motion clears oxide from the pad to establish electrical contact, the rotation removes debris from the skate and thus preserves a low contact resistance between the skate and the pad. The use of probes with one or more blunt skates and methods of using such self-cleaning probes are especially advantageous when testing DUTs with low-K conductive pads or other mechanically fragile pads that tend to be damaged by large contact force concentration.

Abstract translation: 一种探针，其具有导电体和接触尖端，所述接触尖端由一个或多个钝头溜冰鞋端接，用于接合待测器件（DUT）的导电焊盘，用于进行电气测试。 接触尖端具有一定的宽度，并且钝溜冰鞋比尖端宽度窄。 溜冰鞋沿着洗涤方向对准，并且沿擦洗方向也具有一定的曲率，使得它可以在施加滑板和导电垫之间的接触力的同时进行擦洗运动和自清洁旋转。 当擦洗动作从衬垫中清除氧化物以建立电接触时，旋转从溜冰鞋去除碎屑，从而保持溜冰鞋和衬垫之间的低接触电阻。 使用具有一个或多个钝头溜冰鞋的探头以及使用这种自清洁探针的方法在使用低K导电垫或其他易受大接触力浓度损伤的机械脆性垫进行测试时尤为有利。

公开(公告)号：US07733101B2

公开(公告)日：2010-06-08

申请号：US11450977

申请日：2006-06-09

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/32

CPC classification number: G01R1/07357 ,  G01R1/06716 ,  G01R1/06733

Abstract: Improved probing is provided using a knee probe where the knee curves away from the probe axis and then curves back to connect to the probe tip, crossing the probe axis on the way to the tip. The resulting lateral offset between the probe tip and the probe axis is a key geometrical parameter for predetermining the scrub motion provided by the probe in response to a predetermined contact force. The scrub motion preferably includes both a sliding motion and a rocking motion, where the sliding motion acts to clean the contact pad and the rocking motion acts to bring a clean part of the probe tip into contact with the freshly cleaned part of the contact pad. In preferred embodiments, the probe tip can include one or more relatively narrow “skates” for making contact to the contact pad. A dual skate configuration is especially appropriate when small dimples are at the centers of the contact pads.

Abstract translation: 使用膝关节探针提供改进的探测，其中膝盖弯曲远离探针轴线，然后弯曲回来连接到探针尖端，在穿过尖端的路上穿过探针轴。 在探针尖端和探针轴线之间产生的横向偏移是用于预测由探针响应于预定接触力提供的擦洗运动的关键几何参数。 擦洗运动优选地包括滑动运动和摇摆运动，其中滑动运动用于清洁接触垫，并且摇摆运动用于使探针尖端的清洁部分与接触垫的新鲜清洁的部分接触。 在优选实施例中，探针尖端可以包括用于与接触垫接触的一个或多个相对较窄的“溜冰鞋”。 当小凹坑位于接触垫的中心时，双滑冰配置是特别合适的。

公开(公告)号：US20100109691A1

公开(公告)日：2010-05-06

申请号：US12684272

申请日：2010-01-08

Applicant: January Kister

Inventor： January Kister

IPC: G01R1/06

CPC classification number: G01R1/06733

Abstract: A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance.

Abstract translation: 提供垂直折叠的探针，其可以在探针高度受限的情况下提供改善的擦洗性能。 更具体地，这种探针包括基部和尖端，以及从基部到尖端作为单个连续部件延伸的臂。 探针臂垂直折叠，使得其包括三个或更多个垂直臂部分。 垂直臂部具有相当大的垂直重叠，并且彼此横向移位。 当这种探针垂直向下放置在被测设备上时，探头变形。 在探针变形期间，至少两个垂直臂部彼此接触。 臂部之间的这种接触可以有利地增加探针尖端处的横向擦洗运动，并且还可以有利地减小探针电感。

公开(公告)号：US07671610B2

公开(公告)日：2010-03-02

申请号：US11975743

申请日：2007-10-19

Applicant: January Kister

Inventor： January Kister

IPC: G01R31/02

CPC classification number: G01R1/07314 ,  G01R1/0675 ,  G01R1/06755 ,  G01R1/07357

Abstract: Improved probing of closely spaced contact pads is provided by an array of guided vertical probes that has a sideways scrub relative to the line of contact pads. With this orientation of scrub motion, the probes can be relatively thin along the contact line, and relatively thick perpendicular to the contact line. The thin dimension of the probes allows for probing closely spaced contact pads, while the thick dimension of the probes provides mechanical robustness and current carrying capacity. The probes have a predetermined curvature in a plane including the contact line, to help determine the amount of scrub motion during contact. In a preferred embodiment, an array of probes is provided for probing two closely spaced and parallel rows of contact pads, offset from each other by half the contact pad pitch.

Abstract translation: 紧密间隔的接触垫的改进的探测由相对于接触焊盘的侧面擦洗的引导垂直探针阵列提供。 随着洗涤运动的这种取向，探针可以沿着接触线相对较薄，并且垂直于接触线相对较厚。 探头的薄尺寸允许探测紧密间隔的接触垫，而探头的厚度尺寸提供机械坚固性和载流能力。 探针在包括接触线的平面中具有预定曲率，以帮助确定接触期间擦洗运动的量。 在优选实施例中，提供探针阵列用于探测两个紧密间隔并平行的接触垫排，彼此偏移接触垫间距的一半。