METHOD AND SYSTEM FOR TESTING DEVICE UNDER TEST (DUT) OVER LONG DISTANCE

    公开(公告)号:US20240259114A1

    公开(公告)日:2024-08-01

    申请号:US18101997

    申请日:2023-01-26

    CPC classification number: H04B17/0085 H03L7/099

    Abstract: A method and system synchronize first and second VNAs for testing a DUT over a long distance. The method includes receiving at the second VNA an RF signal from the first VNA; mixing the RF signal and an LO signal at the second VNA to output an IF signal to an ADC; determining a reference error ratio between a first reference clock in the first VNA and a second reference clock in the second VNA; adjusting an LO frequency to a corrected LO frequency by applying the reference error to a desired LO frequency; mixing the RF signal and the adjusted LO signal to output the IF signal; and resampling the IF signal at an adjusted sample rate to output a corrected IF signal corrected for the reference error, without adjustments being made to the first or second reference clock.

    CLOCK RECOVERY UNIT ADJUSTMENT
    22.
    发明公开

    公开(公告)号:US20240243896A1

    公开(公告)日:2024-07-18

    申请号:US18097047

    申请日:2023-01-13

    CPC classification number: G01R31/31727 G01R31/31919 H03L7/0807

    Abstract: A controller includes a memory, a processor, and a first interface to a clock recovery unit that provides a recovered clock. When executed by the processor, instructions from the memory cause the controller to: instruct, via the first interface, the clock recovery unit at a first loop bandwidth to provide the recovered clock to a signal sampler; instruct, via the first interface, the clock recovery unit at a second loop bandwidth wider than the first loop bandwidth, to provide the recovered clock to the signal sampler; compare measurements from the signal sampler at the first loop bandwidth to measurements from the signal sampler at the second loop bandwidth; and instruct, via the first interface, the clock recovery unit at a third loop bandwidth to provide the recovered clock to the signal sampler applying adjustments based on comparing the measurements.

    VOLTAGE PROBE DEVICE WITH ADJUSTABLE BIAS
    23.
    发明公开

    公开(公告)号:US20240230718A9

    公开(公告)日:2024-07-11

    申请号:US17972297

    申请日:2022-10-24

    Abstract: A system and method are provided for compensating for thermal drift of a probe device. The method includes monitoring a first temperature of a laser source in a sensor head that receives output electrical signals from a DUT and outputs corresponding optical signals; monitoring a second temperature of a photoreceiver in a probe interface that converts the optical signals to electrical test signals to input to the test instrument; calculating a first value of a first bias voltage using the first temperature; applying the first value of the first bias voltage to the laser source to compensate for thermal drift when the first temperature is within a first predefined temperature range; calculating a second value of a second bias voltage for the photoreceiver using the second temperature; and applying the second value of the second bias voltage to the photoreceiver to compensate for thermal drift when the second temperature is within a second predefined temperature range.

    Noise reduction of oscilloscope waveforms

    公开(公告)号:US12025638B1

    公开(公告)日:2024-07-02

    申请号:US17944789

    申请日:2022-09-14

    Inventor: David L. Gines

    CPC classification number: G01R13/02

    Abstract: An oscilloscope includes a memory that stores instructions; and a processor that executes the instructions. When executed by the processor, the instructions cause the oscilloscope to obtain a measurement of a first radio frequency signal; perform a first Fourier transform to compute a first new spectrum based on the measurement of the first radio frequency signal; and compute a first waveform of the first new spectrum with noise of the oscilloscope reduced by performing a first inverse Fourier transform based on the first new spectrum.

    METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR TESTING DATA PROCESSING UNITS IN HIGH AVAILABILITY CONFIGURATIONS

    公开(公告)号:US20240205129A1

    公开(公告)日:2024-06-20

    申请号:US18082496

    申请日:2022-12-15

    CPC classification number: H04L43/50 H04L43/062 H04L43/0817

    Abstract: Methods, systems, and computer readable media for a collection of distributed highly available (HA) data processing units (DPUs) in a data center. An example system includes a test packet generator configured for generating test traffic and transmitting the test traffic towards an HA DPU pair. The system includes a test controller configured for executing, while the data center is operating with live traffic, a test case and controlling the test packet generator to cause a failover test event at the HA DPU pair. The system includes a monitoring module, deployed on at least one DPU of the HA DPU pair, and configured for monitoring the HA DPU pair during the failover test event and reporting one or more metrics characterizing the failover test event to the test controller.

    ANTENNA ARRAY MEASUREMENT AND CALIBRATION
    28.
    发明公开

    公开(公告)号:US20240204402A1

    公开(公告)日:2024-06-20

    申请号:US18084117

    申请日:2022-12-19

    CPC classification number: H01Q3/267 H01Q3/28 H01Q3/38

    Abstract: An antenna array controller is configured to measure a magnitude and phase of each of a set of antenna array elements, and compensate for leakage of other elements of the set of array elements. The leakage may be compensated for by one or more mechanisms including phase cancellation by row of antenna array elements, programmatic cancellation via a single offsetting antenna array element of the antenna array elements, and deembedding array leakage by subtracting the array leakage from the measured data.

    METHODS, SYSTEMS, AND COMPUTER READABLE MEDIA FOR USING A PROGRAMMABLE PROCESSING PIPELINE DEVICE TO EXECUTE SCALABLE CONNECTIONS PER SECOND (CPS) GENERATION TEST AND AN APPLICATION REPLAY SEQUENCE TEST

    公开(公告)号:US20240129219A1

    公开(公告)日:2024-04-18

    申请号:US17966743

    申请日:2022-10-14

    CPC classification number: H04L43/50

    Abstract: A method for using a programmable processing pipeline to implement an application replay sequence test or a scalable CPS generation test includes obtaining a sequence replay definition code package from a sequence relay definition storage element and converting the sequence replay definition code package into a hardware configuration image. The method further includes provisioning the hardware configuration image on at least one programmable processing pipeline device, causing the at least one programmable processing pipeline device to implement a test session connection initiator and a test session receiver, and utilizing the hardware configuration image to establish a first test session connection from the test session connection initiator and the test session connection receiver through a system under test (SUT). The method also includes conducting a programmable application replay sequence test or a scalable CPS generation test through the SUT using definition information contained in the hardware configuration image.

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