摘要:
A design structure embodied in machine readable medium used in a design process includes a system for implementing a memory column redundancy scheme. The system comprises a core array having a plurality of columns and a redundancy column each configured for reading or writing a bit of information and circuitry for steering around a defective column in the core array, wherein the circuitry includes one column multiplexor, which results in having the memory column redundancy scheme include one multiplexing stage.
摘要:
A design structure for an integrated circuit (IC) includes circuitry for measuring accurately at least one of set-up and hold times of a flip-flop included in the IC design. The circuitry uses data determined at the location of the flip-flop in the IC, and includes a first delay element driven by a first clock and configured to supply a zero-delay value of the first clock to a first flip-flop. The circuitry also includes a second delay element having a selectable delay, the second delay element configured to supply a first delayed version of the first clock to a second flip-flop, wherein an output of the first flip-flop is coupled to an input of the second flip-flop. A third delay element has a selectable delay and is coupled in series with the second delay element to supply a second delayed version of the first clock to a third flip-flop, and an output of the second flip-flop is coupled to an input of the third flip-flop. The second delayed version of the clock signal drives the third flip-flop to monitor the second flip-flop delay, the possible “pass set-up” state, and “pass hold” state outputs are determined for the second flip-flop based on a final test state of the second and third flip-flops.
摘要:
An integrated circuit (IC) includes circuitry for measuring accurately at least one of set-up and hold times of a flip-flop included in the IC design. The circuitry uses data determined at the location of the flip-flop in the IC, and includes a first delay element driven by a first clock and configured to supply a zero-delay value of the first clock to a first flip-flop. The circuitry also includes a second delay element having a selectable delay, the second delay element configured to supply a first delayed version of the first clock to a second flip-flop, wherein an output of the first flip-flop is coupled to an input of the second flip-flop. A third delay element has a selectable delay and is coupled in series with the second delay element to supply a second delayed version of the first clock to a third flip-flop, and an output of the second flip-flop is coupled to an input of the third flip-flop. The second delayed version of the clock signal drives the third flip-flop to monitor the second flip-flop delay, the possible “pass set-up” state, and “pass hold” state outputs are determined for the second flip-flop based on a final test state of the second and third flip-flops.
摘要:
An electronic fuse structure is disclosed for integrated circuits that is programmable with low voltage and incorporates a differential sensing scheme. The programming step is performed at about 1.5 times Vdd while the sense operation is performed at Vdd, which limits the resistance variation through the electronic fuse caused by the sense operation. During the sense operation a gating transistor emulates the voltage drop across a fuse select transistor for the case of an intact fuse. A circuit and method for characterizing the resistance of the electronic fuse is also disclosed.
摘要:
A redundancy register architecture associated with a RAM provides for soft-error tolerance. An enable register provides soft error rate protection to the registers that contain replacement information for redundant rows and columns. The gate register determines whether a row or column replacement register contains a specific address, and parity protection to the replacement register is activated as necessitated. The register architecture is changed to make the register state a “don't care” state for the majority of the registers. A small number of registers that are critical to the redundancy system are identified and made more robust to upsets. Word-line and column-line substitution is implemented. A ripple parity scheme is implemented when parity checks are activated.
摘要:
A flip-flop circuit comprising: a master latch circuit; a slave latch circuit coupled to the master latch circuit; and a correction circuit for increasing an amount of charge that can be absorbed by the master latch circuit in response to a soft-error event when the slave latch circuit is in a transparent phase and when both the master and slave latch circuits are storing the same data.
摘要:
BiCMOS gate pull-down circuits are disclosed for enhanced downside switching of load capacitance. Two PFETs are connected in series as input to the base of an npn type bipolar transistor. The collector and emitter of the bipolar transistor are connected to the circuit output and ground, respectively. One of the series connected PFETs is gated by a predetermined input signal and the second PFET is controlled by the output of an inverter tied to the collector of the bipolar transistor. Upon saturation of the bipolar transistor, the inverter disrupts flow of charge into the base of the transistor and an NFET tied between the base and ground begins to pull charge from the base. A second NFET may be connected to dissipate charge from the collector either through the base or directly to ground. Various circuit modifications are also discussed.