Alternative fuels for EUV light source
    22.
    发明授权
    Alternative fuels for EUV light source 失效
    EUV光源的替代燃料

    公开(公告)号:US07465946B2

    公开(公告)日:2008-12-16

    申请号:US11406216

    申请日:2006-04-17

    Abstract: An EUV light source is disclosed which may comprise at least one optical element having a surface, such as a multi-layer collector mirror; a laser source generating a laser beam; and a source material irradiated by the laser beam to form a plasma and emit EUV light. In one aspect, the source material may consist essentially of a tin compound and may generate tin debris by plasma formation which deposits on the optical element and, in addition, the tin compound may include an element that is effective in etching deposited tin from the optical element surface. Tin compounds may include SnBr4, SnBr2 and SnH4. In another aspect, an EUV light source may comprise a molten source material irradiated by a laser beam to form a plasma and emit EUV light, the source material comprising tin and at least one other metal, for example tin with Gallium and/or Indium.

    Abstract translation: 公开了一种EUV光源,其可以包括具有表面的至少一个光学元件,例如多层收集镜; 产生激光束的激光源; 以及由激光束照射以形成等离子体并发射EUV光的源材料。 在一个方面,源材料可以基本上由锡化合物组成,并且可以通过沉积在光学元件上的等离子体形成而产生锡屑,此外,锡化合物可以包括有效地从光学蚀刻沉积的锡的元素 元素表面。 锡化合物可以包括SnBr4,SnBr2和SnH4。 另一方面,EUV光源可以包括由激光束照射以形成等离子体并发射EUV光的熔融源材料,源材料包含锡和至少一种其它金属,例如锡与镓和/或铟。

    Systems for protecting internal components of an EUV light source from plasma-generated debris
    23.
    发明授权
    Systems for protecting internal components of an EUV light source from plasma-generated debris 有权
    用于保护EUV光源的内部部件免受等离子体产生的碎片的系统

    公开(公告)号:US07109503B1

    公开(公告)日:2006-09-19

    申请号:US11067099

    申请日:2005-02-25

    Abstract: Systems and methods are disclosed for protecting an EUV light source plasma production chamber optical element surface from debris generated by plasma formation. In one aspect of an embodiment of the present invention, a shield is disclosed which comprises at least one hollow tube positioned between the optical element and a plasma formation site. The tube is oriented to capture debris while allowing light to pass through the tube's lumen via reflection at relatively small angles of grazing incidence. In another aspect of an embodiment of the present invention, a shield is disclosed which is heated to a temperature sufficient to remove one or more species of debris material that has deposited on the shield. In yet another aspect of an embodiment of the present invention, a system is disclosed which a shield is moved from a light source plasma chamber to a cleaning chamber where the shield is cleaned.

    Abstract translation: 公开了用于保护EUV光源等离子体生产室光学元件表面免受等离子体形成产生的碎片的系统和方法。 在本发明的实施例的一个方面,公开了一种屏蔽件,其包括位于光学元件和等离子体形成部位之间的至少一个中空管。 管被定向以捕获碎片,同时允许光以相对较小的掠入射角度的反射通过管的内腔。 在本发明的一个实施例的另一方面,公开了一种屏蔽件,其被加热到足以去除沉积在屏蔽上的一种或多种碎屑材料的温度。 在本发明的一个实施例的另一方面,公开了一种系统,其将屏蔽件从光源等离子体室移动到清洁室,其中屏蔽件被清洁。

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